Patents by Inventor Hsin-Po Wang
Hsin-Po Wang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10990743Abstract: A computer implemented method for routing a multitude of conductors through a first routing area on a planar surface is presented. The method includes receiving data representing the first routing area bounded by two opposite longitudinal sides each having a different number of a multitude of first vertices. The first routing area includes one or more blockages. The method further includes determining one or more locations on at least one of the two opposite longitudinal sides for adding one or more second vertices, and decomposing the first routing area into a multitude of second routing areas each not including any of the one or more blockages. The method further includes performing a gateway model routing (GMR) of the multitude of conductors in each of the multitude of second routing areas using the multitude of first vertices and the added one or more second vertices.Type: GrantFiled: May 18, 2017Date of Patent: April 27, 2021Assignee: Synopsys, Inc.Inventors: Song Yuan, Chao-Min Wang, Hsin-Po Wang
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Patent number: 9696377Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: GrantFiled: July 29, 2015Date of Patent: July 4, 2017Assignee: SYNTEST TECHNOLOGIES, INC.Inventors: Laung-Terng Wang, Hsin-Po Wang, Xiaoqing Wen, Meng-Chyi Lin, Shyh-Horng Lin, Ta-Chia Yeh, Sen-Wei Tsai, Khader S. Abdel-Hafez
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Publication number: 20150338461Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: ApplicationFiled: July 29, 2015Publication date: November 26, 2015Applicant: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Hsin-Po Wang
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Patent number: 9121902Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: GrantFiled: July 30, 2014Date of Patent: September 1, 2015Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Hsin-Po Wang
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Patent number: 9110139Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: GrantFiled: January 31, 2014Date of Patent: August 18, 2015Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Hsin-Po Wang
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Patent number: 9057763Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.Type: GrantFiled: November 12, 2013Date of Patent: June 16, 2015Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao, Xiaqing Wen
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Patent number: 9026875Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.Type: GrantFiled: May 15, 2013Date of Patent: May 5, 2015Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao, Xiaqing Wen
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Patent number: 8990756Abstract: A computer-implemented method for routing at least one conductor includes generating the at least one conductor within a bounded region on a planar surface in accordance with a template, and placing at least one slit in the conductor when the conductor overlaps a specified region of the bounded region in accordance with a specified pattern.Type: GrantFiled: November 21, 2013Date of Patent: March 24, 2015Assignee: Synopsys Taiwan Co., Ltd.Inventors: Hsin-Po Wang, Song Yuan, Hung-Shih Wang
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Publication number: 20140344636Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: ApplicationFiled: July 30, 2014Publication date: November 20, 2014Applicant: SYNTEST TECHNOLOGIES, INC.Inventors: Laung-Terng Wang, Hsin-Po Wang
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Patent number: 8769359Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.Type: GrantFiled: November 12, 2013Date of Patent: July 1, 2014Assignee: Syntest Technologies, Inc.Inventors: Luang-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao, Xiaqing Wen
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Publication number: 20140149816Abstract: A broadcaster, system, and method for reducing test data volume and test application time in an ATE (automatic test equipment) in a scan-based integrated circuit. The scan-based integrated circuit contains multiple scan chains, each scan chain comprising multiple scan cells coupled in series. The broadcaster is a combinational logic network coupled to an optional virtual scan controller and an optional scan connector. The virtual scan controller controls the operation of the broadcaster. The system transmits virtual scan patterns stored in the ATE and generates broadcast scan patterns through the broadcaster for testing manufacturing faults in the scan-based integrated circuit. The number of scan chains that can be supported by the ATE is significantly increased. Methods are further proposed to reorder scan cells in selected scan chains, to generate the broadcast scan patterns and virtual scan patterns, and to synthesize the broadcaster and a compactor in the scan-based integrated circuit.Type: ApplicationFiled: January 31, 2014Publication date: May 29, 2014Applicant: SYNTEST TECHNOLOGIES, INC.Inventors: Laung-Terng Wang, Hsin-Po Wang
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Publication number: 20140143747Abstract: A computer-implemented method for routing at least one conductor includes generating the at least one conductor within a bounded region on a planar surface in accordance with a template, and placing at least one slit in the conductor when the conductor overlaps a specified region of the bounded region in accordance with a specified pattern.Type: ApplicationFiled: November 21, 2013Publication date: May 22, 2014Applicant: Synopsys Taiwan Co., LTD.Inventors: Hsin-Po Wang, Song Yuan, Hung-Shih Wang
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Publication number: 20140082446Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.Type: ApplicationFiled: November 12, 2013Publication date: March 20, 2014Applicant: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao, Xiaqing Wen
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Publication number: 20140075256Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.Type: ApplicationFiled: November 12, 2013Publication date: March 13, 2014Applicant: Syntest Technologies, Inc.Inventors: Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao, Xiaqing Wen
