Abstract: When a preceding vehicle moves away during follow-up running control, it is determined whether or not a forward obstacle is recognized. When a forward obstacle is recognized, it is determined whether or not the forward obstacle satisfies any of obstacle specifying conditions corresponding to a plurality of preset types. A basic threshold value set corresponding to the satisfied type is corrected by three correction values so as to set first to third estimated-collision-time determining values. The estimated-collision-time determining values are compared with an estimated collision time of a subject vehicle with respect to the forward obstacle, and acceleration control on the subject vehicle is limited stepwise in accordance with the comparison values.

Abstract: In a vehicle running control system, when an estimated collision time taken until a subject vehicle collides with a target object is shorter than a set threshold value, the target object is regarded as a preceding vehicle, and the subject vehicle is caused to follow the target object. Even in a case in which the estimated collision time is longer than or equal to the threshold value, when the target object is present on a subject-vehicle traveling lane or when the subject-vehicle traveling lane is not recognized, if an overlapping ratio between the subject vehicle and the target object is more than or equal to an overlapping-ratio determining threshold value, the target object is regarded as a preceding vehicle, and the subject vehicle is caused to follow the target object.

Abstract: A test apparatus for testing an electronic device by providing test signals to the electronic device and comparing multiple output signals with respective anticipated values is disclosed, the test apparatus including: a reference timing detecting unit for detecting that one of the output signals has changed; a setting unit for setting beforehand a minimum time from changing of the output signal to changing of another output signal; an acquisition unit for acquiring the value of the latter output signal at a timing at which the minimum time has elapsed from detection of change of the former output signal; and a determination unit for determining the electronic device to be defective in the event that the value of the latter output signal thus acquired does not match the value which the latter output signal should assume following elapsing of the minimum time.

Abstract: The semiconductor integrated circuit includes a memory for storing secret data, a memory BIST circuit for executing a memory. BIST, a first selector for switching between a path for a memory isolation test via an external terminal and a path from the memory BIST circuit, a second selector for switching between a path from the output of the first selector and a path from a normal circuit and having an output coupled to the memory, and a third selector for switching between a path from the output of the memory and a path for receiving a pseudo signal and receiving a check completion signal outputted from the memory BIST circuit as a selection signal. In this semiconductor integrated circuit, after the memory is initialized by executing the memory BIST, the memory can be accessed from the external terminal via the path for the memory isolation test.

Abstract: A driving apparatus for moving an object. The apparatus includes a first actuator which drives the object in X and Y directions, a second actuator which drives a reaction force counter which receives a reaction force generated when the first actuator drives the object, and a controller which calculates X- and Y-direction reaction forces and a moment reaction force on the basis of X- and Y-direction positions of the object and X- and Y-direction accelerations of the object, which are to be received by the reaction force counter when the object is driven by the first actuator, and controls the second actuator so as to cancel the reaction forces and the moment reaction force.

Abstract: A driving apparatus for moving an object. The apparatus includes a first actuator which drives the object in X and Y directions, a second actuator which drives a reaction force counter, which receives a reaction force generated when the first actuator drives the object, and a controller which calculates X- and Y-direction reaction forces and a moment reaction force on the basis of X- and Y-direction positions of the object and X- and Y-direction accelerations of the object, which are to be received by the reaction force counter when the object is driven by the first actuator, and controls the second actuator so as to cancel the reaction forces and the moment reaction force.

Abstract: A positioning apparatus which positions a stage (7) includes measurement systems which measure the position of the stage (7), and a correction unit (15) which corrects, on the basis of the acceleration of the stage (7), the values measured by the measurement systems (3, 4).

Abstract: An existence probability of an image object based on an image taken by a stereo camera 2 is calculated by an image object existence probability calculating portion 11, an existence probability of a millimeter wave object based on an output of a millimeter wave radar 3 is calculated by a millimeter wave object existence probability calculating portion 12, and an existence probability of a laser object based on an output of a laser radar 4 is calculated by a laser object existence probability calculating portion 13.

Abstract: A semiconductor device having a self test function includes a memory, a first data processing portion connected to a former stage of the memory through a first path, a second data processing portion connected to a latter stage of the memory through a second path, a failure detecting circuit for detecting a failure of the first data processing portion, the first path, the memory, the second path and the data processing portion by using a test pattern, a normal path provided on an input side of the first data processing portion and serving to transmit a signal to the first data processing portion in a normal operation of the semiconductor device, a first test path provided on the input side of the first data processing portion and serving to transmit a test pattern output from the failure detecting circuit in a test operation of the semiconductor device, and a selecting and output portion for selecting either a signal input through the normal path or a signal input through the first test path and outputting the

Abstract: Exemplary embodiments of the invention provide a method of reworking a magnetic head assembly in which an electrode pad of a magnetic head slider and an electrode pad of a suspension are soldered so as to be perpendicular to each other and in which a defective slider is replaced with a new slider when the magnetic head slider is the defective slider. The method includes planarizing a solder, which bonds the electrode pad of the defective slider and the electrode pad of the suspension, on the electrode pad of the suspension by a hot wind and reusing the planarized solder to bond the electrode pad of the new slider replaced for the defective slider and the electrode pad of the suspension to each other.

