Patents by Inventor Hiroyuki Takamatsu

Hiroyuki Takamatsu has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11221304
    Abstract: A method for measuring the stress of a concave section of a test subject which comprises a metal and has a surface and a concave section, the method including: a detection step for detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays to be incident on the concave section and to be diffracted by the concave section; and a calculation step for calculating the stress of the concave section on the basis of the detection results during the detection step. Therein, the detection step involves causing X-rays to be incident on each of a plurality of sites inside the concave section of the test subject, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the concave section.
    Type: Grant
    Filed: April 6, 2018
    Date of Patent: January 11, 2022
    Assignee: Kobe Steel, Ltd.
    Inventors: Hiroyuki Takamatsu, Toshihide Fukui, Mariko Matsuda, Tatsuhiko Kabutomori
  • Publication number: 20210356253
    Abstract: An oxide layer thickness measurement device according to the present invention stores, for each of layer thickness measurement sub-ranges constituting a layer thickness measurement range, layer thickness conversion information representing a correlation between a layer thickness and an emissivity where a ratio of a change in the emissivity to a change in the layer thickness in the layer thickness measurement sub-range falls within a set extent. Emitting light luminances of a surface of a steel sheet are measured at respective measurement wavelengths different from each other, and a temperature of the surface of the steel sheet is measured to thereby calculate the emissivity at each of the measurement wavelengths.
    Type: Application
    Filed: October 7, 2019
    Publication date: November 18, 2021
    Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
    Inventors: Masahiro INUI, Hiroyuki TAKAMATSU, Ryota NAKANISHI
  • Publication number: 20210356254
    Abstract: An oxide layer thickness measurement device according to the present invention stores, for each of layer thickness measurement sub-ranges constituting a layer thickness measurement range, layer thickness conversion information representing a correlation between a layer thickness and an emitting light luminance where a ratio of a change in the emitting light luminance to a change in the layer thickness in the layer thickness measurement sub-range falls within a set extent. The device includes a plurality of emitting light luminance measurement parts for measuring emitting light luminances of a surface of a steel sheet at respective measurement wavelengths different from each other.
    Type: Application
    Filed: October 7, 2019
    Publication date: November 18, 2021
    Applicant: KABUSHIKI KAISHA KOBE SEIKO SHO (KOBE STEEL, LTD.)
    Inventors: Masahiro INUI, Hiroyuki TAKAMATSU, Ryota NAKANISHI
  • Publication number: 20210251253
    Abstract: The present invention provides a water-containing foam-containing chocolate containing 16 wt % or more and 55 wt % or less of water, the water-containing foam-containing chocolate having new texture that is smooth, fluffy, and soft even in a freezing temperature range and having processability at room temperature and an excellent shape retention property at room temperature and in the freezing temperature range.
    Type: Application
    Filed: April 24, 2019
    Publication date: August 19, 2021
    Inventors: Hiroyuki TAKAMATSU, Yoko ICHIMASA, Shoko ANDO, Etsumi ABE
  • Publication number: 20210055173
    Abstract: A method for measuring a residual stress, including irradiating a cast and forged steel product with X-rays; two-dimensionally detecting intensities of diffracted X-rays originating from the X-rays; and calculating a residual stress based on a diffraction ring formed by an intensity distribution of the diffracted X-rays, wherein the irradiating includes changing a condition for irradiation of the cast and forged steel product with the X-rays, the irradiating is a step of performing the changing each time the cast and forged steel product is irradiated with the X-rays, the calculating is a step of calculating the residual stress each time the cast and forged steel product is irradiated with the X-rays, and the method further includes averaging a plurality of residual stresses calculated in the calculating after the irradiating, the detecting, and the calculating are performed in this order a plurality of times.
    Type: Application
    Filed: November 30, 2018
    Publication date: February 25, 2021
    Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
    Inventors: Mariko MATSUDA, Tatsuhiko KABUTOMORI, Hiroyuki TAKAMATSU
  • Patent number: 10914692
    Abstract: A method that measures stress of a test subject including a metal includes: detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays from an irradiation unit to be incident on the test subject and to be diffracted by the test subject; and calculating the stress of the test subject based on detection results during the detection step. Therein, the detection step involves causing X-rays from the irradiation unit to be incident on each of a plurality of sites on the test subject with the irradiation unit angled relative to the test subject in a manner such that the angle of incidence on the test subject is within the range of 5-20°, inclusive, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the test subject.
