Abstract: Disclosed is a feed forward sigma-delta analog to digital conversion (ADC) modulator. The disclosed structure combines feedback circuit, adder circuit and quantization circuit, and has advantages of high stability, without active circuit, and using successive approximation register (SAR) control circuit, thus realizes the function of multi-bit quantization by using only one comparator.

Abstract: A glucose test device and its carrying unit are provided. The glucose test device includes a housing, the carrying unit, a first push rod, and a second push rod. The carrying unit is detachably assembled in the housing. The carrying unit includes a first cartridge, lancets, a second cartridge, and strips. The first cartridge has first perforated grooves, and the lancets are slidably disposed in the first perforated grooves respectively. The second cartridge is adjacent to the first cartridge, and the second cartridge has second perforated grooves. The strips are slidably disposed in the second perforated grooves respectively. The first push rod as corresponding to the first cartridge is movably disposed in the housing. The second push rod as corresponding to the second cartridge is movably disposed in the housing, wherein the first push rod is parallel to the second push rod.

Abstract: A test device and a rotation module thereof are provided. The rotation module includes a rotation body and a sleeve. The rotation body includes a shaft, a first tube element, and a second tube element. The shaft is pivoted in the housing, and has an annular protrusion. The first tube element and the second tube element are sleeved on the shaft respectively, and the second tube element is located between the first tube element and the annular protrusion. The sleeve is slidably disposed on the rotation body. When the sleeve moves between a first position and a second position back and forth, the second tube element is driven to rotate back and forth relative to the first tube element. The annular protrusion is respectively driven by second tube element and the sleeve drive the annular protrusion so that the shaft rotates relative to the first tube element.

Abstract: A positioning device and a positioning method thereof are provided. The positioning device can cooperate with a first satellite group and a second satellite group, and it comprises a storage, a receiver and a processor. The receiver is configured to receive a first satellite group signal from the first satellite group and a second satellite group signal from the second satellite group. The processor is electrically connected to the storage and the receiver, and configured to calculate a positioning offset value according to one of the first satellite group signal and the second satellite group signal. In addition, the processor is configured to calculate a positioning result according to the second satellite group signal and the positioning offset, and store the positioning result in the storage.

Abstract: A test device and a rotation module thereof are provided. The rotation module includes a rotation body and a sleeve. The rotation body includes a shaft, a first tube element, and a second tube element. The shaft is pivoted in the housing, and has an annular protrusion. The first tube element and the second tube element are sleeved on the shaft respectively, and the second tube element is located between the first tube element and the annular protrusion. The sleeve is slidably disposed on the rotation body. When the sleeve moves between a first position and a second position back and forth, the second tube element is driven to rotate back and forth relative to the first tube element. The annular protrusion is respectively driven by second tube element and the sleeve drive the annular protrusion so that the shaft rotates relative to the first tube element.

Abstract: A test device and a rotation module thereof are provided. The rotation module includes a rotation body and a driving element. The rotation body includes a shaft, a position limiting element, a reciprocation element, and a rotation element. The shaft is pivoted in a housing. The position limiting element and the reciprocation element are telescoped on the shaft, respectively. The rotation element engages with the shaft and is located between the position limiting element and the reciprocation element. The driving element is slideably disposed in the housing and coupled to a groove of the reciprocation element. When the driving element moves back and forth, the driving element drives the reciprocation element to rotate back and forth relative to the position limiting element through the groove. The rotation element is pushed by the reciprocation element to rotate along a rotation direction relative to the position limiting element.

Abstract: A glucose test device and its carrying unit are provided. The glucose test device includes a housing, the carrying unit, a first push rod, and a second push rod. The carrying unit is detachably assembled in the housing. The carrying unit includes a first cartridge, lancets, a second cartridge, and strips. The first cartridge has first perforated grooves, and the lancets are slidably disposed in the first perforated grooves respectively. The second cartridge is adjacent to the first cartridge, and the second cartridge has second perforated grooves. The strips are slidably disposed in the second perforated grooves respectively. The first push rod as corresponding to the first cartridge is movably disposed in the housing. The second push rod as corresponding to the second cartridge is movably disposed in the housing, wherein the first push rod is parallel to the second push rod.

Abstract: A cell voltage monitoring and self-calibrating device for a plurality of battery cells connected in series is disclosed. The device includes a first voltage measurement unit, a second voltage measurement unit, a first compensation unit, a second compensation unit and a calculating unit. It can measure voltages of each cell in a battery pack which provides power to electric equipment and calibrates itself during measurement.

Abstract: A bin allocation method of point light sources for constructing light source sets is provided. In this method, a matching matrix corresponding to each light source set product is provided for showing feasible combinations of bin codes of the point light sources which can be used for constructing the light source sets. Then, for reducing computation loading, the original matching matrix is reduced to a simplified matching matrix according to effective inventories of point light sources. Thereafter, the simplified matching matrix of each light source set product is applied to search for low exchangeable bin codes of the point tight sources among the light source set products. Then, the point light sources with the low exchangeable bin codes are precedently used for constructing the light source set products.

