Patents by Inventor Howard K. Stern

Howard K. Stern has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7075662
    Abstract: A three-dimensional inspection system and method is used to obtain information about three-dimensional articles with specular surfaces having a shape and positive or negative height by projecting a pattern of light onto the articles at an oblique angle. The system includes a patterned light projector with optical axis disposed at an oblique angle with respect to the plane of the article being inspected, an extended light source, and an image detector disposed above the article to detect the image of the pattern on the article. The light pattern includes lines with a substantially equal thickness and spacing. The spacing of the lines is greater than a spacing or pitch of the specular elements. An image processor, coupled to the image detector, receives the image, locates the lines, and measures the lateral shift of the lines. Height information is determined from the lateral shift and projection angle using triangulation.
    Type: Grant
    Filed: May 16, 2001
    Date of Patent: July 11, 2006
    Assignee: Siemens Energy and Automation, Inc.
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Publication number: 20020018219
    Abstract: A three-dimensional inspection system and method is used to obtain information about three-dimensional articles with specular surfaces having a shape and positive or negative height by projecting a pattern of light onto the articles at an oblique angle. The system includes a patterned light projector with optical axis disposed at an oblique angle with respect to the plane of the article being inspected, an extended light source, and an image detector disposed above the article to detect the image of the pattern on the article. The light pattern includes lines with a substantially equal thickness and spacing. The spacing of the lines is greater than a spacing or pitch of the specular elements. An image processor, coupled to the image detector, receives the image, locates the lines, and measures the lateral shift of the lines. Height information is determined from the lateral shift and projection angle using triangulation.
    Type: Application
    Filed: May 16, 2001
    Publication date: February 14, 2002
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Patent number: 6262803
    Abstract: A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing.
    Type: Grant
    Filed: September 10, 1998
    Date of Patent: July 17, 2001
    Assignee: Acuity Imaging, LLC
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Patent number: 6144453
    Abstract: A three-dimensional inspection system is used to obtain three-dimensional information pertaining to an article having specular surfaces, such as a BGA device, by projecting a pattern of light onto the article at an oblique angle with respect to the article. The system includes patterned light projector having an optical axis disposed at an oblique angle with respect to the plane of the article being inspected and an image detector or camera disposed generally above the article being inspected to detect the image of the pattern projected on the article. The patterned light projector includes an extended light source that directs light along the optical axis and a light patterning member disposed at an angle with respect to the optical axis such that the light pattern is in focus in an image plane parallel to the plane of the article, thereby satisfying the Scheimpflug condition. The light pattern preferably includes lines of light projected onto the article with a substantially equal thickness and spacing.
    Type: Grant
    Filed: October 5, 1999
    Date of Patent: November 7, 2000
    Assignee: Acuity Imaging, LLC
    Inventors: Gregory R. Hallerman, Jonathan E. Ludlow, Howard K. Stern
  • Patent number: 5216259
    Abstract: Apparatus and method for use in determining the location of object surface points wherein a short pulse of optical energy is projected at the object surface and a time dependent gain function is used to modify the reflected optical energy resulting from the pulse so that time delay information indicative range can be developed and processed.
    Type: Grant
    Filed: May 10, 1991
    Date of Patent: June 1, 1993
    Assignee: Robotic Vision System, Inc.
    Inventors: Howard K. Stern, Stanley Elstein
  • Patent number: 5118192
    Abstract: An inspection system for irregular objects such as solder joints wherein the system utilizes first and second sensors adapted to be pivotable about a common pivot axis and such that the projection axes of the sensors and the pivot axes are able to intersect at a common.
    Type: Grant
    Filed: July 11, 1990
    Date of Patent: June 2, 1992
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Sullivan Chen, William E. Yonescu, Howard K. Stern
  • Patent number: 5028799
    Abstract: A practice for developing data for use in the three-dimensional location of the points on an object surface wherein first and second sensor means are used to cause first and second electromagnetic radiation to be directed at the object surface at first and second directions which are in a common plane.
    Type: Grant
    Filed: November 30, 1989
    Date of Patent: July 2, 1991
    Assignee: Robotic Vision System, Inc.
