Patents by Inventor Hatsuo Yabe

Hatsuo Yabe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for measuring system parameter of linear multiport and measuring method using vector network analyzer
    Patent number: 8725442
    Abstract: The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}?1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
    Type: Grant
    Filed: February 2, 2010
    Date of Patent: May 13, 2014
    Assignees: The University of Electro-Communications, Campus Creat Co., Ltd.
    Inventors: Hajime Kondo, Toshiyuki Yakabe, Hatsuo Yabe
  • METHOD FOR MEASURING SYSTEM PARAMETER OF LINEAR MULTIPORT AND MEASURING METHOD USING VECTOR NETWORK ANALYZER
    Publication number: 20110288800
    Abstract: The present invention provides a novel measurement method for system parameters of a 5-port junction used in a VNA (Vector Network Analyzer). A VNA is a device for measuring amplitude ratios and phase differences (S-parameters: scattering matrix elements) between incident waves and reflected waves of a DUT (Device Under Test), or between input waves and transmitted waves. What has been newly discovered is that for 5 ports, S-parameters can be expressed by a linear coupling using H and power difference ratios ({P(S)/P(0)}?1). It is possible to easily calculate parameter H using a minimum of three already known standards, and amount of calculation can be reduced compared to conventionally.
    Type: Application
    Filed: February 2, 2010
    Publication date: November 24, 2011
    Applicants: CAMPUS CREATE CO., LTD., THE UNIVERSITY OF ELECTRO-COMMUNICATIONS
    Inventors: Hajime Kondo, Toshiyuki Yakabe, Hatsuo Yabe