Patents by Inventor Hisayasu MORINO

Hisayasu MORINO has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11965729
    Abstract: Provided is a confocal sensor having a wider measuring range. A confocal sensor 1 comprises: a light source 10 that emits light at a plurality of wavelengths; a diffractive lens 130 that causes a chromatic aberration with respect to the light along an optical axis and focuses the light onto an object 200 without another intervening lens; a pinhole 120 through which reflected light passes, the reflected light being a portion of the light that was focused onto and reflected from the object 200 and focused by the diffractive lens 130; and a measuring unit 40 that measures the distance from the diffractive lens 130 to the object 200 on the basis of a wavelength of the reflected light. A distance L2 from the pinhole 120 to the diffractive lens 130 is variable.
    Type: Grant
    Filed: November 21, 2019
    Date of Patent: April 23, 2024
    Assignee: OMRON Corporation
    Inventors: Hisayasu Morino, Jun Takashima
  • Publication number: 20230266118
    Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
    Type: Application
    Filed: May 1, 2023
    Publication date: August 24, 2023
    Inventors: Hisayasu Morino, Kenichi Matoba, Takahiro Suga
  • Publication number: 20230266119
    Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
    Type: Application
    Filed: May 1, 2023
    Publication date: August 24, 2023
    Inventors: Hisayasu Morino, Kenichi Matoba, Takahiro Suga
  • Patent number: 11674794
    Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
    Type: Grant
    Filed: July 26, 2019
    Date of Patent: June 13, 2023
    Assignee: OMRON Corporation
    Inventors: Hisayasu Morino, Kenichi Matoba, Takahiro Suga
  • Publication number: 20230090501
    Abstract: A wavelength-swept light source projects a light beam. An interferometer includes a splitting unit that splits the light beam projected from the wavelength-swept light source into light beams radiated toward a plurality of spots on a measurement target. Each of the interference beam is generated by interference between a measurement beam radiated toward the measurement target and reflected at the measurement beam, and a reference beam passing through an optical path that is at least partially different from an optical path of the measurement beam. A light-receiving unit receives the interference beams from the interferometer. A processor calculates distance to the measurement target by associating a detected peak of the interference beams with one of the spots. The optical path length difference between the measurement target and the reference beam is made different among the light beams split in correspondence with the plurality of spots.
    Type: Application
    Filed: August 25, 2022
    Publication date: March 23, 2023
    Applicant: OMRON Corporation
    Inventors: Yusuke NAGASAKI, Masayuki HAYAKAWA, Kazuya KIMURA, Hisayasu MORINO
  • Patent number: 11231270
    Abstract: The optical measuring device includes a light source that outputs light of a plurality of wavelengths; a sensor head including a conversion lens that converts light incident via a light guide part, which includes a plurality of cores, into parallel light, and an objective lens that irradiates the light in which chromatic aberration is generated to a measurement object; and a spectroscope that acquires reflected light reflected by the measurement object and condensed by the sensor head via the light guide part and measures a spectrum of the reflected light. In the sensor head, a shield that shields light is arranged between the conversion lens and the objective lens to inhibit light emitted from one core among the plurality of cores included in the light guide part from entering cores other than the one core as the reflected light.
    Type: Grant
    Filed: December 17, 2018
    Date of Patent: January 25, 2022
    Assignee: OMRON Corporation
    Inventors: Takahiro Okuda, Mariko Marukawa, Hisayasu Morino
  • Publication number: 20220011092
    Abstract: Provided is a confocal sensor having a wider measuring range. A confocal sensor 1 comprises: a light source 10 that emits light at a plurality of wavelengths; a diffractive lens 130 that causes a chromatic aberration with respect to the light along an optical axis and focuses the light onto an object 200 without another intervening lens; a pinhole 120 through which reflected light passes, the reflected light being a portion of the light that was focused onto and reflected from the object 200 and focused by the diffractive lens 130; and a measuring unit 40 that measures the distance from the diffractive lens 130 to the object 200 on the basis of a wavelength of the reflected light. A distance L2 from the pinhole 120 to the diffractive lens 130 is variable.
