Patents by Inventor Ichiro Maki
Ichiro Maki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 8369002Abstract: First and second laser beams are incident on a difference frequency mixing unit, and the two laser beams overlap in the difference frequency mixing unit, thereby generating a terahertz wave whose frequency is a frequency difference between the two laser beams. Each laser beam has a spatial spread in a frequency gradient direction, and a spatial frequency distribution of each laser beam is a distribution in which a magnitude of a frequency gradually increases in the frequency gradient direction. A frequency difference between the two laser beams is equal in each position in an overlapping region of the two laser beams. A terahertz wave of a single frequency is generated from this overlapping region. By spatially shifting the first laser beam and the second laser beam with respect to each other in the frequency gradient direction, the frequency difference in the overlapping region is changed, which changes the single frequency.Type: GrantFiled: April 21, 2009Date of Patent: February 5, 2013Assignee: RikenInventors: Ken-ichiro Maki, Chiko Otani
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Patent number: 8121157Abstract: To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser device 12 that generates a first laser beam 1 and a second laser beam 2 having different wavelengths; a laser optical system 14 that focuses the first laser beam 1 and the second laser beam 2 on a same common focal point 14b; and a terahertz generator 16 that is located at the common focal point and generates a terahertz beam 4 by difference frequency mixing. The laser optical system 14 is configured to be capable of changing a relative incidence ?i between the first laser beam and the second laser beam to the terahertz generator.Type: GrantFiled: April 21, 2009Date of Patent: February 21, 2012Assignee: RikenInventors: Ken-ichiro Maki, Takayuki Shibuya, Chiko Otani, Kodo Kawase
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Publication number: 20110038032Abstract: A first laser beam 1a and a second laser beam 1b are incident on a difference frequency mixing unit, and the two laser beams are overlapped in the difference frequency mixing unit, thereby generating a terahertz wave whose frequency is a frequency difference between the two laser beams. Each laser beam has a spatial spread in a frequency gradient direction, and a spatial frequency distribution of each laser beam is a distribution in which a magnitude of a frequency gradually increases in the frequency gradient direction. Accordingly, a frequency difference between the two laser beams is equal in each position in an overlapping region of the two laser beams. A terahertz wave of a single frequency is generated from this overlapping region. By spatially shifting the first laser beam and the second laser beam with respect to each other in the frequency gradient direction, the frequency difference in the overlapping region is changed, so that the single frequency is changed.Type: ApplicationFiled: April 21, 2009Publication date: February 17, 2011Applicant: RIKENInventors: Ken-ichiro Maki, Chiko Otani
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Publication number: 20110037001Abstract: To provide a terahertz beam scanning apparatus and method that can scan a terahertz beam at high speed over a wide angle. The terahertz beam scanning apparatus includes: a laser device 12 that generates a first laser beam 1 and a second laser beam 2 having different wavelengths; a laser optical system 14 that focuses the first laser beam 1 and the second laser beam 2 on a same common focal point 14b; and a terahertz generator 16 that is located at the common focal point and generates a terahertz beam 4 by difference frequency mixing. The laser optical system 14 is configured to be capable of changing a relative incidence ?i between the first laser beam and the second laser beam to the terahertz generator.Type: ApplicationFiled: April 21, 2009Publication date: February 17, 2011Applicant: RIKENInventors: Ken-ichiro Maki, Takayuki Shibuya, Chiko Otani, Kodo Kawase
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Patent number: 7489231Abstract: An electromagnetic wave reception device includes: a input reception portion for detecting an input electromagnetic wave transmitted from a transmission terminal at a predetermined timing and receiving the input electromagnetic wave; a lock control portion for unlocking or locking a locking mechanism, according to the input electromagnetic wave received by the input reception portion; and a timing change portion for changing the timing at which the input reception section detects the input electromagnetic wave, according to time zones. This structure provides an electromagnetic wave reception device capable of not affecting the convenience of the user while reducing the power consumption in receiving the input electromagnetic wave transmitted from the transmission terminal (e.g. a remote controller).Type: GrantFiled: May 7, 2004Date of Patent: February 10, 2009Assignee: Panasonic CorporationInventors: Eiji Kadouchi, Ichiro Maki
