Patents by Inventor Jeroen Smeenk

Jeroen Smeenk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10792877
    Abstract: Provided is a validation tool and a method for validating optical equipment that is used for measuring a plurality of characteristics of one or more tyre components during winding application of said tyre components around a tyre building drum, wherein a first tyre component of the one or more tyre components includes a first characteristic of the plurality of characteristics which, after measuring, is overlapped by the same or another tyre component of the one or more tyre components including a second characteristic of the plurality of characteristics, wherein the validation tool is provided with a first reference element that is arranged to represent the first characteristic and a second reference element that is arranged to represent the second characteristic, wherein the second reference element is offset with respect to the first reference element to at least partially expose the first reference element.
    Type: Grant
    Filed: January 15, 2016
    Date of Patent: October 6, 2020
    Assignee: VMI HOLLAND B.V.
    Inventors: Mattheus Jacobus Kaagman, Jeroen Smeenk, Niels Tielenburg, John Van De Vrugt
  • Publication number: 20170368777
    Abstract: Provided is a validation tool and a method for validating optical equipment that is used for measuring a plurality of characteristics of one or more tyre components during winding application of said tyre components around a tyre building drum, wherein a first tyre component of the one or more tyre components includes a first characteristic of the plurality of characteristics which, after measuring, is overlapped by the same or another tyre component of the one or more tyre components including a second characteristic of the plurality of characteristics, wherein the validation tool is provided with a first reference element that is arranged to represent the first characteristic and a second reference element that is arranged to represent the second characteristic, wherein the second reference element is offset with respect to the first reference element to at least partially expose the first reference element.
    Type: Application
    Filed: January 15, 2016
    Publication date: December 28, 2017
    Inventors: Mattheus Jacobus Kaagman, Jeroen Smeenk, Niels Tielenburg, John Van De Vrugt