Patents by Inventor Jan Hendrikse

Jan Hendrikse has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20200335318
    Abstract: The present disclosure relates to systems and methods for transferring ions to a mass spectrometer. In one implementation, the system includes an ion source; a device for generating a solvent vapor; a unit for mixing the ions and the vapor; and a transfer tube coupled to the mass spectrometer. The mixing may cause solvent clusters to nucleate on the ions, and the transfer tube may couple the ion source and the mass spectrometer. Furthermore, the transfer tube may be configured to transfer the ions by using a gas flow and prevent the solvent clusters from contacting the tube wall by using thermophoresis.
    Type: Application
    Filed: January 31, 2018
    Publication date: October 22, 2020
    Inventors: Jan Hendrikse, John Daniel DeBord, Stephen Davila, Offie Lee Drennan
  • Publication number: 20200271557
    Abstract: A method for providing in situ chemical transformation and ionization of a portion (e.g., inorganic oxidizer) of a sample via an analyte detection system is disclosed herein. The method includes introducing a gas into an ionization some of the analyte detection system via an inlet. The method further includes generating ions within the ionization source and directing the gas and generated ions through and out of the ionization source and to the sample. The sample is located proximal to the ionization source in an ambient environment. The ions chemically react with the sample and desorb and ionize an analytic from the sample, the analyte being generated from the inorganic oxidizer, the desorbed analyte having a lower melting point and/or better desorption kinetics than the inorganic oxidizer. The method further includes receiving the desorbed analyte via an analyzer of the analyte detection system.
    Type: Application
    Filed: March 2, 2020
    Publication date: August 27, 2020
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 10578526
    Abstract: A method for providing in situ chemical transformation and ionization of a portion (e.g., inorganic oxidizer) of a sample via an analyte detection system is disclosed herein. The method includes introducing a gas into an ionization source of the analyte detection system via an inlet. The method further includes generating ions within the ionization source and directing the gas and generated ions through and out of the ionization source and to the sample. The sample is located proximal to the ionization source in an ambient environment. The ions chemically react with the sample and desorb and ionize an analyte from the sample, the analyte being generated from the inorganic oxidizer, the desorbed analyte having a lower melting point and/or better desorption kinetics than the inorganic oxidizer. The method further includes receiving the desorbed analyte via an analyzer of the analyte detection system.
    Type: Grant
    Filed: July 24, 2014
    Date of Patent: March 3, 2020
    Assignee: SMITHS DETECTION MONTREAL INC.
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 10345264
    Abstract: The present disclosure relates to an ion exchange process, as well as a process and system for detecting nitrates, which employ a class of dopants comprising at least two functional groups capable of simultaneous convergent hydrogen bonding with a nitrate ion.
    Type: Grant
    Filed: April 28, 2016
    Date of Patent: July 9, 2019
    Assignee: SMITHS DETECTION MONTREAL INC.
    Inventors: Jan Hendrikse, Vladimir Romanov, Udo Verkerk, Alan Hopkinson
  • Patent number: 10109471
    Abstract: A sample inlet device and methods for use of the sample inlet device are described that include an ion funnel having a plurality of electrodes with apertures arranged about an axis extending from an inlet of the ion funnel to an outlet of the ion funnel, the ion funnel including a plurality of spacer elements disposed coaxially with the plurality of electrodes, each of the plurality of spacer elements being positioned between one or two adjacent electrodes, each of the plurality of spacer elements having an aperture with a diameter that is greater than a diameter of each adjacent electrode. The ion funnel is configured to pass an ion sample through the apertures of the electrodes and the spacer elements to additional portions of a detection system, such as to a mass analyzer system and detector.
    Type: Grant
    Filed: February 6, 2017
    Date of Patent: October 23, 2018
    Assignee: Smith Detection, Inc.
    Inventors: Vadym Berkout, Jan Hendrikse
  • Publication number: 20180136165
    Abstract: The present disclosure relates to an ion exchange process, as well as a process and system for detecting nitrates, which employ a class of dopants comprising at least two functional groups capable of simultaneous convergent hydrogen bonding with a nitrate ion.
