Abstract: A method for manufacturing a semiconductor device that includes p- and n-type regions formed on an insulating substrate, and an interconnection layer electrically coupled with these p- and n-type regions. The interconnection layer is an n-type polycrystalline silicon layer which is electrically coupled with the p- and n-type regions through a metal silicide film formed between the interconnection layer and the p- and n-type regions.

Abstract: A semiconductor circuit has a power source terminal set at a positive potential, a reference potential terminal set at a reference potential, a first MOS transistor whose current path is connected between the power source terminal and an output terminal, and a second MOS transistor whose current path is connected between the output terminal and the reference potential terminal. The gates of the first and second MOS transistors are commonly connected to an input terminal. The first and second MOS transistors are respectively n- and p-channel MOS transistors.

Abstract: A complementary semiconductor device includes P- and N-type semiconductor regions separately formed in a semiconductor substrate and having substantially the same concentration of impurities. N-and P-channel type silicon gate field effect transistors are formed in the P-and N-channel type regions, respectively. Gate electrodes of the P-and N-channel type silicon gate field effect transistors are formed by polycrystalline silicons of the same conductivity type. An impurity of the same conductivity type is doped into both the semiconductor regions to provide channel doped regions.

Abstract: A semiconductor circuit has a power source terminal set at a positive potential, a reference potential terminal set at a reference potential, a first MOS transistor whose current path is connected between the power source terminal and an output terminal, and a second MOS transistor whose current path is connected between the output terminal and the reference potential terminal. The gates of the first and second MOS transistors are commonly connected to an input terminal. The first and second MOS transistors are respectively n- and p-channel MOS transistors.

Abstract: The invention provides a bonding wire which prevents electric short-circuiting even if it comes into contact with another bonding wire, a bonding method using the same, and a semiconductor device including the same. The bonding wire comprises a core wire made of a metal and an insulating film which surrounds it. The insulating film is eliminated from the ends of the bonding wire by thermal decomposition and scattering, while simultaneously each end of the bonding wire is connected to a bonding pad of the semiconductor device or to a lead frame. In the semiconductor device, the bonding pads are respectively connected to lead frames by means of the bonding wires.

Abstract: A semiconductor device includes p- and n-type semiconductor layers formed on an insulating substrate and gate electrodes selectively and insulatively formed over the respective p- and n-type semiconductor layers and forming D-type MOS transistors. In this semiconductor device, the p- and n-type semiconductor layers are made in contact with each other, and negative and positive power supply terminals which are respectively set at negative and positive potentials are respectively connected to the p- and n-type semiconductor layers thereby to electrically isolate the p-type and n-type semiconductor layers from each other.

Abstract: A semiconductor device includes p- and n-type semiconductor layers formed on an insulating substrate and gate electrodes selectively and insulatively formed over the respective p- and n-type semiconductor layers and forming D-type MOS transistors. In this semiconductor device, the p- and n-type semiconductor layers are made in contact with each other, and negative and positive power supply terminals which are respectively set at negative and positive potentials are respectively connected to the p- and n-type semiconductor layers thereby to electrically isolate the p-type and n-type semiconductor layers from each other.

Abstract: A semiconductor device includes p- and n-type semiconductor layers formed on an insulating substrate and an n-type interconnection layer formed to be electrically coupled with said n-type semiconductor layer. The n-type interconnection layer is formed in contact with the p-type semiconductor layer and is set at such a potential as to apply a reverse voltage across the p-n junction between the n-type interconnection layer and p-type semiconductor layer, so as to electrically isolate the n-type interconnection layer from the p-type semiconductor layer.

Abstract: The invention provides a bonding wire which prevents electric short-circuiting even if it comes into contact with another bonding wire, a bonding method using the same, and a semiconductor device including the same. The bonding wire comprises a core wire made of a metal and an insulating film which surrounds it. The insulating film is eliminated from the ends of the bonding wire by thermal decomposition and scattering, while simultaneously each end of the bonding wire is connected to a bonding pad of the semiconductor device or to a lead frame. In the semiconductor device, the bonding pads are respectively connected to lead frames by means of the bonding wires.

Abstract: A complementary semiconductor device includes P-and N-type semiconductor regions separately formed in a semiconductor substrate and having substantially the same concentration of impurities. N-and P-channel type silicon gate field effect transistors are formed in the P-and N-channel type regions, respectively. Gate electrodes of the P-and N-channel type silicon gate field effect transistors are formed by polycrystalline silicons of the same conductivity type. An impurity of the same conductivity type is doped into both the semiconductor regions to provide channel doped regions.

Abstract: A position and direction sensing mark is formed on an integrated circuit pellet formed with a prescribed electrode pattern. The position and direction sensing mark comprises a plurality of strips which are extended in a direction different from that in which the electrode pattern is extended and are arranged in turn at prescribed intervals in a direction intersecting the different direction at right angles thereto.

Abstract: A complementary semiconductor device includes P- and N-type semiconductor regions separately formed in a semiconductor substrate and having substantially the same concentration of impurities. The N- and P-channel type silicon gate field effect transistors are formed in the P- and N-channel type regions, respectively. Gate electrodes of the P-and N-channel type silicon gate field effect transistors are formed by polycrystalline silicons of the same conductivity type. An impurity of the same conductivity type is doped into both the semiconductor regions to provide channel doped regions.