Abstract: Embodiments of the present disclosure provide a test structure of a wafer and a method of manufacturing a test structure of a wafer, and relate to the technical field of semiconductors. The test structure of a wafer includes at least one test unit provided in a scribe line of the wafer, where the test unit includes a first active area and a second active area that are connected to each other; the first active area is provided with a first conductive plug, and the second active area is provided with a second conductive plug; and one of the first active area and the second active area is provided with a contact structure.

Abstract: In one embodiment, a method includes receiving a search query including one or more n-grams, where the n-grams include one or more misspelled n-grams, identifying one or more variant-tokens for each misspelled n-gram, calculating a feature value for each identified variant-token based at least on the identified variant-token, the misspelled n-gram, and one or more variant-tokens corresponding to one or more n-grams preceding the misspelled n-gram, generating one or more unique combinations of the n-grams and variant-tokens, calculating a sequence-score for each unique combination based at least in part on the calculated feature values of the variant-tokens of the unique combination, generating one or more corrected queries, where each corrected query includes a unique combination having a sequence-score greater than a threshold sequence-score, and sending one or more of the corrected queries to a user for display.

Abstract: In one embodiment, a method includes receiving a search query including one or more n-grams, where the n-grams include one or more misspelled n-grams, identifying one or more variant-tokens for each misspelled n-gram, calculating a feature value for each identified variant-token based at least on the identified variant-token, the misspelled n-gram, and one or more variant-tokens corresponding to one or more n-grams preceding the misspelled n-gram, generating one or more unique combinations of the n-grams and variant-tokens, calculating a sequence-score for each unique combination based at least in part on the calculated feature values of the variant-tokens of the unique combination, generating one or more corrected queries, where each corrected query includes a unique combination having a sequence-score greater than a threshold sequence-score, and sending one or more of the corrected queries to a user for display.