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Publication number: 20050247088Abstract: An electromagnetic wave reception device includes: a input reception portion for detecting an input electromagnetic wave transmitted from a transmission terminal at a predetermined timing and receiving the input electromagnetic wave; a lock control portion for unlocking or locking a locking mechanism, according to the input electromagnetic wave received by the input reception portion; and a timing change portion for changing the timing at which the input reception section detects the input electromagnetic wave, according to time zones. This structure provides an electromagnetic wave reception device capable of not affecting the convenience of the user while reducing the power consumption in receiving the input electromagnetic wave transmitted from the transmission terminal (e.g. a remote controller).Type: ApplicationFiled: May 7, 2004Publication date: November 10, 2005Applicant: Matsushita Electric Industrial Co. Ltd.Inventors: Eiji Kadouchi, Ichiro Maki
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Patent number: 6677758Abstract: A multiplex voltage measurement apparatus includes: (N+1) voltage detection terminals connected to N serially connected voltage sources; a capacitor which is charged with a voltage value of any of the N voltage sources; a first sample switch for selectively connecting odd-numbered voltage detection terminals among the (N+1) voltage detection terminals to a first terminal of the capacitor; a second sample switch for selectively connecting even-numbered voltage detection terminals among the (N+1) voltage detection terminals to a second terminal of the capacitor; a voltage measurement circuit for measuring the voltage value stored in the capacitor; a third sample switch for connecting the first terminal and the second terminal of the capacitor to the voltage measurement circuit; and a polarity controller for controlling the first and second sample switches such that one of the N voltage sources is selected while the third sample switch is open.Type: GrantFiled: March 28, 2003Date of Patent: January 13, 2004Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventors: Ichiro Maki, Hirofumi Yudahira
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Patent number: 6639409Abstract: A battery voltage measurement device includes: a plurality of first switching sections, wherein each pair of adjacent first switching sections sequentially selects two output terminals of each of a plurality of battery blocks included in a battery pack so that each of the selected output terminals are connected to one of a pair of conductor wires; a voltage detection section for detecting a battery voltage of each of the plurality of battery blocks via the pair of conductor wires; and second switch sections each being provided on a respective one of the pair of conductor lines and being serially connected to each group of the plurality of first switch sections connected in parallel to one of the pair of conductor lines.Type: GrantFiled: November 2, 2001Date of Patent: October 28, 2003Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventors: Naohisa Morimoto, Ichiro Maki, Hirofumi Yudahira
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Patent number: 6639408Abstract: A battery voltage measurement device includes: a plurality of first switching sections, wherein each pair of adjacent first switching sections sequentially selects two output terminals of each of a plurality of battery blocks included in a battery pack; a level change section for changing a level of a battery voltage of each battery block which is input to the level change section via the first switching section; an A/D conversion section for performing an A/D conversion of battery voltage data output from the level change section; and a reference voltage control section for controlling an output of a reference voltage of the level change section according to the polarity of the voltage input to the level change section.Type: GrantFiled: November 2, 2001Date of Patent: October 28, 2003Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventors: Hirofumi Yudahira, Ichiro Maki, Naohisa Morimoto
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Publication number: 20030189419Abstract: A multiplex voltage measurement apparatus includes: (N+1) voltage detection terminals connected to N serially connected voltage sources; a capacitor which is charged with a voltage value of any of the N voltage sources; a first sample switch for selectively connecting odd-numbered voltage detection terminals among the (N+1) voltage detection terminals to a first terminal of the capacitor; a second sample switch for selectively connecting even-numbered voltage detection terminals among the (N+1) voltage detection terminals to a second terminal of the capacitor; a voltage measurement circuit for measuring the voltage value stored in the capacitor; a third sample switch for connecting the first terminal and the second terminal of the capacitor to the voltage measurement circuit; and a polarity controller for controlling the first and second sample switches such that one of the N voltage sources is selected while the third sample switch is open.Type: ApplicationFiled: March 28, 2003Publication date: October 9, 2003Inventors: Ichiro Maki, Hirofumi Yudahira
