Patents by Inventor Haruyuki ISHII
Haruyuki ISHII has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11964253Abstract: Provided is a production method for core-shell porous silica particles, the production method including: a preparation step of preparing an aqueous solution comprising non-porous silica particles, a cationic surfactant, a basic catalyst, an electrolyte, and an alcohol; a shell precursor formation step at adding a silica source to the aqueous solution to form a shell precursor on a surface of the non-porous silica particles; and a shell formation step of removing the cationic surfactant from the shell precursor to form a porous shell.Type: GrantFiled: June 17, 2019Date of Patent: April 23, 2024Assignees: TOHOKU UNIVERSITY, DAICEL CORPORATIONInventors: Daisuke Nagao, Haruyuki Ishii, Shunho Ishikawa
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Patent number: 11482398Abstract: The focused ion beam apparatus includes: an electron beam column; a focused ion beam column; a sample stage; a coordinate acquisition unit configured to acquire, when a plurality of irradiation positions to which the focused ion beam is to be applied are designated on a sample, plane coordinates of each of the irradiation positions; a movement amount calculation unit configured to calculate, based on the plane coordinates, a movement amount by which the sample stage is to be moved to a eucentric height so that the eucentric height matches an intersection position at which the electron beam and the focused ion beam match each other at each of the irradiation positions; and a sample stage movement control unit configured to move, based on the movement amount, the sample stage to the eucentric height at each of the irradiation positions.Type: GrantFiled: September 22, 2020Date of Patent: October 25, 2022Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Haruyuki Ishii, Atsushi Uemoto, Tatsuya Asahata
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Patent number: 11231414Abstract: To provide magnetic composite particles which can be separated from a sample solution in a short period of time using magnetism, and furthermore, have an excellent dispersion stability in the sample solution, which are magnetic composite particles in which an outer shell is formed on surfaces of core particles containing an inorganic oxide or a polymer, wherein the outer shell comprises magnetic nanoparticles and a silicon compound, the value of the volume average particle diameter (dTEM) of the magnetic composite particles measured by a transmission electron microscope is 30 nm or more to 210 nm or less, and the value of (dDLS)/(dTEM) which is the ratio of the value of the particle diameter (dDLS) of the particles measured by a dynamic light scattering method and the value of the volume average particle diameter (dTEM) is 2.0 or less.Type: GrantFiled: August 31, 2017Date of Patent: January 25, 2022Assignees: TOHOKU UNIVERSITY, DOWA ELECTRONICS MATERIALS CO., LTD.Inventors: Daisuke Nagao, Mikio Konno, Haruyuki Ishii, Kumiko Hayashi, Natsuki Kohama, Takayuki Yoshida, Toshihiko Ueyama
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Publication number: 20210316997Abstract: An object of the present disclosure is to provide a method for producing a core-shell porous silica particle with an increased thickness of the shell. The object is met by a method for producing a core-shell porous silica particle, the method including the following steps: (a) preparing; (b) forming a shell precursor; (c) forming a shell; (d) preparing; (e) forming a shell precursor; and (f) forming a shell; wherein the steps (d) through (f) are further repeated one to three times, in which case the step of forming a shell described in step (d) refers to step (f).Type: ApplicationFiled: August 13, 2019Publication date: October 14, 2021Applicants: TOHOKU UNIVERSITY, DAICEL CORPORATIONInventors: Daisuke FUKUDA, Daisuke NAGAO, Haruyuki ISHII, Shunho ISHIKAWA
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Patent number: 11133149Abstract: A focused ion beam apparatus (100) includes: a focused ion beam lens column (20); a sample table (51); a sample stage (50); a memory (6M) configured to store in advance three-dimensional data on the sample table and an irradiation axis of the focused ion beam, the three-dimensional data being associated with stage coordinates of the sample stage; a display (7); and a display controller (6A) configured to cause the display to display a virtual positional relationship between the sample table (51v) and the irradiation axis (20Av) of the focused ion beam, which is exhibited when the sample stage is operated to move the sample table to a predetermined position, based on the three-dimensional data on the sample table and the irradiation axis of the focused ion beam.Type: GrantFiled: September 22, 2020Date of Patent: September 28, 2021Assignee: HITACHI HIGH-TECH SCIENCE CORPORATIONInventors: Toshihiro Mochizuki, Haruyuki Ishii, Atsushi Uemoto