Abstract: A test program debugging apparatus of the present invention includes a device under test simulator and a semiconductor testing apparatus simulator. Further, the semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.

Abstract: A driving apparatus for moving an object. The apparatus includes a first actuator which drives the object in X and Y directions, a second actuator which drives a reaction force counter which receives a reaction force generated when the first actuator drives the object, and a controller which calculates X- and Y-direction reaction forces and a moment reaction force on the basis of X- and Y-direction positions of the object and X- and Y-direction accelerations of the object, which are to be received by the reaction force counter when the object is driven by the first actuator, and controls the second actuator so as to cancel the reaction forces and the moment reaction force.

Abstract: An adjustment unit identifies a front-rear driving force distribution control unit and a braking force control unit, and calculates based on the current vehicle state, a target yaw moment required for each of the front-rear driving force distribution control unit and braking force control unit. Then, based on the current operating state of each of the control units, a control correction value for each unit is calculated in consideration of the maximum value, and outputted.

Abstract: A driving apparatus for moving an object. The apparatus includes a first actuator which drives the object in X and Y directions, a second actuator which drives a reaction force counter which receives a reaction force generated when the first actuator drives the object, and a controller which controls the second actuator on the basis of X- and Y-direction positions of the object and X- and Y-direction accelerations of the object so as to cancel, by the second actuator, the reaction force to be received by the reaction force counter when the object is driven by the first actuator.

Abstract: Acceptability of an electronic device is determined with higher precision by performing testing regarding correlation of the timing at which multiple output signals output from the electronic device change.

Abstract: A test program debugging apparatus of the present invention includes a device under test simulator and a semiconductor testing apparatus simulator. Further, the semiconductor testing apparatus simulator includes: a verification range acquiring unit that acquires a verification range that is a range of commands to be verified among commands included in the test program; a command simplifying unit that simplifies non-setting commands other than setting commands for setting the device under test simulator, among non-verification range commands included in a non-verification range that is a range other than the verification range within the test program; and a command executing unit that executes the verification range commands included in the verification range, the setting commands, and the non-setting commands simplified by the command simplifying unit.

Abstract: A vehicle surroundings monitoring apparatus comprises image solid object detecting means for detecting image solid objects based on image information outputted from a CCD camera, millimeter wave solid object detecting means for detecting millimeter wave solid objects based on signals outputted from a millimeter wave radar, fusion solid object establishing means for establishing fusion solid objects composed of single image solid objects, single millimeter wave solid objects and a combination of the image solid objects and the millimeter wave solid objects by fusing the image solid objects and the millimeter wave solid objects, first reliability judging means for judging a degree of reliability of the fusion solid objects based on a detecting situation of the respective fusion solid objects by the image solid object detecting means, second reliability judging means for judging a degree of reliability of the fusion solid objects based on a detecting situation of the respective fusion solid objects by the millim

Abstract: A vehicle surroundings monitoring apparatus inputs images taken by a stereoscopic camera, vehicle speeds, steering wheel rotation angles, yaw rates and ON-OFF signals of a turn signal switch. An own travailing path C is calculated from an own traveling path A obtained from lane markers and side walls and an own traveling path B obtained from yaw rates of the own vehicle. Further, a new own traveling path E is calculated from the own traveling path C and a trace of a preceding vehicle, in which case where there is no possibility of a lane change of the preceding vehicle and the turn signal switch is turned off and the absolute value of the steering wheel rotation angle is smaller than a specified value and a present own traveling path is calculated from the own travailing path E and a previous own traveling path. In other cases, the present own traveling path is calculating from the travailing path C and the previous own traveling path.

Abstract: This invention provides a technique that can cancel a reaction force accompanying drive of an object while moderating a limit for a driving pattern to drive the object in X and Y directions. A driving apparatus includes a first actuator which drives the object in X and Y directions, a second actuator which drives a reaction force counter which receives a reaction force generated when the first actuator drives the object, and a controller which controls the second actuator on the basis of X- and Y-direction positions of the object to cancel, by the second actuator, the reaction force to be received by the reaction force counter when the object is driven by the first actuator.

Abstract: A driving apparatus which drives an object along a guide surface in X and Y directions. The apparatus includes a first actuator which drives the object in the X direction, a second actuator which drives the object in the Y direction, and a controller which controls the first and second actuators. The first and second actuators each have a reaction force counter which moves upon receipt of a reaction force generated in driving the object. In moving the object standing at a first position to a second position and stopping the object, the controller controls the first and second actuators such that acceleration periods of the two coincide and deceleration periods of the two coincide. Also, the object moves on a straight line connecting the first position and the second position.