Patents by Inventor Hidenori Yamaguchi

Hidenori Yamaguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 5324550
    Abstract: In forming a resist pattern by forming a resist film containing an acid generator on a spin on glass film or a silicon resin film and subsequent exposure of light, an inhomogeneous distribution of an acid in the resist film caused by the spin on glass film or the silicon resin film is remedied by adding an acid generator beforehand into the spin on glass film or the silicon resin film or by using an organic polymer containing an acid generator. As a result, a profile defect in a cross section of the resist pattern caused by inhomogeneous acid distribution is prevented and the resist pattern has a rectangular cross-sectional shape.
    Type: Grant
    Filed: August 12, 1992
    Date of Patent: June 28, 1994
    Assignee: Hitachi, Ltd.
    Inventors: Hidenori Yamaguchi, Fumio Murai, Norio Hasegawa, Toshio Sakamizu, Hiroshi Shiraishi
  • Patent number: 5209813
    Abstract: A lithographic method and a lithographic apparatus ar disclosed in which the height of a silicon wafer making up an object of lithography is accurately measured. A lithographic apparatus such as an electron beam apparatus having a height-measuring instrument built therein is effectively used for forming a pattern on the order of submicrons.
    Type: Grant
    Filed: October 24, 1991
    Date of Patent: May 11, 1993
    Assignee: Hitachi, Ltd.
    Inventors: Yoshitada Oshida, Genya Matsuoka, Teruo Iwasaki, Toshio Kaneko, Hiroyuki Takahashi, Hiroyoshi Ando, Hidenori Yamaguchi, Katsuhiro Kawasaki
  • Patent number: 5166529
    Abstract: An electron beam lithography apparatus, comprising an electron beam source for irradiating an electron beam on a specimen surface, a deflectional controller of the electron beam, a focal controller of the electron beam on the specimen surface, a light source which irradiates two monochromatic lights on the surface having wavelengths which are different a half thereof each other, a signal processor for obtaining correction values in a height direction of the beam based on the reflected lights from the surface, and a means for adjusting the focal controller according to the correction values in the height direction. As the wavelengths of the two monochromatic lights on the surface are different in a half wavelength each other, an interference caused by a photo-resist on the specimen is prevented.
    Type: Grant
    Filed: December 2, 1991
    Date of Patent: November 24, 1992
    Assignee: Hitachi, Ltd.
    Inventors: Hiroyoshi Ando, Genya Matsuoka, Hiroyuki Takahashi, Hidenori Yamaguchi, Teruo Iwasaki
  • Patent number: 4012843
    Abstract: A tool for ruling grating grooves is reciprocated on a diffraction grating blank with the tool being restrained within a plane inclined at an arbitrary angle relative to a plane lying in contact with one point on a spherical concave of the diffraction grating blank. Translation for a variable pitch-groove spacing which changes as a function of the groove number or groove position is imparted to the diffraction grating blank in interlocking relationship with the reciprocation, thereby mechanically ruling the desired sphere of the grating blank with the grating grooves, whereby a concave diffraction grating which forms diffracted light of a specific wavelength into a completely stigmatic image at high diffraction efficiency can be manufactured.
    Type: Grant
    Filed: December 9, 1974
    Date of Patent: March 22, 1977
    Assignee: Hitachi, Ltd.
    Inventors: Tatsuo Harada, Shigeo Moriyama, Toshiaki Kita, Hidenori Yamaguchi
  • Patent number: D490396
    Type: Grant
    Filed: March 6, 2003
    Date of Patent: May 25, 2004
    Assignee: Aiphone Co., Ltd.
    Inventors: Hidenori Yamaguchi, Toshio Hotta