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Publication number: 20210260563Abstract: Provided is a production method for core-shell porous silica particles, the production method including: a preparation step of preparing an aqueous solution comprising non-porous silica particles, a cationic surfactant, a basic catalyst, an electrolyte, and an alcohol; a shell precursor formation step of adding a silica source to the aqueous solution to form a shell precursor on a surface of the non-porous silica particles; and a shell formation step of removing the cationic surfactant from the shell precursor to form a porous shell.Type: ApplicationFiled: June 17, 2019Publication date: August 26, 2021Applicants: TOHOKU UNIVERSITY, DAICEL CORPORATIONInventors: Daisuke NAGAO, Haruyuki ISHII, Shunho ISHIKAWA
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Publication number: 20210090849Abstract: The focused ion beam apparatus includes: an electron beam column; a focused ion beam column; a sample stage; a coordinate acquisition unit configured to acquire, when a plurality of irradiation positions to which the focused ion beam is to be applied are designated on a sample, plane coordinates of each of the irradiation positions; a movement amount calculation unit configured to calculate, based on the plane coordinates, a movement amount by which the sample stage is to be moved to a eucentric height so that the eucentric height matches an intersection position at which the electron beam and the focused ion beam match each other at each of the irradiation positions; and a sample stage movement control unit configured to move, based on the movement amount, the sample stage to the eucentric height at each of the irradiation positions.Type: ApplicationFiled: September 22, 2020Publication date: March 25, 2021Inventors: Haruyuki ISHII, Atsushi UEMOTO, Tatsuya ASAHATA
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Publication number: 20200071171Abstract: Provided is a method for manufacturing core-shell-type porous silica particles, the method including: a preparation step for preparing an aqueous solution containing non-porous silica particles, a cationic surfactant, a basic catalyst, a hydrophobic part-containing additive, and an alcohol; a shell precursor formation step for adding a silica source to the aqueous solution to form a shell precursor on the surfaces of the non-porous silica particles; and a shell formation step for removing the hydrophobic part-containing additive and the cationic surfactant from the shell precursor to form a porous shell.Type: ApplicationFiled: February 9, 2017Publication date: March 5, 2020Applicants: TOHOKU UNIVERSITY, DAICEL CORPORATIONInventors: Mikio KONNO, Diasuke NAGAO, Haruyuki ISHII, Arata KANNO
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Publication number: 20190271694Abstract: To provide magnetic composite particles which can be separated from a sample solution in a short period of time using magnetism, and furthermore, have an excellent dispersion stability in the sample solution, which are magnetic composite particles in which an outer shell is formed on surfaces of core particles containing an inorganic oxide or a polymer, wherein the outer shell comprises magnetic nanoparticles and a silicon compound, the value of the volume average particle diameter (dTEM) of the magnetic composite particles measured by a transmission electron microscope is 30 nm or more to 210 nm or less, and the value of (dDLS)/(dTEM) which is the ratio of the value of the particle diameter (dDLS) of the particles measured by a dynamic light scattering method and the value of the volume average particle diameter (dTEM) is 2.0 or less.Type: ApplicationFiled: August 31, 2017Publication date: September 5, 2019Applicants: TOHOKU UNIVERSITY, DOWA ELECTRONICS MATERIALS CO., LTD.Inventors: Daisuke NAGAO, Mikio KONNO, Haruyuki ISHII, Kumiko HAYASHI, Natsuki KOHAMA, Takayuki YOSHIDA, Toshihiko UEYAMA