Patents by Inventor Hans H. Wang

Hans H. Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Testing of electronic circuits which typically contain asynchronous digital circuitry
    Patent number: 5623502
    Abstract: An electronic circuit containing a plurality of functional elements also contains a like plurality of corresponding test elements used in testing the functional elements. Aside from being transparent to the functional elements during normal circuit operation, the test elements are internally switchable to provide the circuit with real-time observability through a circuit test output, real-time controllability, and state controllability. Functional elements formed with asynchronous digital circuitry can thereby be tested with the test elements.
    Type: Grant
    Filed: July 15, 1994
    Date of Patent: April 22, 1997
    Assignee: National Semiconductor Corporation
    Inventor: Hans H. Wang