    Type: Grant
    Filed: April 6, 2018
    Date of Patent: February 9, 2021
    Assignee: Kobe Steel, Ltd.
    Inventors: Hiroyuki Takamatsu, Toshihide Fukui, Mariko Matsuda, Tatsuhiko Kabutomori
  • Publication number: 20200340933
    Abstract: The present invention is a method for measuring a residual stress in a cast and forged steel product, the method using X-rays, including: irradiating a cast and forged steel product with X-rays; two-dimensionally detecting intensities of diffracted X-rays originating from the X-rays; and calculating a residual stress based on a diffraction ring formed by an intensity distribution of the diffracted X-rays detected in the detecting, wherein, when the residual stress is measured for each of a plurality of measurement positions of the cast and forged steel product, the residual stress for each of the measurement positions is calculated in the calculating based on the diffraction ring for each of the measurement positions and an X-ray elastic constant which varies for each of the measurement positions.
    Type: Application
    Filed: December 21, 2018
    Publication date: October 29, 2020
    Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
    Inventors: Mariko MATSUDA, Tatsuhiko KABUTOMORI, Hiroyuki TAKAMATSU
  • Publication number: 20200141885
    Abstract: A method for measuring the stress of a concave section of a test subject which comprises a metal and has a surface and a concave section, the method including: a detection step for detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays to be incident on the concave section and to be diffracted by the concave section; and a calculation step for calculating the stress of the concave section on the basis of the detection results during the detection step. Therein, the detection step involves causing X-rays to be incident on each of a plurality of sites inside the concave section of the test subject, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the concave section.
    Type: Application
    Filed: April 6, 2018
    Publication date: May 7, 2020
    Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.)
    Inventors: Hiroyuki TAKAMATSU, Toshihide FUKUI, Mariko MATSUDA, Tatsuhiko KABUTOMORI
  • Publication number: 20200072769
    Abstract: A method that measures stress of a test subject including a metal includes: detecting, using a two-dimensional detector, a diffraction ring of diffracted X-rays which is formed by causing X-rays from an irradiation unit to be incident on the test subject and to be diffracted by the test subject; and calculating the stress of the test subject based on detection results during the detection step. Therein, the detection step involves causing X-rays from the irradiation unit to be incident on each of a plurality of sites on the test subject with the irradiation unit angled relative to the test subject in a manner such that the angle of incidence on the test subject is within the range of 5-20°, inclusive, and detecting, using a two-dimensional detector, the diffraction ring formed by the diffraction of the X-rays by the test subject.
    Type: Application
    Filed: April 6, 2018
    Publication date: March 5, 2020
    Applicant: Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd)
    Inventors: Hiroyuki TAKAMATSU, Toshihide FUKUI, Mariko MATSUDA, Tatsuhiko KABUTOMORI
  • Patent number: 10532112
    Abstract: An object of the present invention is to provide a method for producing a non-human primate model of AMD, a method for evaluating the efficacy of a test substance in the prevention or treatment of AMD using the AMD animal model produced according to this method, and a method for screening substances effective in the prevention or treatment of AMD using the aforementioned AMD animal model. The method for preparing the AMD animal model consists of administering sodium iodate into a vitreous body of a non-human primate, and the method for evaluating the efficacy of a test substance in the prevention or treatment of AMD consists of preparing a non-human primate model of AMD according to the aforementioned method for preparing an AMD animal model, and evaluating the efficacy of the test substance in the prevention or treatment of AMD using the resulting AMD animal model.
    Type: Grant
    Filed: December 22, 2017
    Date of Patent: January 14, 2020
    Assignees: Hamamatsu Pharma Research, Inc.
    Inventor: Hiroyuki Takamatsu
  • Publication number: 20180272009
    Abstract: An object of the present invention is to provide a method for producing a non-human primate model of AMD, a method for evaluating the efficacy of a test substance in the prevention or treatment of AMD using the AMD animal model produced according to this method, and a method for screening substances effective in the prevention or treatment of AMD using the aforementioned AMD animal model. The method for preparing the AMD animal model consists of administering sodium iodate into a vitreous body of a non-human primate, and the method for evaluating the efficacy of a test substance in the prevention or treatment of AMD consists of preparing a non-human primate model of AMD according to the aforementioned method for preparing an AMD animal model, and evaluating the efficacy of the test substance in the prevention or treatment of AMD using the resulting AMD animal model.