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Patent number: 6603287Abstract: A device is provided that allows a physical quantity of a battery pack to be determined at low cost with high accuracy with respect to variations in environmental temperature. A voltage regulator supplies a temperature detecting part and an A/D converter with reference voltages as a reference voltage for detection and a reference voltage for conversion, respectively, and supplies a storage part and a signal processing part with the reference voltage as a supply voltage. Based on signal levels obtained from physical quantity detecting parts and the temperature detecting part via the A/D converter so as to correspond to a plurality of temperatures in a predetermined temperature range, which have been stored in the storage part, a signal level obtained from the physical quantity detecting part via the A/D converter is corrected in the signal processing part.Type: GrantFiled: April 9, 2002Date of Patent: August 5, 2003Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventors: Naohisa Morimoto, Ichiro Maki
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Patent number: 6570387Abstract: A multiplex voltage measurement apparatus includes: (N+1) voltage detection terminals connected to N serially connected voltage sources; a capacitor which is charged with a voltage value of any of the N voltage sources; a first sample switch for selectively connecting odd-numbered voltage detection terminals among the (N+1) voltage detection terminals to a first terminal of the capacitor; a second sample switch for selectively connecting even-numbered voltage detection terminals among the (N+1) voltage detection terminals to a second terminal of the capacitor; a voltage measurement circuit for measuring the voltage value stored in the capacitor; a third sample switch for connecting the first terminal and the second terminal of the capacitor to the voltage measurement circuit; and a polarity controller for controlling the first and second sample switches such that one of the N voltage sources is selected while the third sample switch is open.Type: GrantFiled: April 10, 2001Date of Patent: May 27, 2003Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventors: Ichiro Maki, Hirofumi Yudahira
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Patent number: 6541980Abstract: A multiplex voltage measurement apparatus configured to detect the breakage of a line coupling a voltage detection terminal and an electric leakage detection circuit includes a multiplex voltage measurement section and an electric leakage detection circuit. The multiplex voltage measurement section is configured to measure the voltage of each of N serially connected voltage sources via (N+1) voltage detection terminals coupled to a capacitor. The electric leakage detection circuit is configured to measure an insulation impedance between the voltage sources and a chassis. A sample switch in the leakage detection circuit prevents the formation of a loop connecting the electric leakage detection circuit to the voltage measurement section in the event of a disconnection between a voltage detection terminal and the multiplex voltage measurement section, allowing the detection of such a disconnection.Type: GrantFiled: April 10, 2001Date of Patent: April 1, 2003Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventor: Ichiro Maki
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Publication number: 20020149357Abstract: A device is provided that allows a physical quantity of a battery pack to be determined at low cost with high accuracy with respect to variations in environmental temperature. A voltage regulator supplies a temperature detecting part and an A/D converter with reference voltages as a reference voltage for detection and a reference voltage for conversion, respectively, and supplies a storage part and a signal processing part with the reference voltage as a supply voltage. Based on signal levels obtained from physical quantity detecting parts and the temperature detecting part via the A/D converter so as to correspond to a plurality of temperatures in a predetermined temperature range, which have been stored in the storage part, a signal level obtained from the physical quantity detecting part via the A/D converter is corrected in the signal processing part.Type: ApplicationFiled: April 9, 2002Publication date: October 17, 2002Applicant: Matsushita Electric Industrial Co., Ltd.Inventors: Naohisa Morimoto, Ichiro Maki