    Type: Application
    Filed: April 28, 2016
    Publication date: May 17, 2018
    Inventors: Jan Hendrikse, Vladimir Romanov, Udo Verkerk, Alan Hopkinson
  • Patent number: 9972482
    Abstract: A concentric APCI surface ionization probe, supersonic sampling tube, and method for use of the concentric APCI surface ionization probe and supersonic sampling tube are described. In an embodiment, the concentric APCI surface ionization probe includes an outer tube, an inner capillary, and a voltage source coupled to the outer tube and the inner capillary. The inner capillary is housed within and concentric with the outer tube such that ionized gas (e.g., air) travels out of the outer tube, reacts with a sample, and the resulting analyte ions are sucked into the inner capillary. A supersonic sampling tube can include a tube coupled to a mass spectrometer and/or concentric APCI surface ionization probe, where the tube includes at least one de Laval nozzle.
    Type: Grant
    Filed: June 27, 2017
    Date of Patent: May 15, 2018
    Assignee: Smiths Detection Montreal Inc.
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Publication number: 20170365455
    Abstract: A concentric APCI surface ionization probe, supersonic sampling tube, and method for use of the concentric APCI surface ionization probe and supersonic sampling tube are described. In an embodiment, the concentric APCI surface ionization probe includes an outer tube, an inner capillary, and a voltage source coupled to the outer tube and the inner capillary. The inner capillary is housed within and concentric with the outer tube such that ionized gas (e.g., air) travels out of the outer tube, reacts with a sample, and the resulting analyte ions are sucked into the inner capillary. A supersonic sampling tube can include a tube coupled to a mass spectrometer and/or concentric APCI surface ionization probe, where the tube includes at least one de Laval nozzle.
    Type: Application
    Filed: June 27, 2017
    Publication date: December 21, 2017
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 9728389
    Abstract: A concentric APCI surface ionization probe, supersonic sampling tube, and method for use of the concentric APCI surface ionization probe and supersonic sampling tube are described. In an embodiment, the concentric APCI surface ionization probe includes an outer tube, an inner capillary, and a voltage source coupled to the outer tube and the inner capillary. The inner capillary is housed within and concentric with the outer tube such that ionized gas (e.g., air) travels out of the outer tube, reacts with a sample, and the resulting analyte ions are sucked into the inner capillary. A supersonic sampling tube can include a tube coupled to a mass spectrometer and/or concentric APCI surface ionization probe, where the tube includes at least one de Laval nozzle.
    Type: Grant
    Filed: November 14, 2014
    Date of Patent: August 8, 2017
    Assignee: Smiths Detection Montreal Inc.
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 9564305
    Abstract: A sample inlet device and methods for use of the sample inlet device are described that include an ion funnel having a plurality of electrodes with apertures arranged about an axis extending from an inlet of the ion funnel to an outlet of the ion funnel, the ion funnel including a plurality of spacer elements disposed coaxially with the plurality of electrodes, each of the plurality of spacer elements being positioned between one or two adjacent electrodes, each of the plurality of spacer elements having an aperture with a diameter that is greater than a diameter of each adjacent electrode. The ion funnel is configured to pass an ion sample through the apertures of the electrodes and the spacer elements to additional portions of a detection system, such as to a mass analyzer system and detector.
    Type: Grant
    Filed: July 29, 2014
    Date of Patent: February 7, 2017
    Assignee: Smiths Detection Inc.
    Inventors: Vadym Berkout, Jan Hendrikse
  • Publication number: 20160268116
    Abstract: A concentric APCI surface ionization probe, supersonic sampling tube, and method for use of the concentric APCI surface ionization probe and supersonic sampling tube are described. In an embodiment, the concentric APCI surface ionization probe includes an outer tube, an inner capillary, and a voltage source coupled to the outer tube and the inner capillary. The inner capillary is housed within and concentric with the outer tube such that ionized gas (e.g., air) travels out of the outer tube, reacts with a sample, and the resulting analyte ions are sucked into the inner capillary. A supersonic sampling tube can include a tube coupled to a mass spectrometer and/or concentric APCI surface ionization probe, where the tube includes at least one de Laval nozzle.
