Patents by Inventor Hiroshi Kosuge

Hiroshi Kosuge has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8034456
    Abstract: The present invention provides a surface-treated metal material having a film formed on at least a portion of a surface of a metal material, the film containing at least polyurethane resin and silicon oxide, and a metal surface treatment agent used to obtain the surface-treated metal material. The polyurethane resin contains one or more of siloxane bond, dehydration-condensation bond of silanol group and different functional group, and silanol moiety, and urea bond. The sum of the siloxane bond, the dehydration-condensation bond of silanol group and different functional group, total amount of the silanol moiety, and the silicon oxide falls within a range of equal to or more than 1.6 wt % to equal to or less than 25 wt % for solids of the film. The ratio of the total amount of urea bond and urethane bond to the total amount of resin components falls within a range of equal to or more than 0.1 wt % to equal to or less than 10 wt %.
    Type: Grant
    Filed: June 22, 2007
    Date of Patent: October 11, 2011
    Assignees: Nippon Steel Corporation, Mitsui Chemicals, Inc.
    Inventors: Atsushi Morishita, Masahiro Fuda, Hiroshi Kanai, Hiroshi Kosuge, Tsutomu Tawa
  • Publication number: 20100233490
    Abstract: The present invention provides a surface-treated metal material having a film formed on at least a portion of a surface of a metal material, the film containing at least polyurethane resin and silicon oxide, and a metal surface treatment agent used to obtain the surface-treated metal material. The polyurethane resin contains one or more of siloxane bond, dehydration-condensation bond of silanol group and different functional group, and silanol moiety, and urea bond. The sum of the siloxane bond, the dehydration-condensation bond of silanol group and different functional group, total amount of the silanol moiety, and the silicon oxide falls within a range of equal to or more than 1.6 wt % to equal to or less than 25 wt % for solids of the film. The ratio of the total amount of urea bond and urethane bond to the total amount of resin components falls within a range of equal to or more than 0.1 wt % to equal to or less than 10 wt %.
    Type: Application
    Filed: June 22, 2007
    Publication date: September 16, 2010
    Inventors: Atsushi Morishita, Masahiro Fuda, Hiroshi Kanai, Hiroshi Kosuge, Tsutomu Tawa
  • Patent number: 5563894
    Abstract: An error detecting and correcting apparatus includes a unit for receiving an encoded word including a plurality of b-bit bytes (b is an integer not less than two) and generating syndrome from the encoded word according to a first parity check matrix H.sub.1, and a unit for correcting errors in the received encoded word based on the syndrome.
    Type: Grant
    Filed: December 7, 1992
    Date of Patent: October 8, 1996
    Assignee: Hitachi, Ltd.
    Inventors: Eiji Fujiwara, Hiroshi Kosuge, Yoshio Kiriu
  • Patent number: 5450423
    Abstract: Memory expansion using memory packages of different generations is performed without unnecessarily increasing the minimum memory capacity of a memory device and while obtaining a high error detecting ability and high reliability. In expanding the capacity of a memory device by using first generation 1M.times.1 bit IC memory packages, second generation 4M.times.4 bits IC memory packages, or third generation 16M.times.8 bits IC memory packages, the total code length is set to 40 bits, a 4's multiple, within a range longer than the total code length necessary for S4ED and shorter than the total code length necessary for S8ED, and a reduced code is used for enhancing the S8ED function. In this manner, wasteful first generation IC memory packages can be reduced in number, and the error detecting ability of a memory device using third generation memory packages can be retained substantially the same as that of a memory device using first generation memory packages.
    Type: Grant
    Filed: March 17, 1992
    Date of Patent: September 12, 1995
    Assignees: Hitachi, Ltd., Hitachi Computer Electronics Co., Ltd.
    Inventors: Kazuya Iwasaki, Hiroshi Kosuge, Yoshio Kiriu, Ryoichi Kurihara
  • Patent number: 4888774
    Abstract: An error detecting apparatus in which an error within an arbitrary and continuous (b-1) bit block is detected using a SEC-DED-SbED code. The (b-1) bit block is any continuous (b-1) bit block within an information consisting of several b bit blocks. The data are encoded by using a power of a matrix C, defined as: ##EQU1## and a matrix B. Matrix B is comprised by arbitrarily replacing the rows and columns of the power of C matrix with row vectors from a set of (b+1) vectors: ##EQU2## The partial matrices obtained from matrices B and C are used to construct a parity matrix. Syndromes are computed from the information and the party matrix to detect errors.
    Type: Grant
    Filed: December 15, 1987
    Date of Patent: December 19, 1989
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kosuge, Yoshio Kiriu
  • Patent number: 4719563
    Abstract: A data transmission control device for controlling the data transfer between two memory means on the basis of an instruction from a processor is disclosed in which the instruction from the processor is decoded, a transfer request is issued to each memory means a plurality of times, depending upon a transfer unit indicated by the decoded instruction and an access unit of each memory means, a data buffer is provided between the memory means to temporarily store data whichis transferred from one of the memory means to the other memory means, and the issue of a transfer request to each memory means is allowed or stopped in accordance with the quantity of data stored in the data buffer.
    Type: Grant
    Filed: December 20, 1984
    Date of Patent: January 12, 1988
    Assignee: Hitachi, Ltd.
    Inventors: Hiroshi Kosuge, Yoshio Kiriu, Junichi Taguri
  • Patent number: 4692922
    Abstract: A method for correcting and detecting errors using the SEC-DED-SbED code is provided, wherein the information consisting of several blocks of b bits is encoded based on the parity matrix including any of b.times.b matrix X q (q=1 to b) in which each row of b.times.b matrix ##EQU1## is cyclically displaced along the column direction by a desired number (q) of bits in each partial matrix corresponding to the above block.
    Type: Grant
    Filed: December 11, 1985
    Date of Patent: September 8, 1987
    Assignee: Hitachi, Ltd.
    Inventors: Yoshio Kiriu, Shigeru Kaneko, Hiroshi Kosuge