Patents by Inventor Jochen M. Horn

Jochen M. Horn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8049873
    Abstract: A surgical microscopy system is provided wherein an optical coherence tomography facility is integrated into a microscopy system. A beam of measuring light formed by collimating optics of an OCT system is deflected by a beam scanner, traverses imaging optics, and is reflected by a reflector such that the beam of measuring light traverses an objective lens of microscopy optics and is directed to an object region of the microscopy optics. A position of the beam of measuring light being incident on the reflector is substantially independent on a direction into which the beam of measuring light is deflected by the beam scanner. When traveling through the beam scanner, the beam of measuring light is comprised of a bundle of substantially parallel light rays.
    Type: Grant
    Filed: March 18, 2009
    Date of Patent: November 1, 2011
    Assignee: Carl Zeiss Meditec AG
    Inventors: Christoph Hauger, Markus Seesselberg, Keith O'Hara, Yue Qiu, Xing Wei, Jochen M. Horn, Peter Reimer
  • Publication number: 20090257065
    Abstract: A surgical microscopy system is provided wherein an optical coherence tomography facility is integrated into a microscopy system. A beam of measuring light formed by collimating optics of an OCT system is deflected by a beam scanner, traverses imaging optics, and is reflected by a reflector such that the beam of measuring light traverses an objective lens of microscopy optics and is directed to an object region of the microscopy optics. A position of the beam of measuring light being incident on the reflector is substantially independent on a direction into which the beam of measuring light is deflected by the beam scanner. When traveling through the beam scanner, the beam of measuring light is comprised of a bundle of substantially parallel light rays.
    Type: Application
    Filed: March 18, 2009
    Publication date: October 15, 2009
    Applicants: Carl Zeiss Surgical GmbH, Carl Zeiss Meditec, Inc.
    Inventors: Christoph Hauger, Markus Seesselberg, Keith O'Hara, Yue Qiu, Xing Wei, Jochen M. Horn, Peter Reimer
  • Patent number: 6575572
    Abstract: Embodiments of the present invention provide a method and apparatus for measurement of aberration of an eye. One or more embodiments provide an aberration measurement instrument that enables measurement wherein Hartmann-Shack spots have reduced speckle; one or more embodiments provide an aberration measurement instrument that enables measurement of an eye having a large diopter power variation over different zones of the eye; one or more embodiments provide an aberration measurement instrument that enables measurement with accommodation control; one or more embodiment provide an aberration measurement instrument wherein radiation reflected by a cornea and radiation scattered by intra-ocular elements are blocked; and one or more embodiment provide an aberration measurement instrument wherein a hazy background produced by radiation multiply scattered within an eye is reduced.
    Type: Grant
    Filed: September 21, 2001
    Date of Patent: June 10, 2003
    Assignee: Carl Zeiss Ophthalmic Systems, Inc.
    Inventors: Ming Lai, Jay Wei, Scott A. Meyer, James P. Foley, Jochen M. Horn
  • Publication number: 20030058403
    Abstract: Embodiments of the present invention provide a method and apparatus for measurement of aberration of an eye. One or more embodiments provide an aberration measurement instrument that enables measurement wherein Hartmann-Shack spots have reduced speckle; one or more embodiments provide an aberration measurement instrument that enables measurement of an eye having a large diopter power variation over different zones of the eye; one or more embodiments provide an aberration measurement instrument that enables measurement with accommodation control; one or more embodiment provide an aberration measurement instrument wherein radiation reflected by a cornea and radiation scattered by intra-ocular elements are blocked; and one or more embodiment provide an aberration measurement instrument wherein a hazy background produced by radiation multiply scattered within an eye is reduced.
    Type: Application
    Filed: September 21, 2001
    Publication date: March 27, 2003
    Applicant: Carl Zeiss Ophthalmic Systems, Inc.
    Inventors: Ming Lai, Jay Wei, Scott A. Meyer, James P. Foley, Jochen M. Horn