    Type: Application
    Filed: November 14, 2014
    Publication date: September 15, 2016
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Publication number: 20160161379
    Abstract: A method for providing in situ chemical transformation and ionization of a portion (e.g., inorganic oxidizer) of a sample via an analyte detection system is disclosed herein. The method includes introducing a gas into an ionization source of the analyte detection system via an inlet. The method further includes generating ions within the ionization source and directing the gas and generated ions through and out of the ionization source and to the sample. The sample is located proximal to the ionization source in an ambient environment. The ions chemically react with the sample and desorb and ionize an analyte from the sample, the analyte being generated from the inorganic oxidizer, the desorbed analyte having a lower melting point and/or better desorption kinetics than the inorganic oxidizer. The method further includes receiving the desorbed analyte via an analyzer of the analyte detection system.
    Type: Application
    Filed: July 24, 2014
    Publication date: June 9, 2016
    Inventors: Jan HENDRIKSE, Vladimir ROMANOV
  • Publication number: 20160035556
    Abstract: A sample inlet device and methods for use of the sample inlet device are described that include an ion funnel having a plurality of electrodes with apertures arranged about an axis extending from an inlet of the ion funnel to an outlet of the ion funnel, the ion funnel including a plurality of spacer elements disposed coaxially with the plurality of electrodes, each of the plurality of spacer elements being positioned between one or two adjacent electrodes, each of the plurality of spacer elements having an aperture with a diameter that is greater than a diameter of each adjacent electrode. The ion funnel is configured to pass an ion sample through the apertures of the electrodes and the spacer elements to additional portions of a detection system, such as to a mass analyzer system and detector.
    Type: Application
    Filed: July 29, 2014
    Publication date: February 4, 2016
    Inventors: Vadym Berkout, Jan Hendrikse
  • Publication number: 20150371807
    Abstract: A surface ionization source comprises a tube having a first end, a second end, and an interior bore extending through the tube from the first end to the second end. The first end of the tube is configured to receive a flow of gas and the second end of the tube is configured to direct the flow of gas onto a surface configured to hold an analyte. A radioactive source is at least substantially disposed in the interior bore of the tube. The radioactive source is configured to form ions in the flow of gas as the flow of gas passes through the interior bore. The flow of gas containing the ions is directed onto the analyte to at least partially ionize the analyte.
    Type: Application
    Filed: January 30, 2014
    Publication date: December 24, 2015
    Applicant: SMITHS DETECTION MONTREAL INC.
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 9134208
    Abstract: A sample introduction system configured for introducing analytes of a solid phase micro extraction (SPME) sample into an analytical instrument system (e.g., mass spectrometer) is described. The sample introduction system includes a pressure vessel configured with an inlet port via which a probe portion (e.g., SPME fiber) of a SPME assembly is received into a sealed volume of the pressure vessel. The probe portion of the SPME assembly is coated with an extracting phase material, the analytes being absorbed into and/or adsorbed onto the extracting phase material. The pressure vessel is configured for providing an environment in which desorption of the analytes from the extracting phase material occurs at a gaseous pressure which is substantially less than atmospheric pressure (e.g., less than 100 mTorr). The desorbed analytes are then directed to the vacuum chamber of the analytical instrument system via an outlet port of the pressure vessel.
    Type: Grant
    Filed: July 31, 2012
    Date of Patent: September 15, 2015
    Assignee: Smiths Detection Montreal Inc.
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 9048077
    Abstract: A mass spectrometry system for screening a sample for one or more analytes includes a pre-mass spectrometry screening apparatus configured to pre-screen an ionized sample to generate output correlated to the composition of the sample, and a mass spectrometer. A sample gate is opened to allow flow of at least a portion of the ionized sample to the mass spectrometer and closed to prevent flow of the ionized sample to the mass spectrometer. A processing system compares results of the pre-mass spectrometry screening to an analyte database, wherein correlation of the results to an analyte within the analyte database comprises a preliminary positive identification. When the processing system determines that a preliminary positive identification is made, it causes the gate to open for a period of time. However, when the processing system determines that a preliminary positive identification is not made, it causes the gate to remain closed.
