Patents by Inventor James E. Hopkins
James E. Hopkins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10965096Abstract: A fixture assembly for testing a surface emitting laser diode and a testing apparatus having the same are provided. The fixture assembly comprises a base, an upper cover and a latch mechanism. The base includes at least one pocket, and at least one electrical contact interface disposed in the pocket. The upper cover includes a body, an abutting block and a pressing member disposed in the body. The abutting block is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the base and the upper cover, and is configured to selectively connect or disconnect the base to or from the upper cover. When the latch mechanism is operated to connect the base to the upper cover, the pocket and an opening of the abutting block form into a through cavity through which the laser diode emits the laser beam.Type: GrantFiled: March 20, 2019Date of Patent: March 30, 2021Assignee: CHROMA ATE INC.Inventor: James E. Hopkins
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Patent number: 10903618Abstract: A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.Type: GrantFiled: March 20, 2019Date of Patent: January 26, 2021Assignee: CHROMA ATE INC.Inventor: James E. Hopkins
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Publication number: 20200303894Abstract: A fixture assembly for testing a surface emitting laser diode and a testing apparatus having the same are provided. The fixture assembly comprises a base, an upper cover and a latch mechanism. The base includes at least one pocket, and at least one electrical contact interface disposed in the pocket. The upper cover includes a body, an abutting block and a pressing member disposed in the body. The abutting block is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the base and the upper cover, and is configured to selectively connect or disconnect the base to or from the upper cover. When the latch mechanism is operated to connect the base to the upper cover, the pocket and an opening of the abutting block form into a through cavity through which the laser diode emits the laser beam.Type: ApplicationFiled: March 20, 2019Publication date: September 24, 2020Inventor: James E. Hopkins
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Publication number: 20200303895Abstract: A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.Type: ApplicationFiled: March 20, 2019Publication date: September 24, 2020Inventor: James E. Hopkins
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Patent number: 9954255Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.Type: GrantFiled: October 16, 2015Date of Patent: April 24, 2018Assignee: CHROMA ATE INC.Inventor: James E. Hopkins
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Publication number: 20170108326Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.Type: ApplicationFiled: October 16, 2015Publication date: April 20, 2017Inventor: James E. HOPKINS
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Patent number: 7545158Abstract: A method for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The method and apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time.Type: GrantFiled: April 12, 2007Date of Patent: June 9, 2009Assignee: Chroma ATE Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7535214Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.Type: GrantFiled: April 12, 2007Date of Patent: May 19, 2009Assignee: Chroma Ate IncInventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7518357Abstract: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a micro SD device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the micro SD devices in each tray engaged by the hive without removing the micro SD devices that did pass electrical testing until a tray of electrically tested micro SD devices is fully populated with micro SD devices that did pass electrical testing.Type: GrantFiled: April 12, 2007Date of Patent: April 14, 2009Assignee: Chroma Ate Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7518356Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus comprises a JEDEC standard tray receiving apparatus comprising a plurality of tray aligners to align the tray into a predetermined position to account for dimensional tolerances of the tray. The apparatus further comprises a test assembly proximate the tray receiving apparatus. The assembly comprises; a plurality of test circuits corresponding in number to the number of cells in the tray, a plurality of groups of test contacts, each of group of the test contacts being coupled to one of the test circuits and being oriented to engage a plurality of electrical contacts of a SIP device disposed in a corresponding one of the cell, the plurality of test circuits being operable to simultaneously, electrically test a predetermined number of SIP devices in a JEDEC standard tray engaged by the receiving apparatus without removing the SIP devices from the tray.Type: GrantFiled: April 12, 2007Date of Patent: April 14, 2009Assignee: Chroma Ate Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7514914Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.Type: GrantFiled: April 12, 2007Date of Patent: April 7, 2009Assignee: Chroma Ate IncInventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7489156Abstract: A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.Type: GrantFiled: April 12, 2007Date of Patent: February 10, 2009Assignee: Chruma Ate Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7489155Abstract: A method for testing System-In-Package (SIP) devices such as micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.Type: GrantFiled: April 12, 2007Date of Patent: February 10, 2009Assignee: Chroma Ate IncInventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Patent number: 7443190Abstract: A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.Type: GrantFiled: April 12, 2007Date of Patent: October 28, 2008Assignee: Chroma Ate IncInventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Publication number: 20080252314Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray: and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells. The lest hive is operable to simultaneously, electrically test at least a predetermined number of the number of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.Type: ApplicationFiled: April 12, 2007Publication date: October 16, 2008Applicant: Semiconductor Testing Advanced Research Lab Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Publication number: 20080252321Abstract: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.Type: ApplicationFiled: April 12, 2007Publication date: October 16, 2008Applicant: Semiconductor Testing Advanced Research Lab Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Publication number: 20080252320Abstract: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray: and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a micro SD device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the micro SD devices in each tray engaged by the hive without removing the micro SD devices that did pass electrical testing until a tray of electrically tested micro SD devices is fully populated with micro SD devices that did pass electrical testing.Type: ApplicationFiled: April 12, 2007Publication date: October 16, 2008Applicant: Semiconductor Testing Advanced Research Lab Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Publication number: 20080252318Abstract: A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.Type: ApplicationFiled: April 12, 2007Publication date: October 16, 2008Applicant: Semiconductor Testing Advanced Research Lab Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Publication number: 20080252319Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.Type: ApplicationFiled: April 12, 2007Publication date: October 16, 2008Applicant: Semiconductor Testing Advanced Research Lab Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
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Publication number: 20080252312Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.Type: ApplicationFiled: April 12, 2007Publication date: October 16, 2008Applicant: Semiconductor Testing Advanced Research Lab Inc.Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen