Abstract: An electrostatic deflector for energy selection of a beam of charged particles has a plurality of main deflector plates arrayed in a generally cylindrical basic shape and to which electrostatic potentials are applied. The main deflector plates are shaped and the potentials are applied to generate a path of said beam from an input side of said deflector to an output side thereof by virtue of a deflecting field which is increasingly weakened to both sides of a central portion of the beam toward the main deflector plates relative to a field of ideal cylindrical shape, thereby causing second order angular aberration of the beam to substantially vanish. A pair of end deflector plates at opposite ends of the cylindrical basic shape have a repulsive potential with respect to the beam to effect focussing of the beam perpendicular to a dispersion plane of the deflector.

Abstract: A scanning tunnel microscope having an emission tip, specimen holder and xyz movement mechanism as well as devices for applying a voltage between the emission tip and the specimen and for detecting the electrons emanating from the specimen can be used for verifying secondary electrons generated in the same surface region and/or an energy analysis of electrons emitted by the emission tip and scattered by the surface if a cylindrical mirror analyzer with assigned detector is arranged coaxially to the emission tip. With relatively high applied voltages, a cylindrically symmetrical correction electrode between the emission tip and the cylindrical mirror, arranged coaxially to the emission tip, is expedient, with which electrode the imaging properties of the analyzer open toward the specimen are made to approximate those of a conventional cylindrical mirror. A masking device allows a solid angle-oriented detection of scattered and secondary electrons.

Abstract: A crystalline bar is drawn by a zone-melting process or from a melt in a crucible utilizing a magnetic suspension housing, in addition to an axial stabilization magnet, a radial stabilizer surrounding the core and including sensors for the radial position of the core-operating controllers for electromagnets surrounding the core to restore the core to its setpoint position. The fully magnetic suspension of the core eliminates friction while allowing enclosure of the crystal growth compartment to improve the quality of the crystal growth process.

Abstract: High energy resolution at high electron current at the specimen or at the detector is obtained by an electron beam guiding with focusing energy selection, in particular in an electron spectrometer with emission system and at least one energy dispersive system with different focusing in two mutually perpendicular directions, by a non-circular-symmetrical lens system placed after or before the energy dispersive system and correcting the different focusing of the electrons in the two mutually perpendicular directions such that either the virtual or the real entry stop of the energy dispersive system is imaged on an accessible image plane outside the energy dispersive system or an object outside the energy dispersive system is imaged on the virtual or real exit stop of the latter.

Abstract: A complex relative movement in a direction transverse to the crystal draw direction is imparted at the interface between the growing crystal bar and a melt of the crystallizable material by controlled electrical energization of a radial stabilizer acting upon the magnetizable core by which either the bar or the crucible or a supply bar for the material, or both, can be suspended.

Abstract: A complex relative movement in a direction transverse to the crystal draw direction is imparted at the interface between the growing crystal bar and a melt of the crystallizable material by controlled electrical energization of a radial stabilizer acting upon the magnetizable core by which either the bar or the crucible or a supply bar for the material, or both, can be suspended.

Abstract: An electron energy analyzer in which electrons arriving through an entrance aperture in an energy-dispersive system, are simultaneously analyzed at the exit of the system through a multi-channel detector operating with channel plates. The electron energy analyzer is distinguished through a grid at the exit of the analyzer which is to be brought to the potential of the entrance aperture plate, at the smallest possible spacing from the channel plate or plates, whose mesh size dimension is so small in comparison with the dimension of the electron beam, that no additional structure will be obtained in the registered electron spectrum because of the grid, with a blending grid mask whose blending conforms with the beam dimension and the spacing of the electrodes in the analyzer, and which is brought to a potential with respect to the channel plate, which is adequate for the aspiration of the electrons strayed from the facing channel plate.

Abstract: The radiant heat of the graphite carrier of a LaB.sub.6 cathode is utilized o heat the input diaphragm of the monochromator of an electron spectrometer by opening up the aperture in the repeller electrode that provides magnetic shielding from the heating current and through which the emitting portion of the cathode projects, so that the entire surface of the graphite carrier can radiate heat towards the input diaphragm. The spacing of the point of the cathode from the graphite carrier may be increased in order to accord with the provision of additional heat in the carrier for radiation to the diaphragm. The radiant heat raises the temperature of the diaphragm and thereby reduces electrostatic charges resulting from bombardment of the diaphragm by electrons from the cathode, allowing a larger beam current to be monochromatized.

Abstract: A beam guidance for electron beam tests, especially of solid bodies. The ctrons cathodically emitted and electron-optically bundled are subjected at least to an energy selection in a cylinder condenser deflection unit and are subsequently detected or indicated in a detector. The emission and bundling systems are arranged in such a way that the electrons, in the plane at right angles to the cylinder condenser axis, are focused upon the inlet shield or baffle of the condenser, yet are focused at right angles thereto upon the detector.