Patents by Inventor Hari Krishna SALILA VIJAYALAL MOHAN

Hari Krishna SALILA VIJAYALAL MOHAN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method and system for integrity testing of sachets
    Patent number: 11585775
    Abstract: A method and system for integrity testing of sachets. The method comprises the steps of disposing at least a portion of the sachet relative to an electrode structure; applying an AC bias voltage to the electrode structure; measuring an electrical property of the portion of the sachet over a frequency range, and determining the integrity based on the measured electrical property over the frequency range.
    Type: Grant
    Filed: April 24, 2019
    Date of Patent: February 21, 2023
    Assignee: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Hari Krishna Salila Vijayalal Mohan, Voon Yew Aaron Thean, Suryakanta Nayak
  • METHOD AND SYSTEM FOR INTEGRITY TESTING OF SACHETS
    Publication number: 20210372961
    Abstract: A method and system for integrity testing of sachets. The method comprises the steps of disposing at least a portion of the sachet relative to an electrode structure; applying an AC bias voltage to the electrode structure; measuring an electrical property of the portion of the sachet over a frequency range, and determining the integrity based on the measured electrical property over the frequency range.
    Type: Application
    Filed: April 24, 2019
    Publication date: December 2, 2021
    Applicant: NATIONAL UNIVERSITY OF SINGAPORE
    Inventors: Hari Krishna SALILA VIJAYALAL MOHAN, Voon Yew Aaron THEAN, Suryakanta NAYAK