John A. Gurley has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
Abstract: This invention is an enhanced probe positioning technique for Scanning Tunneling Microscopes, Atomic Force Microscopes, and other scanning probe microscopes. The invention has particular application for drift compensation. The invention adds a controllable motion to the probe that is totally independent of the scanning or other probe positioning. If the drift velocity is known, the invention can be used to compensate for the drift. In addition, several implementations are shown for measuring drift velocity. One method has the operator identify a significant feature of the acquired image on separate frames of data. The shift of this pattern or feature, along with the time between frames, can be used to calculate the drift velocity. Two methods are described that utilize the frequency shift of the image spatial spectrum due to the effect of the drift velocity on bi-directional scans. Another method is described that derives drift velocity and direction from the correlation of separate frames of data.
July 26, 1990
Date of Patent:
December 31, 1991
Digital Instruments, Inc.
Virgil B. Elings, John A. Gurley, Mark R. Rodgers
Abstract: A scanning tunneling microscope is corrected in real time for coupling effects from the scanning electrodes or bias voltage circuit of the microscope on the tunneling current. In an automatic embodiment, a test voltage waveform is applied to the scanning electrodes or bias voltage circuit, the system determines the correction required and corrects the tunneling current signal. A method enables the operator to verify the correction. In other embodiments, predetermined values of the parameters of the coupling effects are entered by the operator; the system determines the correction required from these values and corrects the tunneling current signal with this correction; the correction is verified, and the operator enters an adjustment of the values, if the corrections did not sufficiently correct for the coupling effects.
Abstract: In a scanning device producing an image from data obtained from a nonlinear piezoelectric scanner having an attached end and a free end providing the data from a lateral scanning motion of the free end a distance about a center position as a result of the connection of a changing scan voltage to elecrodes carried by the piezoelectric scanner, a method of making the scanning motion of the free end linear with time and increasing the speed at which the data is provided for producing the image.
Abstract: This is an atomic force microscope in which the sensor can be built as a very small integrated structure. The sensor utilizes optical interference and can be operated in either the contact mode for high resolution or in the non-contact mode to measure electric and magnetic fields. One configuration of this microscope is a stand-alone configuration in which the microscope can be placed on or be suspended above large samples for sanning of small local areas thereof. The sensor is built into a scanner so that the sensor can be scanned over a stationary sample.
November 28, 1989
Date of Patent:
June 25, 1991
Digital Instruments, Inc.
Virgil B. Elings, John A. Gurley, Dror Sarid
Abstract: A feedback control system for enhancing the feedback loop characteristics of a vertical axis control in a scanning tunneling microscope or the like, including a tip member for positioning relative to a surface for measuring the topography of the surface. A horizontal control coupled to the tip for providing a plurality of adjacent horizontal scans across the surface. A vertical control coupled to the tip for providing a vertical control of the tip during the plurality of adjacent horizontal scans. A local error signal produced in accordance with the vertical position of the tip relative to the surface in real time during the plurality of adjacent horizontal scans.
Abstract: A piezoelectric positioning device for controlling the three dimensional horizontal and vertical movement of a tip relative to the sample in a scanning tunneling microscope. A thin walled cone or cylinder shaped member formed of piezoelectric material having an outer surface and an inner surface. A tip member positioned at the bottom of the cone or cylindrical member. A plurality of substantially similar electrode members positioned around one of the surfaces of the cone or cylinder shaped member to form opposite pairs of electrodes to control the horizontal movement of the tip in two of the three dimensions in accordance with voltages applied to the pairs of electrodes. A unitary member positioned around the other of the surfaces of the cone or cylinder shaped member to form a unitary electrode to control the vertical movement of the tip in the third dimension in accordance with voltage applied to the unitary electrode.