Abstract: A method for determining a spatial-sensitivity function of a gamma camera, the gamma camera observing a field of observation (?) liable to contain radiation sources, the gamma camera including a detector material; pixels, distributed over a detecting area, each pixel being configured to form a detection signal under the effect of detection of an interaction of an ionising photon in the detector material; a unit for achieving sub-pixel resolution, the unit being programmed to assign a position (x, y) to each detected interaction on the basis of detection signals formed by a plurality of pixels, the position being determined on a mesh dividing each pixel into a plurality of virtual pixels. The method includes steps allowing weights assigned to each virtual pixel to be determined, each weight corresponding to a sensitivity of each virtual pixel.

Abstract: Method for producing a reconstruction image, the reconstruction image showing a position of irradiating sources in an environment, the reconstruction image being established on the basis of gamma images acquired by a gamma camera, which is sensitive to ionizing electromagnetic radiation, and movable relative to at least one irradiating source between two different measurement times, the gamma camera being joined to a visible camera, which is configured to form a visible image of the environment, the gamma camera and the visible camera defining an observation field, the method comprising establishing a reconstruction image, showing a position of at least one irradiation source in the observation field, the gamma camera and the visible camera being moved between at least two measurement times.

Abstract: A method for estimating a dose rate, on the basis of measurements taken by a gamma camera (2), the gamma camera defining an observation field (?), the estimated dose rate originates from irradiating sources (10a, 10b) located in the observation field, the irradiating sources emitting ionizing electromagnetic radiation; the observation field is discretized into a mesh; the gamma camera (2) comprises pixels (2j), each pixel being configured to detect the ionizing electromagnetic radiation, during an acquisition time, and to form an energy spectrum therefrom, each pixel being associated with at least one point of the mesh, such that together the pixels allow a position of the irradiating sources in the observation field to be obtained in one energy band or in a plurality of energy bands; the method comprising estimating a dose rate generated, at the gamma camera, by points of the mesh.

Abstract: Method for producing a reconstruction image, the reconstruction image showing a position of irradiating sources in an environment, the reconstruction image being established on the basis of gamma images acquired by a gamma camera, which is sensitive to ionizing electromagnetic radiation, and movable relative to at least one irradiating source between two different measurement times, the gamma camera being joined to a visible camera, which is configured to form a visible image of the environment, the gamma camera and the visible camera defining an observation field, the method comprising establishing a reconstruction image, showing a position of at least one irradiation source in the observation field, the gamma camera and the visible camera being moved between at least two measurement times.

Abstract: A method for calibrating an ionizing radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence The invention first relates to a method for calibrating a device for detecting ionizing radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionizing radiation and the detection material, the method including the determination of a weighting factor of amplitude A.

Abstract: A method for calibrating an ionizing radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence. The invention first relates to a method for calibrating a device for detecting ionizing radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionizing radiation and the detection material, the method including the determination of a weighting factor at the amplitude A.

Abstract: The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analyzing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analyzed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analyzed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.

Abstract: A method for calibrating an ionising radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence. The invention first relates to a method for calibrating a device for detecting ionising radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionising radiation and the detection material, the method including the determination of a weighting factor at the amplitude A.

Abstract: A method for calibrating an ionising radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence The invention first relates to a method for calibrating a device for detecting ionising radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionising radiation and the detection material, the method including the determination of a weighting factor of amplitude A.

Abstract: The invention relates to the field of the analysis of objects by x-ray diffraction spectroscopy. One subject of the invention is a device for analysing an object by x-ray diffraction spectroscopy, comprising a collimator the shape of which allows various portions of an object to be analysed simultaneously. To do this, the collimator includes channels inclined with respect to an axis, called the central axis of the collimator, in such a way that various channels address various elementary volumes distributed through the object. Another subject of the invention is a method allowing an object to be analysed using such a device. The object may for example be a biological tissue that it is desired to characterize non-invasively and non-destructively.

Abstract: Measurements of electric charges obtained by the impact of ionizing radiation on a semiconductor detector are grouped in a histogram. Calibrations and data otherwise obtained are used to obtain acceptance probabilities of measurements, which are used to construct a histogram of events by weighting the measurements so as to exclude the influence of some factors (such as diffused radiation) or on the contrary to enhance this influence.

