Abstract: The present invention makes it possible to realize an analysis apparatus having a plurality of liquid chromatographs capable of judging separation performance and the like at the right timing and improving analysis performance early. Analysis starts and a mixed sample is prepared by adding a non-retaining ingredient to a measurement object sample and is introduced into an analysis flow path (S401 to S404). The mixed sample is separated into components by a separation column, the components are outputted as chromatogram data by a detector, and the analysis finishes (S404 to S406). Retention time and peak information are acquired from the chromatogram outputted from the detector, whether or not a measurement result is within an allowable range is judged, and the process shifts to next analysis when the measurement result is within the allowable range (S407 to S409).

Abstract: A biological sample analyzer includes: a camera 201a imaging a blood collection tube 209 containing a biological sample; an image processing section 201b and a comparative analysis section 206 that analyze the image imaged by the camera in order to extract an existence region of the biological sample; a light source 203a1, a photo sensor 203a2 and a liquid-level position detection section 203b that detect the amount of transmitted light in the blood collection tube 209 in order to detect a liquid-level position of the biological sample; and the comparative analysis section 206 that, based on the extracted existence region of the biological sample and the detected liquid-level position of the biological sample, identifies a determination target portion for a category of the biological sample, and acquires color information on the identified portion, in order to determine a category of the biological sample contained in the blood collection tube 209.

Abstract: A logic BIST circuits concurrently execute a first scan test for a scan chain as a target and a second scan test for a scan chain as a target, when they are set to a an LBIST mode, and execute the first scan test without executing the second scan test, when they are set to a simultaneous test mode. Memory BIST circuits execute a test for memory circuits concurrently with the first scan test, when they are set to the simultaneous test mode.

Abstract: A sample liquid-surface position measurement device includes: a first light source that illuminates a side face of a container containing a sample; a first optical measurement sensor that is located on the opposite side of the container from the first light source, and measures transmitted light from the first light source; a first label position measuring unit that measures a position of a label affixed to the container; and an analysis section that calculates a liquid-surface position or an interface position of the sample in the container, from transmitted-light intensity data in a longitudinal direction of the container which is measured by the first optical measurement sensor, and from the position of the label in the longitudinal direction of the container which is measured by the first label position measuring unit.

Abstract: A biological sample analyzer includes: a camera 201a imaging a blood collection tube 209 containing a biological sample; an image processing section 201b and a comparative analysis section 206 that analyze the image imaged by the camera in order to extract an existence region of the biological sample; a light source 203a1, a photo sensor 203a2 and a liquid-level position detection section 203b that detect the amount of transmitted light in the blood collection tube 209 in order to detect a liquid-level position of the biological sample; and the comparative analysis section 206 that, based on the extracted existence region of the biological sample and the detected liquid-level position of the biological sample, identifies a determination target portion for a category of the biological sample, and acquires color information on the identified portion, in order to determine a category of the biological sample contained in the blood collection tube 209.

Abstract: A sample liquid-surface position measurement device includes: a first light source that illuminates a side face of a container containing a sample; a first optical measurement sensor that is located on the opposite side of the container from the first light source, and measures transmitted light from the first light source; a first label position measuring unit that measures a position of a label affixed to the container; and an analysis section that calculates a liquid-surface position or an interface position of the sample in the container, from transmitted-light intensity data in a longitudinal direction of the container which is measured by the first optical measurement sensor, and from the position of the label in the longitudinal direction of the container which is measured by the first label position measuring unit.

Abstract: The type of blood collection tube (1) inserted into this system is automatically recognized, a lifting operation for checking the state and volume of analyte is switched on the basis of the automatic recognition result, a mechanical operation parameter based on the blood collection tube type is determined, and the blood collection tube (1) is grasped and lifted. Then, an image processing threshold is changed on the basis of the automatic recognition result, and image processing is performed using a threshold parameter based on the blood collection tube type to check the state and volume of the analyte. This enables precise automatic checking of the state and/or volume of the analyte for various types of blood collection tubes.

Abstract: A logic BIST circuits concurrently execute a first scan test for a scan chain as a target and a second scan test for a scan chain as a target, when they are set to an LBIST mode, and execute the first scan test without executing the second scan test, when they are set to a simultaneous test mode. Memory BIST circuits execute a test for memory circuits concurrently with the first scan test, when they are set to the simultaneous test mode. Logic BIST circuits complete a test with the LBIST mode, at a stage where the second scan test has completed.

Abstract: A sample pretreatment system is equipped with a pipetting device for pipetting multiple primary samples to make multiple aliquot samples. The sample volume expected to be held in a test tube is set as a minimum guaranteed volume for each type of test tube; and a minimum guaranteed volume value is set for each type of the test tubes. A cumulative totaling unit adds up cumulatively the aliquot volumes of the aliquot samples based on pipetting request information with regard to the supplied test tubes. A reading unit reads the minimum guaranteed volume of the supplied test tube; and an aliquot sample preparation unit compares the minimum guaranteed volume successively with the cumulative total values of the aliquot volumes of the aliquot samples, and causes a pipetting device to pipette a maximum number of the aliquot samples in a manner not exceeding the minimum guaranteed volume.