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Publication number: 20020075015Abstract: A battery voltage measurement device includes: a plurality of first switching sections, wherein each pair of adjacent first switching sections sequentially selects two output terminals of each of a plurality of battery blocks included in a battery pack so that each of the selected output terminals are connected to one of a pair of conductor wires; a voltage detection section for detecting a battery voltage of each of the plurality of battery blocks via the pair of conductor wires; and second switch sections each being provided on a respective one of the pair of conductor lines and being serially connected to each group of the plurality of first switch sections connected in parallel to one of the pair of conductor lines.Type: ApplicationFiled: November 2, 2001Publication date: June 20, 2002Inventors: Naohisa Morimoto, Ichiro Maki, Hirofumi Yudahira
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Publication number: 20020075004Abstract: A battery voltage measurement device includes: a plurality of first switching sections, wherein each pair of adjacent first switching sections sequentially selects two output terminals of each of a plurality of battery blocks included in a battery pack; a level change section for changing a level of a battery voltage of each battery block which is input to the level change section via the first switching section; an A/D conversion section for performing an A/D conversion of battery voltage data output from the level change section; and a reference voltage control section for controlling an output of a reference voltage of the level change section according to the polarity of the voltage input to the level change section.Type: ApplicationFiled: November 2, 2001Publication date: June 20, 2002Inventors: Hirofumi Yudahira, Ichiro Maki, Naohisa Morimoto
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Patent number: 6369584Abstract: A signal correction apparatus includes: a measurement signal generator for generating a measurement signal; a reference signal generator for generating a reference signal; a signal processing section for processing the measurement signal and the reference signal; a signal measurement section for measuring at a first time the reference signal having been processed by the signal processing section, measuring at a second time the reference signal having been processed by the signal processing section, and thereafter measuring the measurement signal having been processed by the signal processing section; and a correction section for performing a correction on the measurement signal having been processed by the signal processing section and measured by the signal measurement section, based on a change from the reference signal having been processed by the signal processing section and measured at the first time to the reference signal having been processed by the signal processing section and measured at the seconType: GrantFiled: April 17, 2000Date of Patent: April 9, 2002Assignees: Matsushita Electric Industrial Co., Ltd., Toyota Jidosha Kabushiki KaishaInventors: Naohisa Morimoto, Ichiro Maki, Masahiro Takada
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Publication number: 20010048307Abstract: A multiplex voltage measurement apparatus includes: (N+1) voltage detection terminals connected to N serially connected voltage sources; a capacitor which is charged with a voltage value of any of the N voltage sources; a first sample switch for selectively connecting odd-numbered voltage detection terminals among the (N+1) voltage detection terminals to a first terminal of the capacitor; a second sample switch for selectively connecting even-numbered voltage detection terminals among the (N+1) voltage detection terminals to a second terminal of the capacitor; a voltage measurement circuit for measuring the voltage value stored in the capacitor; a third sample switch for connecting the first terminal and the second terminal of the capacitor to the voltage measurement circuit; and a polarity controller for controlling the first and second sample switches such that one of the N voltage sources is selected while the third sample switch is open.Type: ApplicationFiled: April 10, 2001Publication date: December 6, 2001Inventors: Ichiro Maki, Hirofumi Yudahira
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Publication number: 20010035765Abstract: A multiplex voltage measurement apparatus includes a multiplex voltage measurement section for measuring a voltage of each of N serially connected voltage sources and an electric leakage detection circuit for measuring an insulation impedance between the N voltage sources and a chassis, the multiplex voltage measurement section including (N+1) voltage detection terminals connected to the N voltage sources, a first capacitor having a first terminal and a second terminal, a first multiplexer for selectively connecting any of odd-numbered voltage detection terminals among the (N+1) voltage detection terminals to the first terminal of the first capacitor, a second multiplexer for selectively connecting any of even-numbered voltage detection terminals among the (N+1) voltage detection terminals to the second terminal of the first capacitor, a voltage measurement circuit for measuring the voltage between the first terminal and the second terminal of the first capacitor, a first sample switch for connType: ApplicationFiled: April 10, 2001Publication date: November 1, 2001Inventor: Ichiro Maki