Patents by Inventor Ivan Bachelder

Ivan Bachelder has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6798515
    Abstract: The disclosed methods and apparatuses leverage a known value of a characteristic of an object to partially calibrate an imaging system “on-the-fly”, and minimize, if not eliminate, the need for a separate calibration image(s). Specifically, the scale relationship (i.e. the relationship between physical dimensions and image dimensions) is calculated using the known value and a measured value of the characteristic from the image. The same image used to calculate the scale relationship is also processed, such as inspected, for example. The known value can be a measurement of an aspect of many things, including an inherent feature, or a relationship between features, for example. One embodiment uses a model to find the characteristic. A described preferred embodiment inspects an end-face of a fiber-optic cable, wherein the known value is the diameter of an annular cladding of the fiber-optic cable.
    Type: Grant
    Filed: November 29, 2001
    Date of Patent: September 28, 2004
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Ivan Bachelder, Adam Wagman
  • Patent number: 6748104
    Abstract: A method for rapid determination of the position and/or orientation of a semiconductor device, electronic component or other object includes performing multiple times an operation of matching a pattern against an image. The matching operation finds the location, if any, of a respective pattern in the image and determines the degree of match. The position and orientation of the object is determined from the results of one of the matching operations, for example, from the operation that revealed the highest degree of match.
    Type: Grant
    Filed: March 24, 2000
    Date of Patent: June 8, 2004
    Assignee: Cognex Corporation
    Inventors: Ivan Bachelder, Aaron Wallack
  • Patent number: 6647132
    Abstract: Methods and apparatuses are disclosed for identifying regions of similar texture in an image. The areas of similar texture include areas conventionally thought of as similar texture regions as well as areas of more varied texture that are treated as regions of similar texture in order to identify them within an image. The method associates frequency characteristics of an image with a spatial position within the image by: applying a frequency analysis on sub-regions of the image, thereby, generating frequency characteristics representative of the sub-regions: and associating the frequency characteristics with the origin of the sub-regions. An embodiment disclosed applies a fast Fourier transform on sub-regions in a given direction to determine a dominant frequency of the sub-region and the power of the dominant frequency, both of which are associated with the respective sub-region by storing the dominant frequency and power in a frequency image and power image, respectively, at the position of the origin.
    Type: Grant
    Filed: December 9, 1999
    Date of Patent: November 11, 2003
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Albert A. Montillo, Ivan A. Bachelder
  • Patent number: 6639624
    Abstract: A machine vision method for locating a leaded electronic device, such as integrated circuit chips, includes searching the image with a template depicting only a portion—e.g., one or two “side” edges—of each of one or more of the leads expected on the device. The template can include portions representing expected leads, as well as unexpected leads or unexpected lead positions. Positive and negative weightings are applied to such portions, as appropriate. A location of the device, or of one or more of its leads, is based on the results of the search.
    Type: Grant
    Filed: April 11, 2000
    Date of Patent: October 28, 2003
    Assignee: Cognex Corporation
    Inventors: Ivan Bachelder, Karen Roberts, Aaron Wallack, William Silver, Edward Collins, Karen Sarachik
  • Patent number: 6636298
    Abstract: A method is provided for obtaining a focused image of an object in an application of machine vision in an optical inspection system. A coarse focus setting is first obtained by maximizing a coarse feature sharpness measurement performed on an image of the object of inspection. Then, a fine focus setting is obtained by maximizing a fine feature sharpness measurement performed on a portion of an image of the object of inspection. Finally, the fine focused image can be further analyzed, inspected, or otherwise processed.
    Type: Grant
    Filed: December 18, 2001
    Date of Patent: October 21, 2003
    Assignee: Cognex Technology and Investment Corporation
    Inventors: Ivan Bachelder, Yusuf Akgul, Prabhav Morje, Juha Koljonen
  • Patent number: 6614926
    Abstract: The invention provides methods and apparatuses for generating from an image of an object a model of the object, when the object contains similar features. First, the invention finds the similar features. The similar features are found by searching portions of the image for features that are substantially similar to a feature prototype. More particularly, individual features in the image are located and designated candidate features, and optionally a spatial pattern representing a majority of the candidate features is generated. Next, feature profiles are generated therefrom, and the feature prototype is constructed using at least a subset of feature profiles. Thereafter, the model is generated using the similar features and, optionally, the spatial pattern.
    Type: Grant
    Filed: June 28, 2000
    Date of Patent: September 2, 2003
    Assignee: Cognex Corporation
    Inventors: Raymond Fix, Ivan Bachelder
  • Patent number: 6571006
    Abstract: Methods are disclosed that measure the extent of a group of objects within a digital image by comparing signature, representative of the relationship of the objects to one another, against instances of a measured signature at varying positions within the image. The position(s) where the signature(s) vary by a predetermined comparison criterion indicates the extent of the group of objects. It is disclosed that the comparison to a reference signature allows proper identification of measured signatures despite noise in the digital image. A preferred embodiment uses the CALIPER TOOL to generate signatures of edges, where the window of the CALIPER TOOL has a projection axis substantially parallel to the extent being measured. A preferred application is desired wherein the method measure the length of leads in a lead set.
