Abstract: Deflection of a free end of one plate-like member, that is caused by uniform stress, is transmitted to an other plate-like member by moving a free end of the other plate-like member. According to this configuration, the uniform stress applied to the one plate-like member is converted into stress induced by a point force in the other plate-like member, and then, the induced stress is concentrated on a fixed end side narrow portion in which a piezoresistor is provided. Thus, a novel structure for a piezoresistive surface stress sensor having high sensitivity to uniform stress applied to the surface of the sensor is provided.

Abstract: Deflection of a free end of one plate-like member, that is caused by uniform stress, is transmitted to the other plate-like member by moving a free end of the other plate-like member. According to this configuration, the uniform stress applied to the one plate-like member is converted into stress induced by a point force in the other plate-like member, and then, the induced stress is concentrated on a fixed end side narrow portion in which a piezoresistor is provided. Thus, a novel structure for a piezoresistive surface stress sensor having high sensitivity to uniform stress applied to the surface of the sensor is provided.

Abstract: The present invention concerns mechanical signal processing comprising a mechanical adder as a basic building block. Such a mechanical adder (40), which is a basic element of the present invention, comprises a first micromechanical member (40.1) being sensitive to a first frequency (f.sub.1) and a second micromechanical member (40.2) being sensitive to a second frequency (f.sub.2). The two micromechanical members (40.1, 40.2) are coupled via a linear coupling (41) to provide a superposition (sum) of the two frequencies (f.sub.1 and f.sub.2). Based on the adder, AND-gates and OR-gates can be realized by adding further micromechanical members and appropriate linear and non-linear coupling elements.

Abstract: The present invention concerns a cantilever arrangement for scanning a surface. This arrangement comprises a first cantilever having a first probe and a second cantilever having a second probe. Both cantilevers are mechanically coupled such that the second cantilever follows the movement of the first cantilever, i.e. the deflection of the first cantilever defines the deflection of the second cantilever.

Abstract: The invention relates to a positioning apparatus, providing for an excursion of a tool (12) with respect to a sample or medium to be interacted with. The positioning apparatus comprises apparatus for applying a driving force (F.sub.D) which causes the excursion of the tool (12). Counteracting apparatus is provided which exerts a counteracting force (F.sub.C) to the driving force (F.sub.D). The counteracting apparatus comprises a deformable substance (25) which is mechanically coupled to the tool (12) and effects the counteracting force (F.sub.C) and further comprises adjustment means (28) allowing to adjust the deformability of the deformable substance (25).

Abstract: The present invention concerns a storage device comprising a local probe array (72) and a storage medium (70) with an array of storage fields (71). The local probe array (72) is situated opposite to the storage medium (70) such that each local probes (73) of the local probe array can be scanned over the corresponding storage field (71). The storage device further comprises circuit for distinguishing between information to be erased from a first section of the storage medium and information in this section which is not to be erased, circuit for selectively copying the information which is not to be erased into a memory, preferably another section of said medium, and circuit for erasing the whole first section.

Abstract: A fine-positioning apparatus for a scanning probe microscope includes magnetic solenoid actuators for each of the x, y and z scanning axes of the microscope. The sample is mounted on the coil of one of the actuators for movement of the sample in the z direction while the tunnelling probe is attached to two other solenoid actuators for movement of the probe in the x and y directions.

Abstract: A cantilever for scanning probe microscopy and other force or deflection measurements is described. The cantilever includes at least one one integrated strain sensing element within a constriction section (62) . The cantilever is improved over known cantilevers by reducing the longitudinal extension of the constriction, such that its contribution to the total deflection of the cantilever is reduced. The design of the cantilever is further improved by applying a beam (63) with an essentially triangular cross section in either a vertical or a horizontal plane or both.

