Abstract: Provided are CT scanning systems and architectures that utilize a unique approach to scanning large objects. Various embodiments of the architecture incorporate a horizontally mounted CT gantry. The horizontal gantry can be raised or stored in a raised position so that a pallet or other object can be moved into a scanning position under the gantry. The gantry is then lowered to enable a quickly executed a scan. Addition objects can be quickly positioned (once the gantry is raised) for subsequent scans allowing for greater throughput than conventional approaches.

Abstract: Provided are CT scanning systems and architectures that utilize a unique approach to scanning large objects. Various embodiments of the architecture incorporate a scanning platform and a turntable. The scanning platform may be mounted horizontally. The vertical offset between the scanning platform and the turntable may be changed during a scan. A pallet or other object can be moved into a scanning area under the scanning platform. Both the vertical offset between the scanning platform and the turntable may be changed and the turntable may be rotated during a scan. Scan data may be used to generate a three dimensional image. Additional objects can be quickly positioned (once the vertical offset is adjusted) for subsequent scans allowing for greater throughput than conventional approaches.

Abstract: Provided are CT scanning systems and architectures that utilize a unique approach to scanning large objects. Various embodiments of the architecture incorporate a scanning platform and a turntable. The scanning platform may be mounted horizontally. The vertical offset between the scanning platform and the turntable may be changed during a scan. A pallet or other object can be moved into a scanning area under the scanning platform. Both the vertical offset between the scanning platform and the turntable may be changed and the turntable may be rotated during a scan. Scan data may be used to generate a three dimensional image. Additional objects can be quickly positioned (once the vertical offset is adjusted) for subsequent scans allowing for greater throughput than conventional approaches.

Abstract: The application discloses a system and methods for remote access and analysis of data collected about items under inspection. The system includes one or more data collection stations, each of which may include an X-ray scanner that scans the items under inspection to obtain data about the items. The data is transmitted to one or more remote stations, where the data is remotely analyzed to determine whether the item contains a potential threat, such as, for example, explosives or other contraband. Data may be aggregated so that correlations between data collected for different items may be used to more accurately detect threats.