Abstract: A photographing step of obtaining an original image by photographing a part or all of a sliding surface using a camera is performed and then an imaging process of detecting machining marks on the original image is performed; a detecting step of obtaining a detection image is performed; and an evaluating step of estimating a difference of a rotation torque of the raceway ring member with respect to another raceway ring member on the basis of the detection image in a direction of relative rotation between the raceway ring member and the other raceway ring member when a rolling bearing is constituted by combining a raceway ring member with the other raceway ring member is performed.

Abstract: A centerless grinding processing in which a sliding contact surface (10) is subjected to grinding by pressing a grindstone against the sliding contact surface (10) of an inner ring (3) while rotating the inner ring (3) relative to the grindstone in a prescribed direction, and then, in the centerless grinding process, a finishing step in which grinding lines in a direction intersecting grinding lines formed on the sliding contact surface (10) are formed on the sliding contact surface (10) and/or processing for improving the surface roughness of the sliding contact surface (10) is performed is performed.

Abstract: Disclosed are a charged particle beam apparatus and a sample processing observation method, the method including: a sample piece formation process in which a sample is irradiated with a focused ion beam such that a sample piece is cut out from the sample; a cross-section processing process in which the sample piece support holds the sample piece and a cross section thereof is irradiated with the ion beam to process the cross section; a sample piece approach movement process in which the sample piece support holds the sample piece and the sample piece is moved to a position that is closer to an electron beam column than an intersection point of beam optical axes of the ion beam and an electron beam is; and a SEM image acquisition process in which the cross section is irradiated with the electron beam to acquire the SEM image of the cross section.

Abstract: A photographing step of obtaining an original image by photographing a part or all of a sliding surface using a camera is performed and then an imaging process of detecting machining marks on the original image is performed; a detecting step of obtaining a detection image is performed; and an evaluating step of estimating a difference of a rotation torque of the raceway ring member with respect to another raceway ring member on the basis of the detection image in a direction of relative rotation between the raceway ring member and the other raceway ring member when a rolling bearing is constituted by combining a raceway ring member with the other raceway ring member is performed.

Abstract: An etching apparatus includes a chamber capable of being evacuated, a first electrode provided in the chamber and including a tray support portion configured to support a tray which can hold a plurality of substrates and load/unload the substrates into/from the chamber, and a voltage applying unit configured to apply a voltage to the first electrode. A dielectric plate is attached to a portion, of an obverse surface of the first electrode, which faces an outer edge portion of a non-target surface of the substrate.

Abstract: An object of the invention is to provide a technique of capturing images at higher speed and higher magnification when acquiring continuous tilted images with an electron microscope. The electron microscope of the invention includes a first spherical receiver fixed to a column of the electron microscope and configured to slide with a spherical fulcrum provided at a tip end of a sample holder; a spherical surface part provided on the column; and a second spherical receiver provided outside the column. The spherical surface part and the second spherical receiver slide on a contact part between the spherical surface part and the second spherical receiver, and a track of the slide is along a spherical surface centered on a central axis of the first spherical receiver, so that a view shift and a focus shift from an observation position of a sample can be reduced.

Abstract: An object of the invention is to provide a technique of capturing images at higher speed and higher magnification when acquiring continuous tilted images with an electron microscope. The electron microscope of the invention includes a first spherical receiver fixed to a column of the electron microscope and configured to slide with a spherical fulcrum provided at a tip end of a sample holder; a spherical surface part provided on the column; and a second spherical receiver provided outside the column. The spherical surface part and the second spherical receiver slide on a contact part between the spherical surface part and the second spherical receiver, and a track of the slide is along a spherical surface centered on a central axis of the first spherical receiver, so that a view shift and a focus shift from an observation position of a sample can be reduced.

Abstract: An image processing system is provided that includes an image capturing apparatus configured to generate a plurality of captured images and at least one information processing apparatus connected to the image capturing apparatus. The information processing apparatus includes processing circuitry configured to input at least a first captured image and a second captured image from among the plurality of captured images, acquire first conversion data to be used for converting the first captured image and second conversion data to be used for converting the second captured image, and generate an output image by stitching converted images generated by converting the first captured image based on the first conversion data and the second captured image based on the second conversion data.

Abstract: Disclosed are a charged particle beam apparatus and a sample processing observation method, the method including: a sample piece formation process in which a sample is irradiated with a focused ion beam such that a sample piece is cut out from the sample; a cross-section processing process in which the sample piece support holds the sample piece and a cross section thereof is irradiated with the ion beam to process the cross section; a sample piece approach movement process in which the sample piece support holds the sample piece and the sample piece is moved to a position that is closer to an electron beam column than an intersection point of beam optical axes of the ion beam and an electron beam is; and a SEM image acquisition process in which the cross section is irradiated with the electron beam to acquire the SEM image of the cross section.