    Type: Application
    Filed: December 22, 2017
    Publication date: September 27, 2018
    Applicants: Hamamatsu Pharma Research, Inc.
    Inventor: Hiroyuki TAKAMATSU
  • Patent number: 9279762
    Abstract: In a semiconductor carrier lifetime measuring apparatus A1 of the present invention, at least two types of light having mutually different wavelengths are irradiated onto a semiconductor X to be measured, a predetermined measurement wave is irradiated onto the semiconductor X to be measured, a reflected wave of the measurement wave that has been reflected by the semiconductor X to be measured or a transmitted wave of the measurement wave that has transmitted through the semiconductor X to be measured is detected, and the carrier lifetime in the semiconductor X to be measured is obtained based on the detection results so as to minimize the error. Accordingly, the semiconductor carrier lifetime measuring apparatus A1 configured as described above can more accurately measure the carrier lifetime.
    Type: Grant
    Filed: October 1, 2010
    Date of Patent: March 8, 2016
    Assignees: Kobe Steel, Ltd., Kobelco Research Institute, Inc.
    Inventors: Kazushi Hayashi, Hiroyuki Takamatsu, Yoshito Fukumoto, Shingo Sumie
  • Patent number: 9160219
    Abstract: Disclosed is a brushless motor (1A) which is an axial gap type brushless motor (1A) wherein stators (3A, 4A) comprising a coil (41) and a rotor (2) comprising a permanent magnet (23) are arranged with a gap therebetween in the axial direction. The coil (41) is a band-like wire which is spirally wound such that the width direction of the band-like wire generally coincides with the direction of the magnetic flux that is generated by the permanent magnet (23) of the rotor (2). Consequently, the axial gap type brushless motor (1A) having the above-described structure can be further reduced in eddy current loss in comparison to conventional brushless motors.
    Type: Grant
    Filed: December 6, 2010
    Date of Patent: October 13, 2015
    Assignee: Kobe Steel, Ltd.
    Inventors: Hiroyuki Takamatsu, Koji Inoue, Kenichi Inoue, Takashi Hase, Osamu Ozaki, Chikara Ichihara, Masakatsu Maruyama, Yasushi Maeda, Hiroyuki Mitani
  • Patent number: 8952338
    Abstract: The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom.
    Type: Grant
    Filed: September 1, 2011
    Date of Patent: February 10, 2015
    Assignees: Kobe Steel, Ltd., Kobelco Research Institute Inc.
    Inventors: Naokazu Sakoda, Hiroyuki Takamatsu, Masahiro Inui, Futoshi Ojima
  • Patent number: 8836452
    Abstract: A tuner module includes a tuner module substrate having a tuner function part formed thereon, a case body having a shielding function of holding and incorporating at least the tuner module substrate, a circuit board on which the tuner module substrate is mounted, and at least one antenna connector to be fixed to the case body and having a core wire connected to the tuner module substrate incorporated in the case body. A part of the circuit board is contained inside the case body.
    Type: Grant
    Filed: July 13, 2011
    Date of Patent: September 16, 2014
    Assignee: Sony Corporation
    Inventors: Tadashi Imai, Makoto Watanabe, Toshiyuki Sudo, Toshiyuki Nagano, Mitsuru Ikeda, Teruyuki Toyoda, Hideaki Ozawa, Tomonori Nakajima, Goujin Arakawa, Norio Uchida, Hiroyuki Takamatsu
  • Publication number: 20140168519
    Abstract: There is provided a tuner module of the present disclosure includes a tuner module board on which a tuner function unit is formed, a case body that holds at least the tuner module board so as to contain the board, and at least one antenna connector fixed to the case body and whose core wire is connected to the tuner module board contained in the case body.
