Patents by Inventor Guangze Pan

Guangze Pan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20250014682
    Abstract: A machine learning (ML) based system with neural networks for reducing bacterial sequence contamination in constructing a phage genome utilizing next-generation sequencing (NGS) data is present. The system includes a phage NGS dataset and includes a NGS reads screener to filter out low-quality reads. An NGS integrator is employed to pre-assemble the filtered reads into contigs. The contigs are then classified using a contig classifier including an autoencoder based on a gapped pattern graph convolutional network (GP-GCN) to identify their origin phage genome so as to minimize a bacterial sequence contamination in the NGS dataset. A graph generator creates a copy-number-aware bipartite conjugate graph from the classified contigs. A phage sequence assembler analyses the graph for assembling the contigs into a potential phage sequence.
    Type: Application
    Filed: July 3, 2024
    Publication date: January 9, 2025
    Inventors: Shuaicheng LI, Ruohan WANG, Guangze PAN
  • Publication number: 20240386339
    Abstract: Disclosed are an accelerated test data analysis method and apparatus based on a grey forecast model, a device.
    Type: Application
    Filed: February 26, 2024
    Publication date: November 21, 2024
    Applicant: China Electronic Product Reliability and Environmoental Testing Research Institute
    Inventors: Guangze Pan, Dan Li, Bochen Chen, Lijun Sun, Yuanhang Wang, Wenwei Liu, Jianfeng Yang, Xiaojian Ding
  • Publication number: 20240378646
    Abstract: The present disclosure discloses a method and apparatus for estimating product lifetime based on a multi-stress accelerated test, and a device. This method can be applied in the field of data processing technologies, specifically including: determining, in response to a lifetime estimation request for a target product, a target characteristic lifetime of the target product based on a target stress condition for the target product and correspondence relationships between candidate stress conditions and candidate characteristic lifetimes; and determining, based on an optimal lifetime model for the type to which the target product belongs and the target characteristic lifetime, a target average life of the target product.
    Type: Application
    Filed: April 8, 2024
    Publication date: November 14, 2024
    Applicant: CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIROMENTAL TESTING RESEARCH INSTITUTE
    Inventors: Guangze PAN, Dan Li, Bochen Chen, Lijun Sun, Yuanhang Wang, Wenwei Liu, Jianfeng Yang, Xiaojian Ding
  • Publication number: 20240378130
    Abstract: A performance degradation-based product reliability weak link evaluation method includes: acquiring a performance degradation parameter of each component of a to-be-evaluated product corresponding to each test time point; evaluating the performance degradation parameter of each component corresponding to each test time point through a fault time evaluation model, to obtain a pre-fault operating duration of each component; evaluating the pre-fault operating duration of each component through a confidence-based unreliability evaluation method, to obtain an unreliability evaluation result of each component; generating at least one component service life distribution model corresponding to each component according to the unreliability evaluation result, and selecting a corresponding target component service life distribution model; and evaluating mean time between failures corresponding to each component according to the target component service life distribution model, and selecting a reliability weak link of th
    Type: Application
    Filed: March 11, 2024
    Publication date: November 14, 2024
    Inventors: Guangze PAN, Dan Li, Bochen Chen, Lijun Sun, Qian Li, Yuanhang Wang, Wenwei Liu, Jianfeng Yang, Xiaojian Ding
  • Patent number: 12124248
    Abstract: The present disclosure relates to a method and an apparatus for processing accelerated test data based on multiple performance degradation, and a device.
    Type: Grant
    Filed: April 3, 2024
    Date of Patent: October 22, 2024
    Assignee: CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE
    Inventors: Guangze Pan, Dan Li, Bochen Chen, Lijun Sun, Yuanhang Wang, Wenwei Liu, Jianfeng Yang, Xiaojian Ding
  • Publication number: 20240338270
    Abstract: The present disclosure relates to a method and an apparatus for reliability evaluation based on multiple performance degradation, a computer device, a storage medium, and a computer program product. The method includes: for each of the multiple performances of a target product, obtaining a plurality of candidate functions that the performance possibly follows, determining a target function that satisfies a preset selection condition from the plurality of candidate functions, and determining a reliability function corresponding to the performance based on the target function; determining coupling relation information between the multiple performances of the target product, and obtaining redundancy information of the multiple performances of the target product; and performing a reliability evaluation on the target product based on the coupling relation information, the redundancy information, and the reliability function of each performance.
    Type: Application
    Filed: February 29, 2024
    Publication date: October 10, 2024
    Inventors: Guangze Pan, Dan Li, Bochen Chen, Lijun Sun, Yuanhang Wang, Wenwei Liu, Jianfeng Yang, Xiaojian Ding
  • Publication number: 20240338016
    Abstract: The present disclosure relates to a method and an apparatus for processing accelerated test data based on multiple performance degradation, and a device.
    Type: Application
    Filed: April 3, 2024
    Publication date: October 10, 2024
    Applicant: CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE
    Inventors: Guangze PAN, Dan LI, Bochen CHEN, Lijun SUN, Yuanhang WANG, Wenwei LIU, Jianfeng YANG, Xiaojian DING
  • Patent number: 12079550
    Abstract: A method for processing accelerated degradation test data based on Wiener process includes obtaining accelerated degradation test data of a to-be-tested product, selecting a target time conversion model from a predefined set of time conversion models based on the accelerated degradation test data, constructing a nonlinear Wiener degradation process based on the target time conversion model, determining a product reliability function of the to-be-tested product, and testing the reliabilities of the to-be-tested product based on the product reliability function to obtain product reliability test results of the to-be-tested products.
    Type: Grant
    Filed: February 6, 2024
    Date of Patent: September 3, 2024
    Assignee: China Electronic Product Reliability and Environmental Testing Research Institute (The Fifth Electronic Research Institute of Ministry of Industry and Information Technology) (CEPREI)
    Inventors: Guangze Pan, Xiaojian Ding, Bochen Chen, Dan Li, Lijun Sun, Wenwei Liu, Chengju Dong, Guangkuo Guo
  • Publication number: 20240255396
    Abstract: Disclosed are a fault prediction method and apparatus for a power conversion device, and a power conversion system. The method includes: acquiring multiple output voltages of a detecting coil in a preset time period, wherein an electromagnetic induction is generated between the detecting coil and a switching-on circuit of a switching transistor in the power conversion device; extracting each output frequency corresponding to each output voltage of the detecting coil; predicting time when the power conversion device fails according to a change trend of each output frequency. The apparatus includes a detecting coil and a data processing device; the detecting coil is connected to the data processing device and is a closed coil; the data processing device is configured to: acquire an output voltage of the detecting coil, extract corresponding output frequency, and predict time when the power conversion device fails according to a change trend of each output frequency.
    Type: Application
    Filed: January 30, 2024
    Publication date: August 1, 2024
    Applicant: China Electronic Product Reliability and Environmental Testing Research Institute(The Fifth elctroni
    Inventors: Guangze Pan, Xiaojian Ding, Bochen Chen, Dan Li, Lijun Sun, Yuanhang Wang, Wenwei Liu, Jianfeng Yang