Abstract: A continuous hollow compartment open at both opposite ends thereof is arranged within an electrically insulating housing. Tubular portions of end contacts extend into ends of the hollow compartment and are completely covered at their inner surfaces by an arc-inhibiting screen. Flat portions of the end contacts form clamping locations and solder pins. The ends of a fuse wire and the ends of the screen are clamped at the clamping locations. The solder pins form a respective wave solder region and a reflow solder region. During manufacture of the safety fuse element, the tubular-shaped end contacts are inserted into the ends of the hollow compartment of the housing. Then there is drawn-in the screen and the fuse wire and the flattenable portions of the end contacts are flattened to form the flat portions, so that there are clamped at the clamping locations the ends of the fuse wire and the ends of the screen. Now the flat portions are bent to form the solder pins.

Abstract: Within an electrically insulating housing there is provided a continuous hollow space open at both ends. Tubular portions of end contacts are insertably disposed at both ends of the hollow space. Flat portions of the end contacts form clamping locations for a fusible conductor and also solder legs. At the clamping locations there are clamped the ends of the fusible conductor. Each of the solder legs form an associated wave soldering region and a reflow soldering region. During fabrication of the fuse device the end contacts which then still possess a tubular-shaped configuration are inserted into the ends of the hollow space of the electrically insulating housing. There is then drawn-in the fusible conductor and predetermined portions of each of the end contacts are pressed flat for form the flat portions. In this way, the ends of the fusible conductor are clamped at the clamping locations. Thereafter, the flat portions are bent to form the solder legs.

Abstract: The vibration filter comprises an inner ring (27) on which vibration-sensitive equipment may be installed, the ring (27) being suspended from a plurality of springs (24, 25, 26) elastically supported by posts (18, 19, 20) in turn mounted on an outer ring (1) which is spring-suspended the same as the inner ring (27) from a rigid bench (8). The springs (12, 13, 14; 24, 25, 26) and other elastic members (9, 10, 11; 15, 16, 17; 21, 22, 23; 28, 29, 30) have differing resonant frequencies.Between the bench (8) and the outer ring (1), and between the outer and inner rings (1, 27) there may be provided eddy current brakes consisting of strong permanent magnets (46, 48) arranged opposite individual copper or aluminum blocks (5, 47).

Abstract: The formation of lines of the order of 8 Angstroms wide is achieved using a tunneling current through a gas that changes to provide a residue that is the basis of the line. The tunneling current energy is tuned to the energy required to dissociate the gas.

Abstract: This method involves the deposition of free metal atoms (4) from the apex (5) of a pointed tip (1) supported at a distance of 10 to 20 nm from a substrate (2). The atoms (4) are being field-desorbed under the influence of a strong electric field existing between the tip (1) and the substrate (2). With the tip (1) being moved across the substrate (2), a narrow trace (6) of metal atoms will be deposited on the substrate.

Abstract: The travelling support (1) comprises a piezo-electric plate (2) resting on three legs (6) whose bottom surface is insulated from the bench (8) on which the support is to travel, by a dielectric (7). The piezo-electric plate (2) can be caused to contract by means of an actuating voltage applied via sliders (9, 10) to top and bottom electrodes on the plate (2). By applying a voltage to the legs (6), these may be clamped selectively by electrostatic forces effective across the dielectric (7). Appropriate control of the actuating and clamping voltages causes the support (1) to either move in a linear or rotary fashion. The displacements the support can perform per step are in the nanometer range.

Abstract: The vacuum tunnel effect is utilized to form a scanning tunneling microscope. In an ultra-high vacuum at cryogenic temperature, a fine tip is raster scanned across the surface of a conducting sample at a distance of a few Angstroms. The vertical separation between the tip and sample surface is automatically controlled so as to maintain constant a measured variable which is proportional to the tunnel resistance, such as tunneling current. The position of the tip with respect to the surface is controlled preferably by piezo electric drive means acting in three coordinate directions. The spatial coordinates of the scanning tip are graphically displayed. This is conveniently done by displaying the drive currents or voltages of piezo electric drives.