Patents by Inventor John D. Tomisek

John D. Tomisek has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8213001
    Abstract: A method and apparatus of the present invention determines whether zero, one, or a plurality of microscope slide coverslips are about to be applied to a microscope slide. Light, such as ultraviolet light, may be directed toward a coverslip testing region, in which a number of coverslips reside. The amount of light passing through the coverslip testing region is collected and measured. Based on the measured amount, the method and apparatus determine the number of coverslips present in the coverslip testing region.
    Type: Grant
    Filed: December 18, 2009
    Date of Patent: July 3, 2012
    Assignee: Abbott Laboratories
    Inventors: John D. Tomisek, Robert W. Jaekel, Ronald E. Kukla, Russell L. Sage, Shahin Iqbal
  • Publication number: 20100165326
    Abstract: A method and apparatus of the present invention determines whether zero, one, or a plurality of microscope slide coverslips are about to be applied to a microscope slide. Light, such as ultraviolet light, may be directed toward a coverslip testing region, in which a number of coverslips reside. The amount of light passing through the coverslip testing region is collected and measured. Based on the measured amount, the method and apparatus determine the number of coverslips present in the coverslip testing region.
    Type: Application
    Filed: December 18, 2009
    Publication date: July 1, 2010
    Inventors: John D. Tomisek, Robert W. Jaekel, Ronald E. Kukla, Russell L. Sage, Shahin Iqbal
  • Patent number: 5198670
    Abstract: A system for in-situ measurement of the radioactivity of multiple samples while the samples are in a multiple-well sample tray, with a scintillator in each sample-containing well for producing light pulses in response to radiation from the respective samples. Multiple photomultiplier tubes are positioned adjacent to the sample wells containing the scintillator for simultaneously measuring the radioactivity of multiple samples with only a single photomultiplier tube sensing the scintillations from each well and converting the sensed scintillations into corresponding electrical pulses. The electrical pulses from each photomultiplier tube are processed to discriminate between pulses attributable to sample events within the wells and pulses attributable to non-sample events such as photomultipler tube noise.
    Type: Grant
    Filed: September 29, 1989
    Date of Patent: March 30, 1993
    Assignee: Packard Instrument Company
    Inventors: Gustaaf C. VanCauter, Donald E. Osten, John D. Tomisek
  • Patent number: 4633088
    Abstract: Apparatus and a method for determining a quench-indicating parameter of a test sample utilizing a liquid scintillation counter are disclosed. The number of counts in a spectrum resulting from subtraction of a spectrum generated without an external source of radiation from a spectrum generated with an external source of radiation is utilized. The total number of counts is cumulatively summed from a higher energy level to a lower energy level and a curve representing this sum is generated. A portion of this curve is fitted with a function such as a straight line and the intersection of that function with the zero count axis is the intersection energy level which is an indication of the measure of quench of the test sample.
    Type: Grant
    Filed: April 8, 1985
    Date of Patent: December 30, 1986
    Assignee: Packard Instrument Co., Inc.
    Inventors: Donald K. Jones, John D. Tomisek, Harry M. Young