Abstract: Disclosed are a charged particle beam apparatus wherein the charged particle beam apparatus can efficiently performs finish processing of a sample and acquisition of a high-precision SEM image of a processing surface of the sample in a short time, and a sample processing observation method using the same. The charged particle beam apparatus includes: a gallium ion beam column radiating a gallium ion beam toward a sample to form a cross-section of the sample; an electron beam column having a semi-in-lens type objective lens and radiating an electron beam toward the sample; a gas ion beam column radiating a gas ion beam toward the sample to perform finish processing of the cross-section of the sample, wherein the gas ion beam has a beam diameter larger than a maximum diameter of the cross-section of the sample.

Abstract: A charged particle beam apparatus includes: an irradiation unit that irradiates a sample with a charged particle beam; an image formation section that detects a charged particle generated from the sample due to the irradiation with the charged particle beam and forms an image based on a signal obtained by detecting the charged particle; an input reception unit that receives an observation condition; a derivation section that derives second observation parameters proper for the observation condition based on the received observation condition and first observation parameters stored in a storage unit; and a control unit that controls the irradiation unit based on the second observation parameters.

Abstract: Disclosed are a charged particle beam apparatus wherein the charged particle beam apparatus can efficiently performs finish processing of a sample and acquisition of a high-precision SEM image of a processing surface of the sample in a short time, and a sample processing observation method using the same. The charged particle beam apparatus includes: a gallium ion beam column radiating a gallium ion beam toward a sample to form a cross-section of the sample; an electron beam column having a semi-in-lens type objective lens and radiating an electron beam toward the sample; a gas ion beam column radiating a gas ion beam toward the sample to perform finish processing of the cross-section of the sample, wherein the gas ion beam has a beam diameter larger than a maximum diameter of the cross-section of the sample.

Abstract: An image processing system is provided that includes an image capturing apparatus configured to generate a plurality of captured images and at least one information processing apparatus connected to the image capturing apparatus. The information processing apparatus includes processing circuitry configured to input at least a first captured image and a second captured image from among the plurality of captured images, acquire first conversion data to be used for converting the first captured image and second conversion data to be used for converting the second captured image, and generate an output image by stitching converted images generated by converting the first captured image based on the first conversion data and the second captured image based on the second conversion data.

Abstract: A display control method includes: inputting user's image including a drawing portion made by hand drawing and being a display target image; and performing image control including causing the input user's image to emerge from any one of a left end and a right end of a predetermined display region, on which the user's image is to be displayed, and moving the user's image that has emerged.

Abstract: A cooling gas is fed from an ejection nozzle into the interior of a through-hole which is formed in a radially central portion of a main spindle, and which penetrates through said main spindle in an axial direction. The cooling gas passes through radial venting holes provided in a plurality of locations, in the circumferential direction, in an axially intermediate portion of the main spindle, is fed into axial venting holes provided in a plurality of locations, in the circumferential direction, extending from one axial-direction end of the main spindle to an intermediate portion thereof, is caused to flow through the axial venting holes, and is discharged from discharge holes.

Abstract: A charged particle beam apparatus includes: an irradiation unit that irradiates a sample with a charged particle beam; an image formation section that detects a charged particle generated from the sample due to the irradiation with the charged particle beam and forms an image based on a signal obtained by detecting the charged particle; an input reception unit that receives an observation condition; a derivation section that derives second observation parameters proper for the observation condition based on the received observation condition and first observation parameters stored in a storage unit; and a control unit that controls the irradiation unit based on the second observation parameters.

Abstract: Provided is a gaming machine which does not bore the player through reel actions until completion of rearrangement of symbols. Under the condition where predetermined symbols are aligned on a payline when the symbols of a first scroll line of at least one of a plurality of scroll lines are being scrolled and symbols on the remaining second scroll lines are stopped, the gaming machine changes scrolling motion of symbols of the first scroll line.

Abstract: A cooling gas is fed from an ejection nozzle into the interior of a through-hole which is formed in a radially central portion of a main spindle, and which penetrates through said main spindle in an axial direction. The cooling gas passes through radial venting holes provided in a plurality of locations, in the circumferential direction, in an axially intermediate portion of the main spindle, is fed into axial venting holes provided in a plurality of locations, in the circumferential direction, extending from one axial-direction end of the main spindle to an intermediate portion thereof, is caused to flow through the axial venting holes, and is discharged from discharge holes.

Abstract: A display control method includes: inputting user's image including a drawing portion made by hand drawing and being a display target image; and performing image control including causing the input user's image to emerge from any one of a left end and a right end of a predetermined display region, on which the user's image is to be displayed, and moving the user's image that has emerged.

Abstract: A display control method includes: inputting user's image including a drawing portion made by hand drawing and being a display target image; and performing image control including causing the input user's image to emerge from any one of a left end and a right end of a predetermined display region, on which the user's image is to be displayed, and moving the user's image that has emerged.