    Type: Grant
    Filed: December 5, 2012
    Date of Patent: June 2, 2015
    Assignee: SMITHS DETECTION MONTREAL INC.
    Inventor: Jan Hendrikse
  • Publication number: 20140339417
    Abstract: A mass spectrometry system for screening a sample for one or more analytes includes a pre-mass spectrometry screening apparatus configured to pre-screen an ionized sample to generate output correlated to the composition of the sample, and a mass spectrometer. A sample gate is opened to allow flow of at least a portion of the ionized sample to the mass spectrometer and closed to prevent flow of the ionized sample to the mass spectrometer. A processing system compares results of the pre-mass spectrometry screening to an analyte database, wherein correlation of the results to an analyte within the analyte database comprises a preliminary positive identification. When the processing system determines that a preliminary positive identification is made, it causes the gate to open for a period of time. However, when the processing system determines that a preliminary positive identification is not made, it causes the gate to remain closed.
    Type: Application
    Filed: December 5, 2012
    Publication date: November 20, 2014
    Applicant: Smiths Detection Montreal Inc.
    Inventor: Jan Hendrikse
  • Publication number: 20140033835
    Abstract: A sample introduction system configured for introducing analytes of a solid phase micro extraction (SPME) sample into an analytical instrument system (e.g., mass spectrometer) is described. The sample introduction system includes a pressure vessel configured with an inlet port via which a probe portion (e.g., SPME fiber) of a SPME assembly is received into a sealed volume of the pressure vessel. The probe portion of the SPME assembly is coated with an extracting phase material, the analytes being absorbed into and/or adsorbed onto the extracting phase material. The pressure vessel is configured for providing an environment in which desorption of the analytes from the extracting phase material occurs at a gaseous pressure which is substantially less than atmospheric pressure (e.g., less than 100 mTorr). The desorbed analytes are then directed to the vacuum chamber of the analytical instrument system via an outlet port of the pressure vessel.
    Type: Application
    Filed: July 31, 2012
    Publication date: February 6, 2014
    Inventors: Jan Hendrikse, Vladimir Romanov
  • Patent number: 7750312
    Abstract: An apparatus and method is disclosed for reducing contamination in a mass spectrometer instrument system. The system includes an ion source at a first pressure for generating ions by laser desorption/ionization and an inlet aperture to a vacuum chamber at a second, lower pressure than the first pressure of the ion source. A sample plate within the ion source supports a sample deposited thereon and a laser can be configured to generate laser pulses striking at least a portion of the sample at an angle of incidence from about 0 to about 80 degrees to the center line of a first ion optical axis of a mass analyzer, producing a plume. A combination of the angle of incidence of the laser pulses and the distance between the sample plate and the inlet region aperture can reduce neutral contaminants in the plume from being drawn into the inlet aperture.
    Type: Grant
    Filed: February 28, 2007
    Date of Patent: July 6, 2010
    Assignee: DH Technologies Development Pte. Ltd.
    Inventors: John J. Corr, Jan Hendrikse
  • Publication number: 20080067409
    Abstract: An apparatus and method is disclosed for reducing contamination in a mass spectrometer instrument system. The system includes an ion source at a first pressure for generating ions by laser desorption/ionization and an inlet aperture to a vacuum chamber at a second, lower pressure than the first pressure of the ion source. A sample plate within the ion source supports a sample deposited thereon and a laser can be configured to generate laser pulses striking at least a portion of the sample at an angle of incidence from about 0 to about 80 degrees to the center line of a first ion optical axis of a mass analyzer, producing a plume. A combination of the angle of incidence of the laser pulses and the distance between the sample plate and the inlet region aperture can reduce neutral contaminants in the plume from being drawn into the inlet aperture.
    Type: Application
    Filed: February 28, 2007
    Publication date: March 20, 2008
    Applicants: Applera Corporation, MDS Inc.
    Inventors: John J. Corr, Jan Hendrikse