    Type: Application
    Filed: July 25, 2012
    Publication date: June 19, 2014
    Applicant: Sony Corporation
    Inventors: Tadashi Imai, Hideaki Ozawa, Toshiyuki Nagano, Teruyuki Toyoda, Tomonori Nakajima, Mitsuru Ikeda, Goujin Arakawa, Toshiyuki Sudo, Norio Uchida, Hiroyuki Takamatsu
  • Patent number: 8660318
    Abstract: A vein authentication apparatus registers vein data and vein characteristic amounts, determines comparison order at vein data identification time by sorting records in descending order of degree of similarity on the basis of vein characteristic amounts for comparison and the registered vein characteristic amounts, and makes vein data comparison in accordance with the comparison order. The vein authentication apparatus uses 32 frequencies obtained by performing a Fourier transform, 12 angles obtained by performing a Fourier transform, curvature directions in 36 angle areas, segment directions in 18 angle areas, and a vein amount as the vein characteristic amounts. By doing so, the accuracy of comparison order is improved and a comparison using a record for which a degree of similarity is low can be omitted. As a result, the speed of a comparison process and the maximum number of pieces of living body information which can be registered can be increased.
    Type: Grant
    Filed: April 17, 2012
    Date of Patent: February 25, 2014
    Assignee: Fujitsu Frontech Limited
    Inventors: Kazuhiro Komura, Hiroyuki Takamatsu
  • Publication number: 20130153778
    Abstract: The present invention provides a crystalline quality evaluation apparatus (1) and a crystalline quality evaluation method for thin-film semiconductors, which are designed to evaluate crystalline quality of a sample (2) of a thin-film semiconductor (2a) by emitting excitation light and an electromagnetic wave to irradiate a measurement site of the sample (2), and detecting an intensity of a reflected electromagnetic wave from the sample (2). In the present invention, the thin-film semiconductor (2a) of the sample (2) is formed on an electrically conductive film (2b), and a dielectric (3) transparent to the excitation light is additionally disposed between the sample (2) and a waveguide (13) for emitting the electromagnetic wave therefrom.
    Type: Application
    Filed: September 1, 2011
    Publication date: June 20, 2013
    Applicants: KOBELCO RESEARCH INSTITUTE, INC., KABUSHIKI KAISHA KOBE SEIKO SHO (Kobe Steel, Ltd.)
    Inventors: Naokazu Sakoda, Hiroyuki Takamatsu, Masahiro Inui, Futoshi Ojima
  • Patent number: 8367329
    Abstract: The invention is to easily detect an interaction between nucleic acid and protein with high sensitivity without the need of sample labeling with a fluorescent molecule or sample anchorage onto a metal thin-film. As means for it, the presence or absence of occurrence of the interaction between nucleic acid and protein in a sample (S) is detected in an optical manner. Specifically, the sample (S) is irradiated with excitation rays (Le) and with measuring rays (L2) for measuring a photothermal effect produced in the sample (S) through the irradiation with the excitation rays (Le). A measurement signal for the photothermal effect in the sample (S) by the excitation rays (Le) is produced on the basis of any phase change of the measuring rays (L2). A temporal variation in the measurement signal is used for making a judgment on the presence or absence of any occurrence of interaction between nucleic acid and protein.
    Type: Grant
    Filed: June 14, 2007
    Date of Patent: February 5, 2013
    Assignees: National University Corporation Tokyo University of Agriculture and Technology, Kobe Steel, Ltd.
    Inventors: Kazunori Ikebukuro, Ryo Katayama, Eiji Takahashi, Hiroyuki Takamatsu
  • Publication number: 20130009508
    Abstract: Disclosed is a brushless motor (1A) which is an axial gap type brushless motor (1A) wherein stators (3A, 4A) comprising a coil (41) and a rotor (2) comprising a permanent magnet (23) are arranged with a gap therebetween in the axial direction. The coil (41) is a band-like wire which is spirally wound such that the width direction of the band-like wire generally coincides with the direction of the magnetic flux that is generated by the permanent magnet (23) of the rotor (2). Consequently, the axial gap type brushless motor (1A) having the above-described structure can be further reduced in eddy current loss in comparison to conventional brushless motors.
    Type: Application
    Filed: December 6, 2010
    Publication date: January 10, 2013
    Applicant: KABUSHIKI KAISHA KOBE SEIKO SHO (Kobe Steel, Ltd.)
    Inventors: Hiroyuki Takamatsu, Koji Inoue, Kenichi Inoue, Takashi Hase, Osamu Ozaki, Chikara Ichihara, Masakatsu Maruyama, Yasushi Maeda, Hiroyuki Mitani