    Type: Application
    Filed: November 21, 2019
    Publication date: January 13, 2022
    Applicant: OMRON Corporation
    Inventors: Hisayasu MORINO, Jun TAKASHIMA
  • Publication number: 20210286055
    Abstract: In one or more embodiments of an optical interference measurement apparatus, first return light received by a first measurement head is guided to a detector via a first optical path and a fiber coupler. Second return light received by a second measurement head is guided to the detector via a second optical path and the fiber coupler. Optical path lengths D1 and D2 from the fiber coupler to a leading end of the first measurement head and a leading end of the second measurement head respectively, a maximum optical path length R1max of the measurement range of the first measurement head, optical path lengths S1 and S2 of the first reference light that interferes with the first return light and of the second reference light that interferes with the second return light respectively are set such that the relation D1+R1max?S1<D2?S2 is satisfied.
    Type: Application
    Filed: February 9, 2021
    Publication date: September 16, 2021
    Applicant: OMRON Corporation
    Inventors: Kazuya KIMURA, Masayuki HAYAKAWA, Hisayasu MORINO, Yusuke NAGASAKI
  • Patent number: 10551171
    Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
    Type: Grant
    Filed: January 24, 2017
    Date of Patent: February 4, 2020
    Assignee: OMRON Corporation
    Inventors: Hisayasu Morino, Kenichi Matoba, Takahiro Suga
  • Patent number: 10520296
    Abstract: A confocal measurement device includes a light source that outputs white light, an optical coupler, a sensor head that applies light with a chromatic aberration caused therein to a measurement object, and a spectroscope that acquires reflected light which is reflected by the measurement object and measures a spectrum of the reflected light. The optical coupler is a filter type coupler or a spatial optical system type coupler that brings a first transmission waveform when light is transmitted from a first optical fiber cable to a second optical fiber cable and a second transmission waveform when light is transmitted from the second optical fiber cable to a third optical fiber cable close to each other.
    Type: Grant
    Filed: September 17, 2018
    Date of Patent: December 31, 2019
    Assignee: OMRON Corporation
    Inventors: Hisayasu Morino, Jun Takashima, Takahiro Okuda, Kenichi Matoba, Hiroaki Takimasa
  • Publication number: 20190346258
    Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
    Type: Application
    Filed: July 26, 2019
    Publication date: November 14, 2019
    Inventors: Hisayasu Morino, Kenichi MATOBA, Takahiro SUGA
  • Publication number: 20190277621
    Abstract: The optical measuring device includes a light source that outputs light of a plurality of wavelengths; a sensor head including a conversion lens that converts light incident via a light guide part, which includes a plurality of cores, into parallel light, and an objective lens that irradiates the light in which chromatic aberration is generated to a measurement object; and a spectroscope that acquires reflected light reflected by the measurement object and condensed by the sensor head via the light guide part and measures a spectrum of the reflected light. In the sensor head, a shield that shields light is arranged between the conversion lens and the objective lens to inhibit light emitted from one core among the plurality of cores included in the light guide part from entering cores other than the one core as the reflected light.
    Type: Application
    Filed: December 17, 2018
    Publication date: September 12, 2019
    Applicant: OMRON Corporation
    Inventors: Takahiro OKUDA, Mariko MARUKAWA, Hisayasu MORINO
  • Publication number: 20190101375
    Abstract: A confocal measurement device includes a light source that outputs white light, an optical coupler, a sensor head that applies light with a chromatic aberration caused therein to a measurement object, and a spectroscope that acquires reflected light which is reflected by the measurement object and measures a spectrum of the reflected light. The optical coupler is a filter type coupler or a spatial optical system type coupler that brings a first transmission waveform when light is transmitted from a first optical fiber cable to a second optical fiber cable and a second transmission waveform when light is transmitted from the second optical fiber cable to a third optical fiber cable close to each other.