    Inventors: Sullivan Chen, Howard K. Stern, William E. Yonescu
  • Patent number: 4991968
    Abstract: A system for object surface determination in which the projector/detector sensor of the system is controlled by a control detector which is responsive to a plurality of different parts of a portion of the reflected radiation being sensed by the projector/detector sensor.
    Type: Grant
    Filed: July 20, 1988
    Date of Patent: February 12, 1991
    Assignee: Robotic Vision Systems, Inc.
    Inventors: William E. Yonescu, Howard K. Stern
  • Patent number: 4967370
    Abstract: A method for measuring the position and orientation changes of a 3-D sensor relative to a robot mount and for measuring the positioning and orienting changes of the robot mount. All measurements reveal changes relative to a baseline measurement. A novel reference provides a low-cost measurement aid. A reference object is placed within the work volume of the robot carrying the sensor which is capable of making three-dimensional measurements. The reference object has a shape that enables unambiguous determination of its location and orientation. The reference object is measured from predetermined orientations, and the measurements are recorded in a memory. These measurements form a baseline measurement set. The measurement step is repeated at a later time, and another measurement set is produced. The baseline measurement set and the other measurement set are processed to determine robot positioning errors and sensor location errors.
    Type: Grant
    Filed: October 21, 1988
    Date of Patent: October 30, 1990
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Howard K. Stern, Samson L. Schmuter
  • Patent number: 4925308
    Abstract: A method and apparatus is provided for calibrating distance measuring instruments, in particular, optical three dimensional measurement sensors. The method is not restricted to aligning the motion of the calibrating surface to be parallel to the sensor centerline. Accordingly more than one sensor can be present during the calibration procedure. This leads to the practicality of aligning multiple sensor systems using a common translation stage for all sensors or using translation stages that are a part of the system. The joint calibration of sensors embedded in a system guarantees proper registration without additional steps. A method for calibrating optical sensors to accuracies approaching the wavelength of light is given.
    Type: Grant
    Filed: August 9, 1988
    Date of Patent: May 15, 1990
    Assignee: Robotic Vision System, Inc.
    Inventors: Howard K. Stern, William Yonescu, Daniel A. Briceno
  • Patent number: 4895434
    Abstract: A 3-D measurement system utilizing a holographic scanner is provided with beam direction compensation means for compensating for changes in angular deflection of the scanner and further means is provided for synchronizing the scanner diffraction segments with the camera imaging mechanism of the 3-D system as well as for providing multiple offsets of the projected beam.
    Type: Grant
    Filed: March 24, 1988
    Date of Patent: January 23, 1990
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Howard K. Stern, Joel Hecker, Peter Calabrese, Richard Schmidt
  • Patent number: 4775235
    Abstract: An optical spot scanning system for use in three dimensional measurement and inspection of an object surface wherein a deflector means is placed in the path of the projection axis of the spot projector to deflect the portion of same between the deflector and the object surface, thereby moving the spot to various positions on the object surface, and wherein the deflector means is also positioned in the path of the optical axis of the system sensing means to deflect the portion of same between the sensing means and the object surface by the same degree as the portion of the projection axis is deflected, thereby ensuring the axes portions which are aligned to be coplanar remain coplanar, and that the image of the spot on the object surface will be properly conveyed to the linear sensor array in the sensing means.
    Type: Grant
    Filed: December 29, 1986
    Date of Patent: October 4, 1988
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Joel Hecker, Howard K. Stern
  • Patent number: 4758093
    Abstract: A 3-D measurement system utilizing a holographic scanner is provided with beam direction compensation means for compensating for changes in angular deflection of the scanner and further means is provided for synchronizing the scanner diffraction segments with the camera imaging mechanism of the 3-D system as well as for providing multiple offsets of the projected beam.
    Type: Grant
    Filed: July 11, 1986
    Date of Patent: July 19, 1988
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Howard K. Stern, Joel Hecker
  • Patent number: 4511252
    Abstract: A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied.
