Patents by Inventor Gregory Frolenkov

Gregory Frolenkov has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Scanning ion conductance microscopy using surface roughness for probe movement
    Patent number: 9709598
    Abstract: A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.
    Type: Grant
    Filed: May 27, 2016
    Date of Patent: July 18, 2017
    Assignee: IMPERIAL INNOVATIONS LIMITED
    Inventors: Pavel Novak, Chao Li, Andrew Shevchuk, Victor Petrovich Ostanin, David Klenerman, Yuri Evgenievich Korchev, Gregory Frolenkov, Richard Clarke
  • SCANNING ION CONDUCTANCE MICROSCOPY USING SURFACE ROUGHNESS FOR PROBE MOVEMENT
    Publication number: 20160274146
    Abstract: A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.
    Type: Application
    Filed: May 27, 2016
    Publication date: September 22, 2016
    Inventors: PAVEL NOVAK, CHAO LI, ANDREW SHEVCHUK, VICTOR PETROVICH OSTANIN, DAVID KLENERMAN, YURI EVGENIEVICH KORCHEV, GREGORY FROLENKOV, RICHARD CLARKE
  • Scanning ion conductance microscopy using piezo actuators of different response times
    Patent number: 9354249
    Abstract: A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.
    Type: Grant
    Filed: July 29, 2013
    Date of Patent: May 31, 2016
    Assignee: IMPERIAL INNOVATIONS LIMITED
    Inventors: Pavel Novak, Chao Li, Andrew Shevchuk, Victor Petrovich Ostanin, David Klenerman, Yuri Evgenievich Korchev, Gregory Frolenkov, Richard Clarke
  • SCANNING ION CONDUCTANCE MICROSCOPY USING SURFACE ROUGHNESS FOR PROBE MOVEMENT
    Publication number: 20130312143
    Abstract: A method for interrogating a surface using scanning ion conductance microscopy (SICM), comprising the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.
    Type: Application
    Filed: July 29, 2013
    Publication date: November 21, 2013
    Inventors: PAVEL NOVAK, CHAO LI, ANDREW SHEVCHUK, VICTOR PETROVICH OSTANIN, DAVID KLENERMAN, YURI EVGENIEVICH KORCHEV, GREGORY FROLENKOV, RICHARD CLARKE
  • Scanning Ion Conductance Microscopy
    Publication number: 20110131690
    Abstract: The subject invention concerns methods for interrogating a surface using scanning ion conductance microscopy (SICM). In one embodiment, a method of the invention comprises the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.
    Type: Application
    Filed: February 2, 2009
    Publication date: June 2, 2011
    Applicant: Imperial Innovations Limited
    Inventors: Pavel Novak, Chao Li, Andrew Shevchuk, Victor Ostanin, David Klenerman, Yuri Korchev, Gregory Frolenkov, Richard Clarke