Patents by Inventor Jean-Philippe Choiniere

Jean-Philippe Choiniere has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10755401
    Abstract: An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.
    Type: Grant
    Filed: December 4, 2018
    Date of Patent: August 25, 2020
    Assignee: General Electric Company
    Inventors: Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard, Jean-Philippe Choiniere, Marc-Andre Marois, Stephane Harel, John Karigiannis
  • Publication number: 20200175669
    Abstract: An inspection system includes one or more imaging devices and one or more processors. The imaging devices generate a first set of images of a work piece at a first position relative to the work piece and a second set of images of the work piece at a second position relative to the work piece. At least some of the images in the first and second sets are acquired using different light settings. The processors analyze the first set of images to generate a first prediction image associated with the first position, and analyze the second set of images to generate a second prediction image associated with the second position. The first and second prediction images include respective candidate regions. The processors merge the first and second prediction images to detect at least one predicted defect in the work piece depicted in at least one of the candidate regions.
    Type: Application
    Filed: December 4, 2018
    Publication date: June 4, 2020
    Inventors: Xiao Bian, Arpit Jain, David Scott Diwinsky, Bernard Patrick Bewlay, Steeves Bouchard, Jean-Philippe Choiniere, Marc-Andre Marois, Stephane Harel, John Karigiannis
  • Patent number: 10060857
    Abstract: A system includes one or more processors configured to create a projection matrix based on a three-dimensional (3D) model of a part and sensor data associated with a workpiece in a workspace of a robotic manipulator. The projection matrix provides a mapping between sensor coordinates associated with the sensor data and 3D coordinates associated with the 3D model. The one or more processors are configured to identify a set of sensor coordinates from the sensor data corresponding to a feature indication associated with the workpiece, and to determine from the set of sensor coordinates a set of 3D coordinates using the projection matrix.
    Type: Grant
    Filed: November 16, 2017
    Date of Patent: August 28, 2018
    Assignee: General Electric Company
    Inventors: Steeves Bouchard, Stephane Harel, John Karigiannis, Nicolas Saudrais, David Cantin, Ser Nam Lim, Maxime Beaudoin Pouliot, Jean-Philippe Choiniere