Abstract: A device for measuring the emission angle of a particle beam. The device includes a shell, a data acquisition board, a data collector, a data processor and a data synchronization display. The shell is hollow tubular. The data acquisition board is fixed to the front end of the shell. The data collector and the data processor are fixed together and fixed to the back end of the shell. The data collected by the data acquisition board is transmitted to the data collector through the data line collector, and the data processor transmits the processed data to the data synchronization display. The ion accelerator to be measured is located in front of the data acquisition board, and the particles emitted by the ion accelerator bombard the front of the data acquisition board. The data acquisition board comprises an insulating ring, an array insulating board and a pressure sensor.

Abstract: A device for measuring the emission angle of a particle beam. The device includes a shell, a data acquisition board, a data collector, a data processor and a data synchronization display. The shell is hollow tubular. The data acquisition board is fixed to the front end of the shell. The data collector and the data processor are fixed together and fixed to the back end of the shell. The data collected by the data acquisition board is transmitted to the data collector through the data line collector, and the data processor transmits the processed data to the data synchronization display. The ion accelerator to be measured is located in front of the data acquisition board, and the particles emitted by the ion accelerator bombard the front of the data acquisition board. The data acquisition board comprises an insulating ring, an array insulating board and a pressure sensor.

Abstract: A measurement apparatus for micro- and nano-scale materials and a measurement method thereof are provided. The measurement apparatus for the micro- and nano-scale material includes a transmission electron microscope to generate a magnetic field, and a conductive flat punch and a sample which are arranged in the magnetic field. The sample includes the micro- and nano-scale materials. When the current passes through the sample and the conductive flat punch, the conductive flat punch deflects laterally relative to the sample with controllable displacement driven by the electromagnetic force. The required lateral displacement of the present invention is controllable, so that the utilization rate of equipment is greatly increased, and the cost is reduced. In addition, the whole test is performed in the transmission electron microscope, so that a measurement process can be observed in real time.

Abstract: A measurement apparatus for micro- and nano-scale materials and a measurement method thereof are provided. The measurement apparatus for the micro- and nano-scale material includes a transmission electron microscope to generate a magnetic field, and a conductive flat punch and a sample which are arranged in the magnetic field. The sample includes the micro- and nano-scale materials. When the current passes through the sample and the conductive flat punch, the conductive flat punch deflects laterally relative to the sample with controllable displacement driven by the electromagnetic force. The required lateral displacement of the present invention is controllable, so that the utilization rate of equipment is greatly increased, and the cost is reduced. In addition, the whole test is performed in the transmission electron microscope, so that a measurement process can be observed in real time.