Patents by Inventor James E. Hopkins

James E. Hopkins has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10965096
    Abstract: A fixture assembly for testing a surface emitting laser diode and a testing apparatus having the same are provided. The fixture assembly comprises a base, an upper cover and a latch mechanism. The base includes at least one pocket, and at least one electrical contact interface disposed in the pocket. The upper cover includes a body, an abutting block and a pressing member disposed in the body. The abutting block is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the base and the upper cover, and is configured to selectively connect or disconnect the base to or from the upper cover. When the latch mechanism is operated to connect the base to the upper cover, the pocket and an opening of the abutting block form into a through cavity through which the laser diode emits the laser beam.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: March 30, 2021
    Assignee: CHROMA ATE INC.
    Inventor: James E. Hopkins
  • Patent number: 10903618
    Abstract: A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.
    Type: Grant
    Filed: March 20, 2019
    Date of Patent: January 26, 2021
    Assignee: CHROMA ATE INC.
    Inventor: James E. Hopkins
  • Publication number: 20200303894
    Abstract: A fixture assembly for testing a surface emitting laser diode and a testing apparatus having the same are provided. The fixture assembly comprises a base, an upper cover and a latch mechanism. The base includes at least one pocket, and at least one electrical contact interface disposed in the pocket. The upper cover includes a body, an abutting block and a pressing member disposed in the body. The abutting block is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the base and the upper cover, and is configured to selectively connect or disconnect the base to or from the upper cover. When the latch mechanism is operated to connect the base to the upper cover, the pocket and an opening of the abutting block form into a through cavity through which the laser diode emits the laser beam.
    Type: Application
    Filed: March 20, 2019
    Publication date: September 24, 2020
    Inventor: James E. Hopkins
  • Publication number: 20200303895
    Abstract: A fixture assembly having a base, an upper cover and a latch mechanism for testing an edge-emitting laser diode and a testing apparatus having the same are provided. The base includes a pocket, and a transmission cavity in communication with and orthogonal to the pocket. The upper cover includes a body, an abutting block and a pressing member. The abutting block having an electrical contact interface is engageable with the body for slidable movement with respect to the body. The latch mechanism is disposed on the upper cover, and may selectively connect or disconnect the upper cover to or from the base. When the latch mechanism is operated to connect the upper cover to the base, the pressing member applies a force through the abutting block on the edge-emitting laser diode received in the pocket, and the edge-emitting laser diode emits the laser for inspection through the transmission cavity.
    Type: Application
    Filed: March 20, 2019
    Publication date: September 24, 2020
    Inventor: James E. Hopkins
  • Patent number: 9954255
    Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.
    Type: Grant
    Filed: October 16, 2015
    Date of Patent: April 24, 2018
    Assignee: CHROMA ATE INC.
    Inventor: James E. Hopkins
  • Publication number: 20170108326
    Abstract: A measurement fixture for a battery cell is provided when the battery cell is connected to an apparatus. The measurement fixture comprises a chamber, a pressure sensor and an expansion sensor. The chamber defines a sealed space for receiving the battery cell. The pressure sensor is mounted to the chamber to sense a change of pressure in the sealed space due to a volume change of the battery cell to calculate pressure in the battery cell and the volume change of the battery cell non-contactly. The expansion sensor is mounted to the chamber to sense a deformation of the battery cell to calculate a correlation between the pressure in the battery cell and the volume change of the battery cell non-contactly.
    Type: Application
    Filed: October 16, 2015
    Publication date: April 20, 2017
    Inventor: James E. HOPKINS
  • Patent number: 7545158
    Abstract: A method for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The method and apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: June 9, 2009
    Assignee: Chroma ATE Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7535214
    Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: May 19, 2009
    Assignee: Chroma Ate Inc
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7518357
    Abstract: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray; and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a micro SD device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the micro SD devices in each tray engaged by the hive without removing the micro SD devices that did pass electrical testing until a tray of electrically tested micro SD devices is fully populated with micro SD devices that did pass electrical testing.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: April 14, 2009
    Assignee: Chroma Ate Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7518356
    Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus comprises a JEDEC standard tray receiving apparatus comprising a plurality of tray aligners to align the tray into a predetermined position to account for dimensional tolerances of the tray. The apparatus further comprises a test assembly proximate the tray receiving apparatus. The assembly comprises; a plurality of test circuits corresponding in number to the number of cells in the tray, a plurality of groups of test contacts, each of group of the test contacts being coupled to one of the test circuits and being oriented to engage a plurality of electrical contacts of a SIP device disposed in a corresponding one of the cell, the plurality of test circuits being operable to simultaneously, electrically test a predetermined number of SIP devices in a JEDEC standard tray engaged by the receiving apparatus without removing the SIP devices from the tray.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: April 14, 2009
    Assignee: Chroma Ate Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7514914
    Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: April 7, 2009
    Assignee: Chroma Ate Inc
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7489156
    Abstract: A method and apparatus for testing micro SD devices each having a plurality of electrical leads is described. The method and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: February 10, 2009
    Assignee: Chruma Ate Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7489155
    Abstract: A method for testing System-In-Package (SIP) devices such as micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: February 10, 2009
    Assignee: Chroma Ate Inc
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Patent number: 7443190
    Abstract: A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.
    Type: Grant
    Filed: April 12, 2007
    Date of Patent: October 28, 2008
    Assignee: Chroma Ate Inc
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Publication number: 20080252314
    Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray: and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells. The lest hive is operable to simultaneously, electrically test at least a predetermined number of the number of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: Semiconductor Testing Advanced Research Lab Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Publication number: 20080252321
    Abstract: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The and apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: Semiconductor Testing Advanced Research Lab Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Publication number: 20080252320
    Abstract: Apparatus for testing micro SD devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus comprises a test hive comprising: a plurality of test circuits corresponding in number to at least a predetermined number of cells in the tray: and a plurality of groups of test contacts, each group is coupled to one of the test circuits and is oriented to engage the plurality of electrical contacts of a micro SD device disposed in a corresponding one of the cells. The test hive is operable to simultaneously, electrically test at least a predetermined number of the number of the micro SD devices in each tray engaged by the hive without removing the micro SD devices that did pass electrical testing until a tray of electrically tested micro SD devices is fully populated with micro SD devices that did pass electrical testing.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: Semiconductor Testing Advanced Research Lab Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Publication number: 20080252318
    Abstract: A method for testing micro SD devices each having a plurality of electrical leads is described. The method utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: Semiconductor Testing Advanced Research Lab Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Publication number: 20080252319
    Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical contacts is described. The apparatus utilizes industry standard JEDEC trays and tests at least a predetermined portion of the devices in such trays at the same time.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: Semiconductor Testing Advanced Research Lab Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen
  • Publication number: 20080252312
    Abstract: Apparatus for testing System-In-Package (SIP) devices each having a plurality of electrical leads is described. The apparatus utilizes industry standard JEDEC trays and tests all devices in such trays at the same time. The apparatus of the illustrative embodiment comprises a test hive comprising: a plurality of test circuits corresponding in number to the number of cells in the tray; and a plurality of groups of test contacts, each of the groups of the test contacts being coupled to one of the test circuits and being oriented to engage the plurality of electrical contacts of a SIP device disposed in a corresponding one of the cells, the test hive being operable to simultaneously, electrically test all of the SIP devices in each tray engaged by the hive without removing the SIP devices from the tray.
    Type: Application
    Filed: April 12, 2007
    Publication date: October 16, 2008
    Applicant: Semiconductor Testing Advanced Research Lab Inc.
    Inventors: James E. Hopkins, Michael Peter Costello, Herbert Tsai, Ching-Too Chen