Abstract: An imaging system includes a sample mount for holding a sample to be imaged, a light source configured to emit a light beam to be incident on the sample, a translation mechanism coupled to the sample mount and configured to scan the sample to a plurality of sample positions in a plane substantially perpendicular to an optical axis of the imaging system, a mask positioned downstream from the sample along the optical axis, and an image sensor positioned downstream from the mask along the optical axis. The image sensor is configured to acquire a plurality of images as the sample is translated to the plurality of sample positions. Each respective image corresponds to a respective sample position. The imaging system further includes a processor configured to process the plurality of images to recover a complex profile of the sample based on positional shifts extracted from the plurality of images.

Abstract: An imaging system includes a sample mount for holding a sample to be imaged, a light source configured to emit a light beam to be incident on the sample, a translation mechanism coupled to the sample mount and configured to scan the sample to a plurality of sample positions in a plane substantially perpendicular to an optical axis of the imaging system, a mask positioned downstream from the sample along the optical axis, and an image sensor positioned downstream from the mask along the optical axis. The image sensor is configured to acquire a plurality of images as the sample is translated to the plurality of sample positions. Each respective image corresponds to a respective sample position. The imaging system further includes a processor configured to process the plurality of images to recover a complex profile of the sample based on positional shifts extracted from the plurality of images.

Abstract: An imaging system includes a sample mount for holding a sample to be imaged, a light source configured to emit a light beam to be incident on the sample, a translation mechanism coupled to the sample mount and configured to scan the sample to a plurality of sample positions in a plane substantially perpendicular to an optical axis of the imaging system, a mask positioned downstream from the sample along the optical axis, and an image sensor positioned downstream from the mask along the optical axis. The image sensor is configured to acquire a plurality of images as the sample is translated to the plurality of sample positions. Each respective image corresponds to a respective sample position. The imaging system further includes a processor configured to process the plurality of images to recover a complex profile of the sample based on positional shifts extracted from the plurality of images.

Abstract: Systems, devices, and methods of Fourier ptychographic imaging by computationally reconstructing a high-resolution image by iteratively updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Abstract: An apparatus and method for analyzing a tissue sample to provide depth-selective information includes at least one light source, collection light optics, and a light detector. The light source is configured to produce a light beam having one or more wavelengths of light that cause a tissue sample to produce Raman light signals upon interrogation of the tissue sample. The light beam is oriented to impinge on an exposed surface of the tissue sample at a point of incidence (POI), and oriented so that the light beam enters the tissue sample at an oblique angle relative to the exposed surface of the tissue sample. The collection light optics are configured to collect the Raman light signals emanating from the tissue sample at one or more predetermined lateral distances from the point of incidence. The light detector is configured to receive the Raman light signals from the collection light optics.

Abstract: The present disclosure includes systems and methods for capture a whole slide image of a sample. In exemplary embodiments, a camera is configured to capture a digital image of a sample. The system captures a bright field image of the sample, and captures a digital image of the sample illuminated from a first incident angle at a first wavelength and a second incident angle at a second wavelength. The system can determine whether the sample is defocused based on the transitional shift between a first wavelength channel and a second wavelength channel of the captured digital image. The system can determine the defocus distance based on the transitional shift and autofocus using the defocus distance such the bright field image is in focus.

Abstract: Systems, devices, and methods of Fourier ptychographic imaging configured for illuminating a specimen being imaged from a plurality of incidence angles, for acquiring variably-illuminated, low-resolution intensity images of the specimen, and for reconstructing a high-resolution image of the specimen by iteratively determining the high resolution image that is self-consistent with the variably-illuminated, low-resolution intensity images, for example, by updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Abstract: An imaging method is provided that includes: (i) providing a microscope having a lens and an autofocusing camera positioned adjacent to the microscope; (ii) positioning an illumination source adjacent to the microscope; (iii) moving a sample to a predefined offset position and illuminating the sample; (iv) acquiring an image of the illuminated sample via the autofocusing camera; and (v) utilizing a convolution neural network to identify an in-focus position of the sample. The convolution neural network may further include an input layer, output layer, and at least one hidden layer situated between the input and output layers. The hidden layer(s) may be selected from a group consisting of a convolution layer, pooling layer, normalization layer, fully connected layer, and a combination thereof. The convolution neural network may be trained to accurately define the weight to be applied to the layer(s).

Abstract: The present disclosure includes systems and methods for capture a whole slide image of a sample. In exemplary embodiments, a camera is configured to capture a digital image of a sample. The system captures a bright field image of the sample, and captures a digital image of the sample illuminated from a first incident angle at a first wavelength and a second incident angle at a second wavelength. The system can determine whether the sample is defocused based on the transitional shift between a first wavelength channel and a second wavelength channel of the captured digital image. The system can determine the defocus distance based on the transitional shift and autofocus using the defocus distance such the bright field image is in focus.