Abstract: A semiconductor device that can be caused to easily generate an internal pseudo error is provided. Error detection circuits detect an error occurring in the semiconductor device and output error signals that are detection results. An error injection circuit outputs predetermined error signals at a predetermined timing. A selection circuit selects either the outputs of the error detection circuits or the outputs of the error injection circuit in accordance with a mode signal, and determines the selected outputs as an output of an error register.

Abstract: A host system recognizes a sample pretreatment system at which a primary sample has first arrived and records the information, if multiple containers containing the primary sample are input. Upon issuing an analysis request to the sample pretreatment system, the host system determines whether the primary sample (sample bearing the same barcode for sample identification) is input to a system different from the system to which the sample was input for the first time and, if that is the case, then determines that “the sample is input to the wrong system” and issues a “do-nothing request” (request to do nothing) so that an aliquoting operation will not be performed. Given the “do-nothing request” from the host system, the sample pretreatment system does not prepare any aliquot sample and places the input sample onto a tray in a predetermined position.

Abstract: A thin film forming apparatus includes a substrate holding portion and a target portion. The target portion has a plurality of targets arranged at predetermined intervals and parallel to a substrate held by the substrate holding portion. The substrate holding portion is configured to move the substrate parallel to the target portion. A shield portion configured to block sputtered particles flying from the target portion is placed on the target portion side of the substrate so as to face a gap between adjoining ones of the targets.

Abstract: The type of blood collection tube (1) inserted into this system is automatically recognized, a lifting operation for checking the state and volume of analyte is switched on the basis of the automatic recognition result, a mechanical operation parameter based on the blood collection tube type is determined, and the blood collection tube (1) is grasped and lifted. Then, an image processing threshold is changed on the basis of the automatic recognition result, and image processing is performed using a threshold parameter based on the blood collection tube type to check the state and volume of the analyte. This enables precise automatic checking of the state and/or volume of the analyte for various types of blood collection tubes.

Abstract: A sample pretreatment system is equipped with a pipetting device for pipetting multiple primary samples to make multiple aliquot samples. The sample volume expected to be held in a test tube is set as a minimum guaranteed volume for each type of test tube; and a minimum guaranteed volume value is set for each type of the test tubes. A cumulative totaling unit adds up cumulatively the aliquot volumes of the aliquot samples based on pipetting request information with regard to the supplied test tubes. A reading unit reads the minimum guaranteed volume of the supplied test tube; and an aliquot sample preparation unit compares the minimum guaranteed volume successively with the cumulative total values of the aliquot volumes of the aliquot samples, and causes a pipetting device to pipette a maximum number of the aliquot samples in a manner not exceeding the minimum guaranteed volume.

Abstract: A host system recognizes a sample pretreatment system at which a primary sample has first arrived and records the information, if multiple containers containing the primary sample are input. Upon issuing an analysis request to the sample pretreatment system, the host system determines whether the primary sample (sample bearing the same barcode for sample identification) is input to a system different from the system to which the sample was input for the first time and, if that is the case, then determines that “the sample is input to the wrong system” and issues a “do-nothing request” (request to do nothing) so that an aliquoting operation will not be performed. Given the “do-nothing request” from the host system, the sample pretreatment system does not prepare any aliquot sample and places the input sample onto a tray in a predetermined position.

Abstract: A thin film forming apparatus includes a substrate holding portion and a target portion. The target portion has a plurality of targets arranged at predetermined intervals and parallel to a substrate held by the substrate holding portion. The substrate holding portion is configured to move the substrate parallel to the target portion. A shield portion configured to block sputtered particles flying from the target portion is placed on the target portion side of the substrate so as to face a gap between adjoining ones of the targets.

Abstract: The test design cost of a circuit capable of accessing an external memory is reduced. There is included a built-in self-test circuit for use in testing an external memory separately from a memory controller for performing memory control in response to an access request to the external memory capable of being coupled to a memory interface, and a TAP controller is used to control the built-in self-test circuit and referring to a test result. There is adopted a multiplexer for switchably selecting the memory controller or the built-in self-test circuit as a circuit for coupling to the memory interface in accordance with control information externally inputted through the TAP controller. The built-in self-test circuit programmably generates and outputs a pattern for a memory test in accordance with an instruction inputted through the TAP controller, and compares data read from the external memory with an expected value.

Abstract: The test design cost of a circuit capable of accessing an external memory is reduced. There is included a built-in self-test circuit for use in testing an external memory separately from a memory controller for performing memory control in response to an access request to the external memory capable of being coupled to a memory interface, and a TAP controller is used to control the built-in self-test circuit and referring to a test result. There is adopted a multiplexer for switchably selecting the memory controller or the built-in self-test circuit as a circuit for coupling to the memory interface in accordance with control information externally inputted through the TAP controller. The built-in self-test circuit programmably generates and outputs a pattern for a memory test in accordance with an instruction inputted through the TAP controller, and compares data read from the external memory with an expected value.

Abstract: A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.

Abstract: A testing circuit using ALPG is mounted in a testing board in which sockets for mounting semiconductor memories as devices to be tested in the board is mounted and a volatile memory for storing a data table for generating a random pattern is provided in the testing circuit so that a test using a test pattern having no regularity is performed using the data table in addition to a test using a test pattern having regularity generated by the ALPG.