Patents by Inventor Hisanori Ishiguro

Hisanori Ishiguro has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11916164
    Abstract: A method for manufacturing a light-emitting element includes providing the light-emitting element that includes a light-emitting layer with an emission wavelength of not more than 306 nm and a p-type layer including AlGaInN including Mg as an acceptor, and removing hydrogen in the p-type layer from the light-emitting element by irradiating the light-emitting element with ultraviolet light at a wavelength of not more than 306 nm from outside and treating the light-emitting element with heat in a state in which a reverse voltage, or a forward voltage lower than a threshold voltage of the light-emitting element, or no voltage is applied to the light-emitting element. The removing of hydrogen in the p-type layer from the light-emitting element is performed in a N2 atmosphere at not less than 650° C. or in a N2+O2 atmosphere at not less than 500° C.
    Type: Grant
    Filed: December 29, 2021
    Date of Patent: February 27, 2024
    Assignees: TOYODA GOSEI CO., LTD., MEIJO UNIVERSITY
    Inventors: Yoshiki Saito, Shinya Boyama, Shinichi Matsui, Hiroshi Miwa, Kengo Nagata, Tetsuya Takeuchi, Hisanori Ishiguro
  • Publication number: 20220231189
    Abstract: A method for manufacturing a light-emitting element includes providing the light-emitting element that includes a light-emitting layer with an emission wavelength of not more than 306 nm and a p-type layer including AlGaInN including Mg as an acceptor, and removing hydrogen in the p-type layer from the light-emitting element by irradiating the light-emitting element with ultraviolet light at a wavelength of not more than 306 nm from outside and treating the light-emitting element with heat in a state in which a reverse voltage, or a forward voltage lower than a threshold voltage of the light-emitting element, or no voltage is applied to the light-emitting element. The removing of hydrogen in the p-type layer from the light-emitting element is performed in a N2 atmosphere at not less than 650° C. or in a N2+O2 atmosphere at not less than 500° C.
    Type: Application
    Filed: December 29, 2021
    Publication date: July 21, 2022
    Inventors: Yoshiki Saito, Shinya Boyama, Shinichi Matsui, Hiroshi Miwa, Kengo Nagata, Tetsuya Takeuchi, Hisanori Ishiguro
  • Patent number: 10840414
    Abstract: An optical semiconductor apparatus includes: a package substrate that includes a recess that opens on a top surface of the package substrate; a light emitting device housed in the recess; a window member provided to cover an opening of the recess; and a sealing structure that seals a space between the package substrate and the window member. The sealing structure includes a first metal layer provided in a shape of a frame on the top surface of the package substrate, a second metal layer provided in a shape of a frame on an inner surface of the window member, and a metal bonding part provided between the first metal layer and the second metal layer. An entirety of one of the first and second metal layers is positioned in a region where the other of the first and second metal layers is provided.
    Type: Grant
    Filed: February 25, 2019
    Date of Patent: November 17, 2020
    Assignee: NIKKISO CO., LTD.
    Inventors: Hiroyasu Ichinokura, Hisanori Ishiguro, Kenta Ura
  • Publication number: 20190189862
    Abstract: An optical semiconductor apparatus includes: a package substrate that includes a recess that opens on a top surface of the package substrate; a light emitting device housed in the recess; a window member provided to cover an opening of the recess; and a sealing structure that seals a space between the package substrate and the window member. The sealing structure includes a first metal layer provided in a shape of a frame on the top surface of the package substrate, a second metal layer provided in a shape of a frame on an inner surface of the window member, and a metal bonding part provided between the first metal layer and the second metal layer. An entirety of one of the first and second metal layers is positioned in a region where the other of the first and second metal layers is provided.
    Type: Application
    Filed: February 25, 2019
    Publication date: June 20, 2019
    Inventors: Hiroyasu ICHINOKURA, Hisanori ISHIGURO, Kenta URA
  • Publication number: 20190081215
    Abstract: A deep ultraviolet light emitting device includes: a substrate having a first principal surface and a second principal surface opposite to the first principal surface; an active layer provided on the first principal surface of the substrate configured to emit a deep ultraviolet light; and a light extraction layer provided on the second principal surface of the substrate and made of a material having a refractive index for the deep ultraviolet light emitted by the active layer higher than that of the substrate and lower than that of the active layer.