Abstract: A successive approximation analog-to-digital converter includes: a comparator for comparing first and second comparison voltages from a conversion module and respectively identical to first and second input voltages, which are transmitted to the conversion module via a switch module in an ON state; and a control module for controlling the switch module and the conversion module and generating a digital output that corresponds to a difference between the first and second input voltages based on first and second comparison signals from the comparator and a clock signal. The switch module includes two switch units each having a series connection of first and second switches, and a third switch coupled to a common node between the first and second switches.

Abstract: A successive approximation analog-to-digital converter includes: a comparator for comparing first and second comparison voltages from a conversion module and respectively identical to first and second input voltages, which are transmitted to the conversion module via a switch module in an ON state; and a control module for controlling the switch module and the conversion module and generating a digital output that corresponds to a difference between the first and second input voltages based on first and second comparison signals from the comparator and a clock signal. The switch module includes two switch units each having a series connection of first and second switches, and a third switch coupled to a common node between the first and second switches.

Abstract: A semiconductor structure includes a semiconductor substrate, and an NMOS device at a surface of the semiconductor substrate, wherein the NMOS device comprises a Schottky source/drain extension region. The semiconductor structure further includes a PMOS device at the surface of the semiconductor substrate, wherein the PMOS device comprises a source/drain extension region comprising only non-metal materials. Schottky source/drain extension regions may be formed for both PMOS and NMOS devices, wherein the Schottky barrier height of the PMOS device is reduced by forming the PMOS device over a semiconductor layer having a low valence band.

Abstract: A log-in method for a product and an application program thereof applies to a mobile device in order to execute the application program, the application program connects with a community website and executes a check-in procedure on the community website. When the check-in procedure is being executed, the application program obtains the product information and the sales information both related to the product and automatically fills out the information in an executing page having a check-in function. Hence, a sales end server defines check-in information, including a check-in landmark, check-in contents, a check-in time, a check-in name, etc., as the log-in information of the product, so as to execute the log-in activity of the product.

Abstract: A cell voltage monitoring and self-calibrating device for a plurality of battery cells connected in series is disclosed. The device includes a first voltage measurement unit, a second voltage measurement unit, a first compensation unit, a second compensation unit and a calculating unit. It can measure voltages of each cell in a battery pack which provides power to electric equipment and calibrates itself during measurement.

Abstract: A semiconductor structure includes a semiconductor substrate; a gate dielectric over the semiconductor substrate; a gate electrode over the gate dielectric; a deep source/drain region adjacent the gate electrode; a silicide region over the deep source/drain region; and an elevated metallized source/drain region between the silicide region and the gate electrode. The elevated metallized source/drain region adjoins the silicide region.

Abstract: In a manufacturing method of a flash memory structure with a stress area, a better stress effect can be achieved by controlling the manufacturing process of a tunneling oxide layer formed in a gate structure and contacted with a silicon substrate, so that an L-shaped spacer (or a first stress area) and a contact etch stop layer (or a second stress area) of each L-shaped spacer are formed between two gate structures and aligned towards each other to enhance the carrier mobility of the gate structure, so as to achieve the effects of improving a read current, obtaining the required read current by using a lower read voltage, reducing the possibility of having a stress-induced leakage current, and enhancing the data preservation of the flash memory.

Abstract: In a manufacturing method of a flash memory structure with a stress area, a better stress effect can be achieved by controlling the manufacturing process of a tunneling oxide layer formed in a gate structure and contacted with a silicon substrate, so that an L-shaped spacer (or a first stress area) and a contact etch stop layer (or a second stress area) of each L-shaped spacer are formed between two gate structures and aligned towards each other to enhance the carrier mobility of the gate structure, so as to achieve the effects of improving a read current, obtaining the required read current by using a lower read voltage, reducing the possibility of having a stress-induced leakage current, and enhancing the data preservation of the flash memory.

Abstract: A method for forming a semiconductor device and a device made using the method are provided. In one example, the method includes forming a hard mask layer on a semiconductor substrate and patterning the hard mask layer to form multiple openings. The substrate is etched through the openings to form forming a plurality of trenches separating multiple semiconductor mesas. The trenches are partially filled with a dielectric material. The hard mask layer is removed and multiple-gate features are formed, with each multiple-gate feature being in contact with a top surface and sidewalls of at least one of the semiconductor mesas.

Abstract: A method for forming a semiconductor device and a device made using the method are provided. In one example, the method includes forming a hard mask layer on a semiconductor substrate and patterning the hard mask layer to form multiple openings. The substrate is etched through the openings to form forming a plurality of trenches separating multiple semiconductor mesas. The trenches are partially filled with a dielectric material. The hard mask layer is removed and multiple-gate features are formed, with each multiple-gate feature being in contact with a top surface and sidewalls of at least one of the semiconductor mesas.

Abstract: A method for forming a semiconductor device and a device made using the method are provided. In one example, the method includes forming a hard mask layer on a semiconductor substrate and patterning the hard mask layer to form multiple openings. The substrate is etched through the openings to form forming a plurality of trenches separating multiple semiconductor mesas. The trenches are partially filled with a dielectric material. The hard mask layer is removed and multiple-gate features are formed, with each multiple-gate feature being in contact with a top surface and sidewalls of at least one of the semiconductor mesas.