    Type: Grant
    Filed: June 1, 1979
    Date of Patent: April 16, 1985
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Paul L. Di Matteo, Joseph A. Ross, Howard K. Stern
  • Patent number: 4508452
    Abstract: The surface to be sensed or scanned is placed in the path of a projector which is moved along an axis of the surface. The path of motion of the projector is subdivided into predetermined sections which are illuminated by the projector in accordance with a predetermined sequential pattern. This procedure of moving the projector is repeated a predetermined number of times, with a separate illuminating pattern prevailing each time that the projector is moved relative to the surface and traverses the entire surface to be scanned. The combinations of the patterns obtained from the repeated scannings of the projector define closely-spaced sections of the surface. The patterns are coded so that each section is uniquely defined in coded form. A camera having the entire surface within its field of view photographs the surface each time that the projector is moved along the axis of the surface.
    Type: Grant
    Filed: June 1, 1979
    Date of Patent: April 2, 1985
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Paul L. DiMatteo, Joseph A. Ross, Howard K. Stern
  • Patent number: 4357108
    Abstract: A method for reproducing an object surface wherein a time succession of spatially encoded different radiant energy patterns are projected at the object surface and records are made of the object surface during such projections from two or more spatially separated locations. The sets of records recorded at the separate spatial locations are then utilized to determine the spatial points on the object surface.
    Type: Grant
    Filed: June 6, 1980
    Date of Patent: November 2, 1982
    Assignee: Robotic Vision Systems, Inc.
    Inventors: Howard K. Stern, Joseph A. Ross, Paul Di Matteo
  • Patent number: 4269513
    Abstract: A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied. To sense sections of the surface independent of the reflectance characteristics of the surface, the projectors direct two separate illuminating signals at the object surface.
    Type: Grant
    Filed: January 18, 1979
    Date of Patent: May 26, 1981
    Assignee: Solid Photography Inc.
    Inventors: Paul L. DiMatteo, Joseph A. Ross, Howard K. Stern
  • Patent number: 4259017
    Abstract: In a method for defining the spatial location of points comprising an object surface, radiant energy is projected onto the object in successive steps with the energy projected in each step having a unique change in intensity with distance along an axis extending transversely of the projection field. The spatial locations of surface points are derived by comparison of reflected intensity information derived from records of the object so irradiated and predetermined patterns derived in accordance with the intensity changes with transverse distance in the respective energy projections.
    Type: Grant
    Filed: October 3, 1977
    Date of Patent: March 31, 1981
    Assignee: Dynell Electronics Corporation
    Inventors: Joseph A. Ross, Howard K. Stern
  • Patent number: 4249827
    Abstract: An arrangement in which different surfaces of an object have applied to them transparent layers of different colors. Each layer will transmit one or more colors, while inhibiting the transmission of one or more other colors. By applying different color layers or paints, so that the combination of layers have different transmission characteristics, different surfaces of an object may be uniquely identified. To identify a predetermined surface, the colors applied thereon are noted, and the surface is illuminated. A filtering arrangement used in conjunction with either the illuminating source or a photograph camera, causes unique exposure of the film, for a predetermined combination of color filter and color paints applied in sequence on the surface being examined.
    Type: Grant
    Filed: April 17, 1978
    Date of Patent: February 10, 1981
    Assignee: Solid Photography Inc.
    Inventors: Paul DiMatteo, Howard K. Stern
  • Patent number: 4202612
    Abstract: A plurality of projectors are positioned in spaced relationship about an object with a surface to be geometrically analyzed. The projectors have cooperating masks which project onto the object illuminated patterns that subdivide the object into predetermined sections. Each mask has a predetermined pattern of sections, and is applied in sequence. The masks are cooperatively advanced in the projectors, with a separate illuminating pattern prevailing on the object each time that the masks are advanced. The combinations of the patterns on the masks define closely-spaced sections subdividing the object. The patterns are coded so that each section is uniquely defined in coded form. Cameras having the entire object within their field of view, photograph the object each time a separate mask is applied. The patterns or sections are parallel planes projected through a mask onto the object.
    Type: Grant
    Filed: June 6, 1978
    Date of Patent: May 13, 1980
    Assignee: Solid Photography Inc.
    Inventors: Paul L. Di Matteo, Joseph A. Ross, Howard K. Stern, Lawrence Waszak