Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.

Abstract: A clamp circuit comprises an output transistor and a replica transistor coupled as a current minor pair, wherein the replica transistor is scaled in size to the output transistor by a size ratio; a first current source configured to set a current in the replica transistor, wherein the output current is set at a clamped output current value that is a sum of current of the first current source and a scaled value of the current of the first current source determined according to the size ratio; and a register circuit, wherein a register value stored in the register circuit sets the clamped output current value.

Abstract: An automated testing system comprises a high side switch circuit coupled to an input/output (I/O) connection, a low side switch circuit coupled to the I/O connection, a high side force amplifier (HFA) coupled to the high side switch, a low side force amplifier (LFA) coupled to the low side switch, an adjusting circuit coupled to the HFA and the LFA, and a control circuit configured to change the adjusting circuit to change control of current at the I/O connection from one of the HFA or LFA to the other of the HFA or LFA.

Abstract: Techniques are provided for changing a range of an output circuit with little or no voltage or current glitch. In an example, a method of changing a range of an output signal can include providing a first level of the output signal at an output of a first amplifier based on a received setpoint signal and receiving a range change command. In response to the range change command an input of a second amplifier can be shorted to an output of the second amplifier for a first interval. At the end of the first interval and over a second interval, a first impedance between the input of the second amplifier and the output of the second amplifier can be increased, and a second impedance between the input of the second amplifier and the setpoint signal can be increased.

Abstract: Techniques are provided for changing a range of an output circuit with little or no voltage or current glitch. In an example, a method of changing a range of an output signal can include providing a first level of the output signal at an output of a first amplifier based on a received setpoint signal and receiving a range change command. In response to the range change command an input of a second amplifier can be shorted to an output of the second amplifier for a first interval. At the end of the first interval and over a second interval, a first impedance between the input of the second amplifier and the output of the second amplifier can be increased, and a second impedance between the input of the second amplifier and the setpoint signal can be increased.

Abstract: Apparatus and methods to increase the range of a signal processing circuit. A system uses floating bias circuits coupled to a signal processing circuit to increase the range of power supplies that can be used with the signal processing circuit, while maintaining the components of the signal processing circuit within a breakdown voltage threshold. As the voltage level of the data signal varies, the voltage level of the floating bias circuits varies as well.