    Type: Grant
    Filed: November 30, 1998
    Date of Patent: May 27, 2003
    Assignee: Cognex Corporation
    Inventors: Albert A. Montillo, Ivan A. Bachelder, Cyril C. Marrion, Jr.
  • Patent number: 6526165
    Abstract: A method and apparatus are disclosed for refining a rough geometric description (GD) and a rough pose of an object having extensions. The invention locates anchor points within an image of the object and uses the anchor points to align in at least one dimension the rough GD. In one embodiment, the anchor points are the tips of the extensions of the object; the rough GD of the object is then aligned along the angular orientation indicated by the tips. Thereafter, other dimensions of the rough GD and the rough pose are measured, measuring the dimensions having less unknowns first. The rough GD and the rough pose are then updated to provide the refined GD and refined pose. For one measurement, an extent of a region is measured using the expected area of region to threshold the region and segment it from the remainder of the image before measuring the extent of the region. An application of refining a GD of a leaded object is disclosed.
    Type: Grant
    Filed: November 30, 1998
    Date of Patent: February 25, 2003
    Assignee: Cognex Corporation
    Inventors: Albert A. Montillo, Ivan A. Bachelder, Cyril C. Marrion, Jr.
  • Patent number: 6516092
    Abstract: A method is provided for efficiently finding a pattern in an image using a full curvilinear model having a plurality of sub-models. Generally, the method includes maximizing the percentage of each segment connected to each vertex of each sub-model, and finding the pattern in the image using the model so-constructed. The invention permits the rapid determination of characteristics, such as dimensions, position, and orientation, of rectilinear and other polygonal objects, and is particularly well-adapted for analyzing images of back-lit objects.
    Type: Grant
    Filed: May 29, 1998
    Date of Patent: February 4, 2003
    Assignee: Cognex Corporation
    Inventors: Ivan A. Bachelder, Yoshikazu Ohashi
  • Patent number: 6411734
    Abstract: A method is provided for finding a pose of a geometric model of an object within an image of a scene containing the object that includes providing sub-models of the geometric model; and providing found poses of the sub-models in the image. The method also includes selecting sub-models of the geometric model based on pre-fit selection criteria and/or post-fit selection criteria so as to provide selected sub-models of the geometric model. Thus, the invention automatically removes, disqualifies, or disables found sub-model poses when they fail to satisfy certain user-specified requirements. Examples of such requirements include thresholds on deviations between the found sub-model poses and their corresponding expected poses with respect to the final model pose, as well as limits on the sub-model. The remaining, validated sub-models can then be used to re-compute a more accurate fit of the model to the image.
    Type: Grant
    Filed: December 16, 1998
    Date of Patent: June 25, 2002
    Assignee: Cognex Corporation
    Inventors: Ivan A. Bachelder, Karen B. Sarachik
  • Patent number: 6408429
    Abstract: An improved vision system is provided for identifying and assessing features of an article. Systems are provided for developing feature assessment programs, which, when deployed, may inspect parts and/or provide position information for guiding automated manipulation of such parts. The improved system is easy to use and facilitates the development of versatile and flexible article assessment programs. In one aspect, the system comprises a set of step tools from which a set of step objects is instantiated. The set of step tools may comprise machine vision step objects that comprise routines for processing an image of the article to provide article feature information. A control flow data structure and a data flow data structure may each be provided. The control flow data structure charts a flow of control among the step objects.
    Type: Grant
    Filed: March 10, 2000
    Date of Patent: June 18, 2002
    Assignee: Cognex Corporation
    Inventors: Cyril C. Marrion, Jr., Ivan A. Bachelder, Edward A. Collins, Jr., Masayoki Kawata, Sateesh G. Nadabar
  • Patent number: 6324299
    Abstract: The invention provides a method of locating an object within a client region, where the object has a plurality of portions. The method includes defining a full geometric model of the object; defining a plurality of geometric sub-models of the object; determining coarse candidate poses of the object within the region using an image of the region and the full geometric model of the object; determining the fine pose of each of a plurality of portions of the object using the coarse candidate poses of the object within the region, and at least some of said geometric sub-models, to provide a plurality of object portion fine poses within the region; and then determining the fine poses of the object within the region using said plurality of object portion fine poses of a plurality of portions of the object includes determining the coarse poses of each of a plurality of portions of the object, and using each coarse pose, determining the fine pose of each of the plurality of portions of the object.
    Type: Grant
    Filed: April 3, 1998
    Date of Patent: November 27, 2001
    Assignee: Cognex Corporation
    Inventors: Karen B. Sarachik, Ivan A. Bachelder, Cyril C. Marrion, Yian Leng Chang
  • Patent number: 6278796
    Abstract: A method and apparatus subsamples, in a constraint satisfying manner, an image for subsequent processing of the subsampled image. The subsampling is based on constraints provided for the subsequent image processing. A subsampling factor or pair of factors are determined for the image and the image is subsampled by the subsampling factor(s). The constraints comprise at least time constraints, uncertainty constraints, accuracy constraints or implementation constraints. When time constraints are given, the constraints specify a function of the time needed for the subsequent image processing along with at least a maximum and a minimum time that the subsequent image processing should take. When uncertainty constraints are specified, the constraints give a function of the uncertainty in the subsequent image processing and at least a maximum and a minimum uncertainty required from the subsequent image processing.