    Type: Application
    Filed: November 14, 2018
    Publication date: March 14, 2019
    Inventors: Tetsuhiko INAZU, Cyril PERNOT, Hisanori ISHIGURO
  • Patent number: 7700392
    Abstract: The present invention is to provide a semiconductor laser device manufacturing method for realizing highly reliable semiconductor laser devices. The semiconductor laser device manufacturing method includes: cutting a wafer into bar-shaped wafers by scanning an electron beam on the front side of the wafer on which a semiconductor laser structure has been formed so as to cause cracks which trigger the cutting of the wafer; and depositing front and back coating films on the end faces, which have been newly exposed by the cutting of the wafer, of the cut wafers. In the method the cut wafers are transferred in a non-ambient atmosphere at a time between the cutting of the wafer and the depositing of the end face coating films.
    Type: Grant
    Filed: November 25, 2005
    Date of Patent: April 20, 2010
    Assignee: Panasonic Corporation
    Inventors: Tetsuzo Ueda, Hisanori Ishiguro
  • Patent number: 7359416
    Abstract: An optical semiconductor device includes a semiconductor laser chip, a base for mounting the semiconductor laser chip and a solder layer sandwiched between the top surface of the base and the bottom surface of the semiconductor laser chip. The semiconductor laser chip is warped in upward convex shape.
    Type: Grant
    Filed: February 21, 2007
    Date of Patent: April 15, 2008
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Noriyuki Yoshikawa, Masanori Minamio, Hisanori Ishiguro, Hideyuki Nakanishi, Hiroyuki Ishida, Yoshihiro Tomita, Toshiyuki Fukuda
  • Publication number: 20070217476
    Abstract: An optical semiconductor device includes a semiconductor laser chip, a base for mounting the semiconductor laser chip and a solder layer sandwiched between the top surface of the base and the bottom surface of the semiconductor laser chip. The semiconductor laser chip is warped in upward convex shape.
    Type: Application
    Filed: February 21, 2007
    Publication date: September 20, 2007
    Inventors: Noriyuki Yoshikawa, Masanori Minamio, Hisanori Ishiguro, Hideyuki Nakanishi, Hiroyuki Ishida, Yoshihiro Tomita, Toshiyuki Fukuda
  • Publication number: 20060110894
    Abstract: The present invention is to provide a semiconductor laser device manufacturing method for realizing highly reliable semiconductor laser devices. The semiconductor laser device manufacturing method includes: cutting a wafer into bar-shaped wafers by scanning an electron beam on the front side of the wafer on which a semiconductor laser structure has been formed so as to cause cracks which trigger the cutting of the wafer; and depositing front and back coating films on the end faces, which have been newly exposed by the cutting of the wafer, of the cut wafers. In the method the cut wafers are transferred in a non-ambient atmosphere at a time between the cutting of the wafer and the depositing of the end face coating films.
    Type: Application
    Filed: November 25, 2005
    Publication date: May 25, 2006
    Applicant: Matsushita Electric Industrial Co., Ltd.
    Inventors: Tetsuzo Ueda, Hisanori Ishiguro
  • Patent number: 6292500
    Abstract: A semiconductor laser device of the present invention includes: a semiconductor laser chip including an anode and a cathode; and a field effect transistor. The anode of the semiconductor laser chip is connected to the drain of the field effect transistor. The gate of the field effect transistor is connected to the drain of the field effect transistor. And the cathode of the semiconductor laser chip is connected to the source of the field effect transistor.
    Type: Grant
    Filed: April 15, 1999
    Date of Patent: September 18, 2001
    Assignee: Matsushita Electric Industrial Co., Ltd.
    Inventors: Yasuyuki Kouchi, Hideyuki Nakanishi, Masaaki Yuri, Akio Yoshikawa, Hisanori Ishiguro