Patents by Inventor Hans Spruit

Hans Spruit has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20210116355
    Abstract: A method reduces false-positive particle counts detected by an interference particle sensor module, which has a laser and a light detector. The method including: emitting laser light; providing a high-frequency signal during the emission of the laser light, a modulation frequency of the high-frequency signal being between 10-500 MHz; detecting an optical response by the light detector in reaction to the emitted laser light while providing the high-frequency signal, which is arranged such that a detection signal caused by a macroscopic object positioned between a first and second distance is reduced in comparison to a detection signal caused by the macroscopic object at the same position without providing the high-frequency signal. The high-frequency signal is provided to a tuning structure of the particle sensor module which is arranged to modify a resonance frequency of an optical resonator comprised by the laser sensor module upon reception of the high-frequency signal.
    Type: Application
    Filed: December 21, 2020
    Publication date: April 22, 2021
    Inventors: Hans Spruit, Alexander Van der Lee, Philipp Henning Gerlach, Robert Wolf, Robert Weiss, Matthias Falk
  • Patent number: 10935483
    Abstract: An optical particle sensor device comprises an optical emitter device for emitting a multitude of measurement laser beams; a detector device for detecting the measurement laser beams scattered on particles in the vicinity of the optical particle sensor device and for generating a single measuring signal assigned to this for each measurement laser beam; and an evaluation device for determining at least one estimated particle value for the number of particles per volume using at least one single measurement signal, wherein the evaluation device determines at least two estimated particle values for the number of particles per volume, which are based on at least partially different single measurement signals and/or a different number of single measurement signals, and on the basis of at least part of the estimated particle values, determines at least one output value for the particle load.
    Type: Grant
    Filed: August 15, 2019
    Date of Patent: March 2, 2021
    Assignees: Robert Bosch GmbH, TRUMPF PHOTONIC COMPONENTS GMBH
    Inventors: Alexander Van Der Lee, Robert Weiss, Sören Sofke, Hans Spruit, Jens-Alrik Adrian
  • Patent number: 10782221
    Abstract: A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment is provided in which individual particles in the measurement environment are detected (S1), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S2), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S3), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S4).
    Type: Grant
    Filed: October 21, 2019
    Date of Patent: September 22, 2020
    Assignees: ROBERT BOSCH GMBH, TRUMPF PHOTONIC COMPONENTS GMBH
    Inventors: Stefan Weiss, Alexander Herrmann, Robert Wolf, Alexander Van Der Lee, Wolfram Johannes Martin Lyda, Balazs Jatekos, Robert Weiss, Sören Sofke, Hans Spruit, Jens-Alrik Adrian, Matthias Falk, Dominik Moser
  • Publication number: 20200200577
    Abstract: The invention relates to a method for determining the absolute value of the flow velocity (v) of a particle-transporting medium. At least two measurement laser beams (L_i) with linearly independent, non-orthogonal measurement directions (b_i) are emitted. The measurement laser beams (L_i) scattered at particles are detected and one measurement signal (m_i) is generated in each case for each measurement laser beam (L_i).
    Type: Application
    Filed: December 18, 2019
    Publication date: June 25, 2020
    Inventors: Alexander Van Der Lee, Robert Weiss, Hans Spruit
  • Publication number: 20200173904
    Abstract: The invention relates to a method for detecting particles, having the steps of: receiving (S1) a measurement signal; calculating (S2) at least one estimated noise value using the received measurement signal; and detecting (S3) the particles using the measurement signal on the basis of at least one detection criterion, wherein the at least one detection criterion depends on the at least one calculated estimated noise value.
    Type: Application
    Filed: November 20, 2019
    Publication date: June 4, 2020
    Inventors: Robert Wolf, Alexander Van Der Lee, Rico Srowik, Hans Spruit, Okke Ouweltjes
  • Publication number: 20200132582
    Abstract: A system for determining a particle contamination and a method for determining a particle contamination in a measurement environment, is provided in which individual particles in the measurement environment are detected (S1), wherein a) an estimate of the number of particles per volume in the measurement environment is ascertained (S2), b) an estimate of the number of particles per volume and characterization information describing the particle source in the measurement information are taken as a basis for ascertaining an output value for the particle contamination in the measurement environment (S3), and c) context-related data are made available and the characterization information is estimated on the basis of the available context-related data (S4).
    Type: Application
    Filed: October 21, 2019
    Publication date: April 30, 2020
    Inventors: Stefan Weiss, Alexander Herrmann, Robert Wolf, Alexander Van Der Lee, Wolfram Johannes Martin Lyda, Balazs Jatekos, Robert Weiss, Sören Sofke, Hans Spruit, Jens-Alrik Adrian, Matthias Falk, Dominik Moser
  • Publication number: 20200056981
    Abstract: The invention relates to an optical particle sensor device (1), comprising an optical emitter device (2), which is designed to emit a multitude N of measurement laser beams (Li) into a vicinity of the optical particle sensor device (1); a detector device (3), which is designed to detect the measurement laser beams (Li) scattered on particles in the vicinity of the optical particle sensor device (1) and to generate to generate a single measuring signal (Ei) assigned to this for each measurement laser beam (Li); and an evaluation device (4), which is designed to determine at least one estimated particle value for the number of particles per volume using at least one single measurement signal (Ei).
    Type: Application
    Filed: August 15, 2019
    Publication date: February 20, 2020
    Inventors: Alexander Van Der Lee, Robert Weiss, Sören Sofke, Hans Spruit, Jens-Alrik Adrian
  • Publication number: 20200057180
    Abstract: The invention relates to an optical lens (10) for a photodiode-equipped device, which is arrangeable at and/or in the photodiode-equipped device in such a way that light beams (14) emitted by at least two photodiodes of the photodiode-equipped device transmit into the optical lens (10) through a light entrance side (S1) of the optical lens (10) and emerge from the optical lens (10) at a light exit side (S2) of the optical lens (10), and for which a central longitudinal axis (16) extending centrally through the light entrance side (S1) and centrally through the light exit side (S2) is definable, wherein the light entrance side (S1) of the optical lens (10) and the light exit side (S2) of the optical lens (10) are embodied in each case as a freeform surface for off-axis projection in such a way that the light beams (14) emitted by the photodiodes (32) arranged on a circular path around the central longitudinal axis (16) are focused off-axis by means of the optical lens (10).
    Type: Application
    Filed: August 15, 2019
    Publication date: February 20, 2020
    Inventors: Alexander Van Der Lee, Balazs Jatekos, Hans Spruit, Peter Jutte