    Type: Grant
    Filed: July 7, 2000
    Date of Patent: August 21, 2001
    Assignee: Cognex Corporation
    Inventors: Robert Drisko, Ivan A. Bachelder
  • Patent number: 6157732
    Abstract: A method and apparatus subsamples, in a constraint satisfying manner, an image for subsequent processing of the subsampled image. The subsampling is based on constraints provided for the subsequent image processing. A subsampling factor or pair of factors are determined for the image and the image is subsampled by the subsampling factor(s). The constraints comprise at least time constraints, uncertainty constraints, accuracy constraints or implementation constraints. When time constraints are given, the constraints specify a function of the time needed for the subsequent image processing along with at least a maximum and a minimum time that the subsequent image processing should take. When uncertainty constraints are specified, the constraints give a function of the uncertainty in the subsequent image processing and at least a maximum and a minimum uncertainty required from the subsequent image processing.
    Type: Grant
    Filed: April 7, 1999
    Date of Patent: December 5, 2000
    Assignee: Cognex Corporation
    Inventors: Robert Drisko, Ivan A. Bachelder
  • Patent number: 6094526
    Abstract: An improved vision system is provided for identifying and assessing features of an article. Systems are provided for developing feature assessment programs, which, when deployed, may inspect parts and/or provide position information for guiding automated manipulation of such parts. The improved system is easy to use and facilitates the development of versatile and flexible article assessment programs. In one aspect, the system comprises a set of step tools from which a set of step objects is instantiated. The set of step tools may comprise machine vision step objects that comprise routines for processing an image of the article to provide article feature information. A control flow data structure and a data flow data structure may each be provided. The control flow data structure charts a flow of control among the step objects.
    Type: Grant
    Filed: January 17, 1997
    Date of Patent: July 25, 2000
    Assignee: Cognex Corporation
    Inventors: Cyril C. Marrion, Jr., Ivan A. Bachelder, Edward A. Collins, Jr., Masayoki Kawata, Sateesh G. Nadabar
  • Patent number: 5995648
    Abstract: An automated object inspection system involving locating an object in an input image obtains a digital representation of an image including the object. Expected geometric parameters representing expected geometric features of the object are obtained. A set of pixels required for input to an object locating process is selected. A subsampling factor is defined based upon at least the expected geometric parameters. The subsampling factor defines a reduction in resolution of the set of pixels. The set of pixels is subsampled in accordance with the defined subsampling factor. The object locating process is run on the subsampled set of pixels. In defining the subsampling factor based upon at least the expected geometric parameters, the system takes into account constraints such as time an uncertainty constraints.
    Type: Grant
    Filed: March 18, 1997
    Date of Patent: November 30, 1999
    Assignee: Cognex Corporation
    Inventors: Robert Drisko, Ivan A. Bachelder
  • Patent number: 5974169
    Abstract: Machine vision methods for determining a characteristic (such as position, orientation, size, center of mass, and boundary) of an object in an image include finding points in the image on the boundary of the object; identifying bounding boxes, or regions, in the image that correspond to edges of the object; and labeling boundary points to denote which respective edges, if any, to which they belong based on (i) the locations and orientations of those points, and (ii) locations of the plural bounding boxes. Points apparently lying on a boundary of the object, but outside a bounding box, can be ignored--and, more particularly, are denoted as not corresponding to an edge. Likewise, apparent boundary points lying within a bounding box, but at an angle not associated with the corresponding to the respective edge of the object, can also be ignored. Characteristics of the imaged object are determined as a function of those boundary points found to correspond to an edge of the object (e.g.
    Type: Grant
    Filed: March 20, 1997
    Date of Patent: October 26, 1999
    Assignee: Cognex Corporation
    Inventor: Ivan A. Bachelder
  • Patent number: 5933523
    Abstract: Determining the position of a generally rectangular device is achieved by performing subsampling of image data, thresholding of the subsampled data, extraction of boundary features based on the output of the thresholding, calculation of correspondence between extracted boundary features and the generally rectangular device, and a final fit against a model of the generally rectangular device. Correspondence between the boundary features of the image and the generally rectangular device is performed by locating points in the extracted boundary feature which may correspond to corners of the generally rectangular device, removing those points which correspond to known objects other than the generally rectangular device, removing those points likely to belong to unknown objects, and fitting the points to an input model of the generally rectangular device to determine its position.
    Type: Grant
    Filed: March 18, 1997
    Date of Patent: August 3, 1999
    Assignee: Cognex Corporation
    Inventors: Robert Drisko, Toshimitsu Motoyama, Ivan A. Bachelder