    Type: Application
    Filed: September 17, 2018
    Publication date: April 4, 2019
    Applicant: OMRON Corporation
    Inventors: Hisayasu MORINO, Jun TAKASHIMA, Takahiro OKUDA, Kenichi MATOBA, Hiroaki TAKIMASA
  • Patent number: 10247602
    Abstract: A confocal measuring device capable of enlarging a measurement range using a compact device configuration is provided. A confocal measuring device (1A) is configured to include: a diffractive lens (11) that causes chromatic aberration in light emitted from a white LED light source (21); a diffractive lens (13b) that increases chromatic aberration of light passing through the diffractive lens (11); and an objective lens (12) that condenses light into a measurement target range such that the condensed light has chromatic aberration along an optical axis.
    Type: Grant
    Filed: December 19, 2017
    Date of Patent: April 2, 2019
    Assignee: OMRON Corporation
    Inventors: Mariko Marukawa, Masayuki Hayakawa, Takahiro Okuda, Hisayasu Morino
  • Publication number: 20180259390
    Abstract: A confocal measuring device capable of enlarging a measurement range using a compact device configuration is provided. A confocal measuring device (1A) is configured to include: a diffractive lens (11) that causes chromatic aberration in light emitted from a white LED light source (21); a diffractive lens (13b) that increases chromatic aberration of light passing through the diffractive lens (11); and an objective lens (12) that condenses light into a measurement target range such that the condensed light has chromatic aberration along an optical axis.
    Type: Application
    Filed: December 19, 2017
    Publication date: September 13, 2018
    Applicant: OMRON Corporation
    Inventors: Mariko MARUKAWA, Masayuki HAYAKAWA, Takahiro OKUDA, Hisayasu MORINO
  • Patent number: 9995624
    Abstract: To improve light use efficiency and thereby achieve even higher sampling rates. An optical measurement device includes: a light source configured to emit illumination light including a plurality of wavelength components; an optical system configured to introduce an axial chromatic aberration into the illumination light from the light source and to receive reflection light reflecting from a measurement object where at least a portion of the measurement object lies along a line extending from the optical axis of the optical system; a spectrometer for separating the reflection light received at the optical system into wavelength components, and a detector including a plurality of light receiving elements arranged one-dimensionally to correspond to the dispersion direction of the spectrometer.
    Type: Grant
    Filed: November 29, 2016
    Date of Patent: June 12, 2018
    Assignee: OMRON Corporation
    Inventors: Hisayasu Morino, Jun Takashima, Kenichi Matoba, Masayuki Hayakawa, Naoki Fujiwara, Mariko Marukawa
  • Publication number: 20170276475
    Abstract: A white light confocal optical measurement device capable of detecting abnormalities in a received light waveform; the optical measurement device includes: a light source; an optical system; a light receiving unit; and a processor configured to compute the distance from the optical system to the measurement object on the basis of a received light intensity of the wavelength components received in the light receiving unit. The processor compares a received light intensity of a wavelength component to a reference value for the wavelength component for a plurality of wavelength components in a waveform representing the light received, and detects an abnormality in the received light waveform when the amount of change in the received light intensity compared to the reference value therefor is greater than or equal to a predetermined threshold for any wavelength component in the plurality of wavelength components.
    Type: Application
    Filed: January 24, 2017
    Publication date: September 28, 2017
    Inventors: Hisayasu MORINO, Kenichi Matoba, Takahiro Suga
  • Publication number: 20170160130
    Abstract: To improve light use efficiency and thereby achieve even higher sampling rates. An optical measurement device includes: a light source configured to emit illumination light including a plurality of wavelength components; an optical system configured to introduce an axial chromatic aberration into the illumination light from the light source and to receive reflection light reflecting from a measurement object where at least a portion of the measurement object lies along a line extending from the optical axis of the optical system; a spectrometer for separating the reflection light received at the optical system into wavelength components, and a detector including a plurality of light receiving elements arranged one-dimensionally to correspond to the dispersion direction of the spectrometer.
    Type: Application
    Filed: November 29, 2016
    Publication date: June 8, 2017
    Applicant: OMRON Corporation
    Inventors: Hisayasu MORINO, Jun TAKASHIMA, Kenichi MATOBA, Masayuki HAYAKAWA, Naoki FUJIWARA, Mariko MARUKAWA