Patents by Inventor Joseph Kileel

Joseph Kileel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11557034
    Abstract: Systems and methods are described for the fully automatic, template-free locating and extracting of a plurality of two-dimensional projections of particles in a micrograph image. A set of reference images is automatically assembled from a micrograph image by analyzing the image data in each of a plurality of partially overlapping windows and identifying a subset of windows with image data satisfying at least one statistic criterion compared to other windows. A normalized cross-correlation is then calculated between the image data in each reference image and the image data in each of a plurality of query image windows. Based on this cross-correlation analysis, a plurality of locations in the micrograph is automatically identified as containing a two-dimensional projection of a different instance of the particle of the first type. The two-dimensional projections identified in the micrograph are then used to determine the three-dimensional structure of the particle.
    Type: Grant
    Filed: June 13, 2018
    Date of Patent: January 17, 2023
    Assignee: The Trustees of Princeton University
    Inventors: Amit Singer, Ayelet Heimowitz, Joakim Anden, Yuehaw Khoo, Joseph Kileel
  • Publication number: 20200167913
    Abstract: Systems and methods are described for the fully automatic, template-free locating and extracting of a plurality of two-dimensional projections of particles in a micrograph image. A set of reference images is automatically assembled from a micrograph image by analyzing the image data in each of a plurality of partially overlapping windows and identifying a subset of windows with image data satisfying at least one statistic criterion compared to other windows. A normalized cross-correlation is then calculated between the image data in each reference image and the image data in each of a plurality of query image windows. Based on this cross-correlation analysis, a plurality of locations in the micrograph is automatically identified as containing a two-dimensional projection of a different instance of the particle of the first type. The two-dimensional projections identified in the micrograph are then used to determine the three-dimensional structure of the particle.
    Type: Application
    Filed: June 13, 2018
    Publication date: May 28, 2020
    Inventors: Amit Singer, Ayelet Heimowitz, Joakim Anden, Yuehaw Khoo, Joseph Kileel