Patents by Inventor Jih-Jeen Chen

Jih-Jeen Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7159161
    Abstract: A test method for a plurality of circuits respectively having inputs for greatly reducing the required test time and the control circuit complexity is provided. The method includes steps of providing a set of test patterns for detecting a characteristic of the circuits, providing a common data line, and electrically connecting the circuit inputs to the common data line so that the test pattern can be broadcasted to the circuits through the common data line. The present invention also provides an architecture for implementing such method.
    Type: Grant
    Filed: May 19, 2003
    Date of Patent: January 2, 2007
    Assignee: National Science Council
    Inventors: Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang
  • Publication number: 20040153921
    Abstract: A test method for a plurality of circuits respectively having inputs for greatly reducing the required test time and the control circuit complexity is provided. The method includes steps of providing a set of test patterns for detecting a characteristic of the circuits, providing a common data line, and electrically connecting the circuit inputs to the common data line so that the test pattern can be broadcasted to the circuits through the common data line. The present invention also provides an architecture for implementing such method.
    Type: Application
    Filed: May 19, 2003
    Publication date: August 5, 2004
    Applicant: National Science Council
    Inventors: Kuen-Jong Lee, Jih-Jeen Chen, Cheng-Hua Huang