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Publication number: 20130314318Abstract: A method and apparatus of improving cursor operation of handheld pointer device in a display is provided, applicable to a handheld pointer device and a display. The display can display a cursor indicating the location of a handheld pointer device in a display. The method includes the steps of: the handheld pointer device transmitting a control signal to the display to enter a slow cursor movement mode; the display in the slow movement mode receiving a control signals transmitted by the handheld pointer device; the display showing a slow moving cursor accordingly when the control signal being a move cursor command; the display exiting the slow cursor mode and entering selected object when the control signal being a select object command; and the display exiting the slow cursor movement mode when the control signal being an exit mode command.Type: ApplicationFiled: May 26, 2012Publication date: November 28, 2013Inventors: Ching-Hung Tseng, Hsin-Po Wang
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Publication number: 20130268818Abstract: A method for providing ordered capture clocks to detect or locate faults within N clock domains and faults crossing any two clock domains in an integrated circuit or circuit assembly in scan-test or self-test mode, where N>1, each clock domain having one capture clock and a plurality of scan cells, each capture clock comprising a plurality of capture clock pulses; said method comprising: (a) generating and shifting-in N test stimuli to all said scan cells within said N clock domains in said integrated circuit or circuit assembly during a shift-in operation; (b) applying an ordered sequence of capture clocks to all said scan cells within said N clock domains, the ordered sequence of capture clocks comprising at least a plurality of capture clock pulses from two or more selected capture clocks placed in a sequential order such that all clock domains are never triggered simultaneously during a capture operation; and (c) analyzing output responses of all said scan cells to locate any faults therein.Type: ApplicationFiled: May 15, 2013Publication date: October 10, 2013Inventors: Laung-Terng Wang, Po-Ching Hsu, Shih-Chia Kao, Meng-Chyi Lin, Hsin-Po Wang, Hao-Jan Chao, Xiaqing Wen
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Patent number: 8543950Abstract: A method and system to automate scan synthesis at register-transfer level (RTL). The method and system will produce scan HDL code modeled at RTL for an integrated circuit modeled at RTL. The method and system comprise computer-implemented steps of performing RTL testability analysis, clock-domain minimization, scan selection, test point selection, scan repair and test point insertion, scan replacement and scan stitching, scan extraction, interactive scan debug, interactive scan repair, and flush/random test bench generation. In addition, the present invention further comprises a method and system for hierarchical scan synthesis by performing scan synthesis module-by-module and then stitching these scanned modules together at top-level. The present invention further comprises integrating and verifying the scan HDL code with other design-for-test (DFT) HDL code, including boundary-scan and logic BIST (built-in self-test).Type: GrantFiled: June 7, 2012Date of Patent: September 24, 2013Assignee: Syntest Technologies, Inc.Inventors: Laung-Terng (L.-T.) Wang, Augusli Kifli, Fei-Sheng Hsu, Shih-Chia Kao, Xiaoqing Wen, Shyh-Horng Lin, Hsin-Po Wang
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Publication number: 20120246604Abstract: A method and system to automate scan synthesis at register-transfer level (RTL). The method and system will produce scan HDL code modeled at RTL for an integrated circuit modeled at RTL. The method and system comprise computer-implemented steps of performing RTL testability analysis, clock-domain minimization, scan selection, test point selection, scan repair and test point insertion, scan replacement and scan stitching, scan extraction, interactive scan debug, interactive scan repair, and flush/random test bench generation. In addition, the present invention further comprises a method and system for hierarchical scan synthesis by performing scan synthesis module-by-module and then stitching these scanned modules together at top-level. The present invention further comprises integrating and verifying the scan HDL code with other design-for-test (DFT) HDL code, including boundary-scan and logic BIST (built-in self-test).Type: ApplicationFiled: June 7, 2012Publication date: September 27, 2012Applicant: Syntest Technologies, Inc.Inventors: Laung-Terng (L. -T.) WANG, Augusli Kifli, Fei-Sheng Hsu, Shih-Chia Kao, Xiaoqing Wen, Shyh-Horag Lin, Hsin-Po Wang
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Publication number: 20120212513Abstract: A method of improving operation of handheld pointer device in a display screen is provided, applicable to a handheld pointer device and a display. The display can display a cursor indicating the location of a handheld pointer device in a display screen. The method includes the steps of: the handheld pointer device issuing a control signal to the display to enter a predefined mode; the display receiving the control signal and activating the predefined mode, the predefined mode including selecting a rectangular area inside the operation screen and the rectangular area being a partial area of the operation screen; the display in the predefined mode receiving and executing each of the control signals issued by the handheld pointer device; and determining whether to exit the predefined mode based on the execution result of previous step.Type: ApplicationFiled: August 15, 2011Publication date: August 23, 2012Inventors: Ching-Hung Tseng, Hsin-Po Wang
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Patent number: 8086982Abstract: Systems and methods for synthesizing a gated clock tree with reduced clock skew are provided. A gated clock tree circuit with reduced clock skew may include a clock source and edge-triggered state elements. A gated clock tree disposed between the clock source and state elements may include a level in which each logic gate has a common logic type. Logic gates in the gated clock tree may also be configured as logic-gate buffers. The logic gates may also be configured as NAND-gated equivalents. The clock signal distributed through the gated clock tree may drive both positive-edge-triggered and negative-edge-triggered state elements.Type: GrantFiled: March 4, 2009Date of Patent: December 27, 2011Assignee: Springsoft USA, Inc.Inventors: Chia-Ming Chang, Shih-Hsu Huang, Yuan-Kai Ho, Jia-Zong Lin, Hsin-Po Wang, Yu-Sheng Lu