Abstract: A method for detecting ionizing radiation using a pixelated semi-conductor detector. When the radiation interacts with the detector, the affected pixel is determined, together with the instant of impact for this pixel. A first instant before and a second instant after the instant of impact are deduced from this. The deviations of the signals coming from an assembly of pixels adjacent to the affected point are then measured, with the deviations being measured between the first and second instants. The position of the point of interaction of the radiation with the semi-conductor is estimated from the deviations thus measured.

Abstract: A method for detecting ionising radiation using a pixelated semi-conductor detector. When the radiation interacts with the detector, the affected pixel is determined, together with the instant of impact for this pixel. A first instant before and a second instant after the instant of impact are deduced from this. The deviations of the signals coming from an assembly of pixels adjacent to the affected point are then measured, with the deviations being measured between the first and second instants. The position of the point of interaction of the radiation with the semi-conductor is estimated from the deviations thus measured.

Abstract: A photonic radiation detection device includes a collimator, a detector, and localization means for determining information relative to the localization of a photon interaction with the detector material. In at least one previously selected acquisition configuration, a degree of pixelation in the detection plane is greater than 1 and a collimator-detector distance (C) is greater than one tenth of the septal height (h) of the collimator where the septal height is a maximum dimension of the collimator in a direction orthogonal to the frontal detection plane. In one instance, the septal wall thickness (e) is one of about 0.1 or less than about 0.1 of the channel width (w). In another instance, the collimator-detector distance is greater than h/(2(w/e?1)). A dimensioning method includes, for at least one given spatial frequency, calculating and comparing merit indicator values for different acquisition configurations of a structural model of the detection device.

Abstract: A device for sampling or digitising a detection signal from an X-or gamma-ray detector wherein, during a sampling time, estimations of a feedback signal are made at times when the signal injected to the inverting input of a comparator is equal to the detection signal at the non-inverting input of said comparator.

Abstract: A method for manufacturing an ionizing radiation detection device having a block of a semiconductor material adapted to undergo local separations of charges between positive and negative charges under the effect of ionizing radiation. The device including a first series of at least two collecting electrodes formed on the surface of the semiconductor block, and a second series of at least two non-collecting electrodes formed on a support and separated from the semiconductor block by an insulating layer. During processing, after forming the insulating layer on the support so as to cover the non-collecting electrodes, the block of semiconductor material bearing the collecting electrodes and the support bearing the non-collecting electrodes and the insulating layer are assembled.

Abstract: A photonic radiation detection device includes a collimator, a detector, means for localization in the detection plane defining on the one hand the partitioning of the detection plane in physical or virtual pixels of transversal dimensions smaller than those of the collimator channels, and associating on the other hand one of said pixels to each photon interaction. The detection device has at least in one previously selected acquisition configuration, a degree of pixelation in the detection plane greater than 1 and a collimator-detector distance (c) greater than one tenth of the septal height (h) of the collimator. A method for dimensioning such a device includes, for at least one given spatial frequency, calculating and comparing merit indicator values for different acquisition configurations of a structural model of the detection device.

Abstract: A device that detects electromagnetic radiation, including an assembly of juxtaposed parallelepipedic semiconductor detection blocks, each detection block including a given length separating a detection face and at least one rear face opposite to the said detection face, a given thickness separating a first polarization face with one or more electrodes and a second polarization face with one or more other electrodes, and a given width.

Abstract: A method for manufacturing an ionizing radiation detection device having a block of a semiconductor material adapted to undergo local separations of charges between positive and negative charges under the effect of ionizing radiation. The device including a first series of at least two collecting electrodes formed on the surface of the semiconductor block, and a second series of at least two non-collecting electrodes formed on a support and separated from the semiconductor block by an insulating layer. During processing, after forming the insulating layer on the support so as to cover the non-collecting electrodes, the block of semiconductor material bearing the collecting electrodes and the support bearing the non-collecting electrodes and the insulating layer are assembled.

Abstract: A photonic radiation detection device includes a collimator, a detector, means for localization in the detection plane defining on the one hand the partitioning of the detection plane in physical or virtual pixels of transversal dimensions smaller than those of the collimator channels, and associating on the other hand one of said pixels to each photon interaction. The detection device has at least in one previously selected acquisition configuration, a degree of pixelation in the detection plane greater than 1 and a collimator-detector distance (c) greater than one tenth of the septal height (h) of the collimator. A method for dimensioning such a device includes, for at least one given spatial frequency, calculating and comparing merit indicator values for different acquisition configurations of a structural model of the detection device.