Patents by Inventor Hanshuang Liang

Hanshuang Liang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10139295
    Abstract: Methods for measuring and/or mapping in-plane strain of a surface of a substrate. A grating is formed on at least a portion of the surface of the substrate. A laser is then used focused onto the grating to determine the strain on the surface by determining the variation of the grating wavelength due to the strain on the surface. The strain information is essentially carried by the grating, in terms of grating wavelength, because it varies according to the volume change of the underlying substrates. By scanning the surface grating with the small laser size, a high resolution strain map of the surface can be produced. The induced strain is related to the grating wavelength variation, which leads to the diffraction angle variation that is captured by the strain sensing measurements.
    Type: Grant
    Filed: May 14, 2016
    Date of Patent: November 27, 2018
    Assignee: Arizona Board of Regents on behalf of Arizona State University
    Inventors: Hongbin Yu, Hanqing Jiang, Hanshuang Liang, Teng Ma
  • Publication number: 20160363492
    Abstract: Methods for measuring and/or mapping in-plane strain of a surface of a substrate. A grating is formed on at least a portion of the surface of the substrate. A laser is then used focused onto the grating to determine the strain on the surface by determining the variation of the grating wavelength due to the strain on the surface. The strain information is essentially carried by the grating, in terms of grating wavelength, because it varies according to the volume change of the underlying substrates. By scanning the surface grating with the small laser size, a high resolution strain map of the surface can be produced. The induced strain is related to the grating wavelength variation, which leads to the diffraction angle variation that is captured by the strain sensing measurements.
    Type: Application
    Filed: May 14, 2016
    Publication date: December 15, 2016
    Inventors: Hongbin Yu, Hanqing Jiang, Hanshuang Liang, Teng Ma