Abstract: An imaging system includes a sample mount for holding a sample to be imaged, a light source configured to emit a light beam to be incident on the sample, a translation mechanism coupled to the sample mount and configured to scan the sample to a plurality of sample positions in a plane substantially perpendicular to an optical axis of the imaging system, a mask positioned downstream from the sample along the optical axis, and an image sensor positioned downstream from the mask along the optical axis. The image sensor is configured to acquire a plurality of images as the sample is translated to the plurality of sample positions. Each respective image corresponds to a respective sample position. The imaging system further includes a processor configured to process the plurality of images to recover a complex profile of the sample based on positional shifts extracted from the plurality of images.

Abstract: An imaging system includes a sample mount for holding a sample, a light source configured to emit a light beam, a diffuser configured to transform the light beam into a speckle illumination beam, a mirror configured to reflect the speckle illumination beam toward the sample, a scanning mechanism configured to scan the mirror to a plurality of mirror angles such that the speckle illumination beam is incident on the sample at a plurality of angles of incidence, and an image sensor configured to acquire a plurality of images as the mirror is being scanned. Each respective image corresponds to a respective angle of incidence. The imaging system further includes a processor configured to process the plurality of images to recover a complex profile of the sample based on positional shifts extracted from the plurality of images.

Abstract: Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.

Abstract: Systems, devices, and methods of Fourier ptychographic imaging configured for illuminating a specimen being imaged from a plurality of incidence angles, for acquiring variably-illuminated, low-resolution intensity images of the specimen, and for reconstructing a high-resolution image of the specimen by iteratively determining the high resolution image that is self-consistent with the variably-illuminated, low-resolution intensity images, for example, by updating overlapping regions of variably-illuminated, low-resolution intensity images in Fourier space.

Abstract: Certain embodiments pertain to Multiplexed Fourier Ptychographic imaging systems and methods. In one example, the Multiplexed Fourier Ptychographic imaging system includes an LED array configured to illuminate a sequence of LED patterns for illuminating a sample being imaged. The system includes LED circuitry configured to independently control power to turn on multiple LEDs simultaneously in each LED pattern of the array. The system has a light detector that acquires a first set of lower resolution images of the sample each image acquired during exposure time during illumination by a unique LED pattern. The system uses the first set of lower resolution images to generate a second set of lower resolution images associated with each LED in the LED array and iteratively updates overlapping regions in the Fourier domain with the second set of lower resolution images to generate a higher resolution image.

Abstract: Certain aspects pertain to aperture-scanning Fourier ptychographic imaging devices comprising an aperture scanner that can generate an aperture at different locations at an intermediate plane of an optical arrangement, and a detector that can acquire lower resolution intensity images for different aperture locations, and wherein a higher resolution complex image may be constructed by iteratively updating regions in Fourier space with the acquired lower resolution images.

Abstract: An imaging method is provided that includes: (i) providing a microscope having a lens and an autofocusing camera positioned adjacent to the microscope; (ii) positioning an illumination source adjacent to the microscope; (iii) moving a sample to a predefined offset position and illuminating the sample; (iv) acquiring an image of the illuminated sample via the autofocusing camera; and (v) utilizing a convolution neural network to identify an in-focus position of the sample. The convolution neural network may further include an input layer, output layer, and at least one hidden layer situated between the input and output layers. The hidden layer(s) may be selected from a group consisting of a convolution layer, pooling layer, normalization layer, fully connected layer, and a combination thereof. The convolution neural network may be trained to accurately define the weight to be applied to the layer(s).

Abstract: Instruments, assemblies and methods are provided for undertaking imaging techniques (e.g., microscopic imaging techniques). The present disclosure provides improved imaging techniques, equipment and systems. More particularly, the present disclosure provides advantageous microscopy/imaging assemblies with single-frame sample autofocusing using multi-LED illumination. The present disclosure provides for assemblies and methods for single-frame rapid sample autofocusing without a z-scan. Potential applications for the disclosed assemblies/methods include, without limitation, whole slide imaging, optical metrology, wafer inspection, DNA sequencing and other high-throughput imaging applications where the sample may need to be scanned over a large field of view. The assemblies/methods advantageously utilize multiple LEDs for sample illumination. A captured image includes multiple copies of the sample, and one can recover the distance between these copies. The distance is directly related to the defocus distance.

Abstract: Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.

Abstract: Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods that implement an embedded pupil function recovery.

Abstract: Advantageous instruments, assemblies and methods are provided for undertaking imaging techniques (e.g., microscopic imaging techniques). The present disclosure provides improved imaging techniques, equipment and systems. More particularly, the present disclosure provides advantageous microscopy/imaging assemblies with rapid sample auto-focusing (e.g., microscopy/imaging assemblies having instant focusing for rapid sample imaging with auto-focusing). The present disclosure provides for high-throughput whole slide imaging with instant focal plane detection. A whole slide imaging platform/assembly that uses instant focusing systems/methods for high-speed sample autofocusing is provided. Such exemplary platforms/assemblies can be used for digital pathology or the like, and can provide improved, faster and cheaper diagnosis/prognosis of ailments/diseases.