Patents by Inventor Juergen Heidmann

Juergen Heidmann has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9978407
    Abstract: A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).
    Type: Grant
    Filed: July 20, 2017
    Date of Patent: May 22, 2018
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Publication number: 20170316795
    Abstract: A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).
    Type: Application
    Filed: July 20, 2017
    Publication date: November 2, 2017
    Inventor: Juergen Heidmann
  • Patent number: 9778329
    Abstract: A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The probe tip is scanned over an area of a sample with an electric charge, such as a field effect transistor or flash memory. Optically Detected Spin Resonance (ODMR) is measured as the probe tip is scanned over the area of the sample, from which a characteristic of the area of the sample with the electric charge may be determined.
    Type: Grant
    Filed: June 10, 2016
    Date of Patent: October 3, 2017
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Patent number: 9779769
    Abstract: A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).
    Type: Grant
    Filed: November 25, 2015
    Date of Patent: October 3, 2017
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Patent number: 9482612
    Abstract: A crystal film with nitrogen vacancy centers is placed in close proximity to a photon emitter. Excitation illumination is produced to cause the nitrogen vacancy centers to produce photoluminescence. Illumination is produced by the photon emitter, which may be near field or far field and which quenches the photoluminescence intensity using an effect known as Stimulated Emission Depletion (STED). The quenching caused by the photon emitter is detected and analyzed to determine characteristics of the photon emitter. The analysis takes into account the characteristic dependence of the STED on the depletion light power, i.e. the photon source, and a spatial distribution of the light intensity. The analysis may be applied to spatially resolved measurements or an integral value of the photoluminescence quenching. The analysis may determine characteristics such as peak power, power scaling factor, and FWHM of the illumination profile of the photon emitter.
    Type: Grant
    Filed: November 14, 2014
    Date of Patent: November 1, 2016
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Patent number: 9472217
    Abstract: A crystal film with one or more nitrogen vacancy centers is placed in close proximity to a recording head. A magnetic field or heat produced by the recording head as well as excitation illumination and an excitation field is applied to the crystal film. The magnetic field produced by the recording head, the heat produced by a thermal device on the recording head, and/or the excitation field may be varied. A confocal microscope or wide-field microscope optically detects a decrease in a spin dependent photoluminescence in response to the magnetic field or heat, excitation field and excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center to measure Optically Detected Spin Resonance (ODMR). A characteristic of the recording head is determined using the ODMR.
    Type: Grant
    Filed: November 4, 2014
    Date of Patent: October 18, 2016
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Publication number: 20160282427
    Abstract: A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The probe tip is scanned over an area of a sample with an electric charge, such as a field effect transistor or flash memory. Optically Detected Spin Resonance (ODMR) is measured as the probe tip is scanned over the area of the sample, from which a characteristic of the area of the sample with the electric charge may be determined.
    Type: Application
    Filed: June 10, 2016
    Publication date: September 29, 2016
    Inventor: Juergen Heidmann
  • Publication number: 20160139048
    Abstract: A crystal film with nitrogen vacancy centers is placed in close proximity to a photon emitter. Excitation illumination is produced to cause the nitrogen vacancy centers to produce photoluminescence. Illumination is produced by the photon emitter, which may be near field or far field and which quenches the photoluminescence intensity using an effect known as Stimulated Emission Depletion (STED). The quenching caused by the photon emitter is detected and analyzed to determine characteristics of the photon emitter. The analysis takes into account the characteristic dependence of the STED on the depletion light power, i.e. the photon source, and a spatial distribution of the light intensity. The analysis may be applied to spatially resolved measurements or an integral value of the photoluminescence quenching. The analysis may determine characteristics such as peak power, power scaling factor, and FWHM of the illumination profile of the photon emitter.
    Type: Application
    Filed: November 14, 2014
    Publication date: May 19, 2016
    Inventor: Juergen Heidmann
  • Publication number: 20160077167
    Abstract: A diamond probe is suitable to be attached to an Atomic Force Microscope and is created with a tip that incorporates a one or more Nitrogen Vacancy (NV) centers located near the end of the tip. The probe arm acts as an optical waveguide to propagate the emission from the NV center with high efficiency and a beveled end directs excitation light to the NV center and directs photoluminescence light emanating from the NV center into the probe arm. The light source (or a portion of the light source), a detector, as well as an RF antenna, if used, may be mounted to the probe arm. The probe with integrated components enable excitation of photoluminescence in the NV center as well as optically detected Electron Spin Resonance (ODMR) and temperature measurements, and may further serve as a light probe utilizing the physical effect of Stimulated Emission Depletion (STED).
    Type: Application
    Filed: November 25, 2015
    Publication date: March 17, 2016
    Inventor: Juergen Heidmann
  • Publication number: 20160071532
    Abstract: A crystal film with one or more nitrogen vacancy centers is placed in close proximity to a recording head. A magnetic field or heat produced by the recording head as well as excitation illumination and an excitation field is applied to the crystal film. The magnetic field produced by the recording head, the heat produced by a thermal device on the recording head, and/or the excitation field may be varied. A confocal microscope or wide-field microscope optically detects a decrease in a spin dependent photoluminescence in response to the magnetic field or heat, excitation field and excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center to measure Optically Detected Spin Resonance (ODMR). A characteristic of the recording head is determined using the ODMR.
    Type: Application
    Filed: November 4, 2014
    Publication date: March 10, 2016
    Inventor: Juergen Heidmann
  • Patent number: 9194908
    Abstract: A metrology device optically measures the electrical conductivity of a magnetic sample, such as a Tunneling Magnetoresistance (TMR) or Giant-Magneto Resistance (GMR) device, using Time Domain Thermo Reflectance (TDTR) to measure a cooling curve for the sample while a magnetic field is applied to the sample. The thermal conductivity of the sample may be determined using the cooling curve and the variation of the cooling curve with varying applied magnetic fields is measured. The electrical conductivity is determined for the sample in the magnetic field based on the thermal conductivity. If desired, single reflectance changes may be measured at a particular delay after heating, and the reflectance change at this delay may be used to determine the electrical conductivity. Of particular interest is the amount of change in electric conductivity for a given applied magnetic field because this yields a measure of the sensitivity of the sensor.
    Type: Grant
    Filed: March 13, 2013
    Date of Patent: November 24, 2015
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Publication number: 20150235661
    Abstract: A crystal film with one or more nitrogen vacancy centers is placed in close proximity to a recording head. A magnetic field or heat produced by the recording head as well as excitation illumination and an excitation field is applied to the crystal film. The magnetic field produced by the recording head, the heat produced by a thermal device on the recording head, and/or the excitation field may be varied. A confocal microscope or wide-field microscope optically detects a decrease in a spin dependent photoluminescence in response to the magnetic field or heat, excitation field and excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center to measure Optically Detected Spin Resonance (ODMR). A characteristic of the recording head is determined using the ODMR.
    Type: Application
    Filed: November 4, 2014
    Publication date: August 20, 2015
    Inventor: Juergen Heidmann
  • Patent number: 8885301
    Abstract: A crystal film with one or more nitrogen vacancy centers is placed in a magnetic field produced by a recording head and excitation illumination and a varying excitation field is applied. A confocal microscope or wide-field microscope optically detects a decrease in a spin dependent photoluminescence in response to the excitation illumination caused by electron spin resonance (ESR) of the at least one nitrogen vacancy center at varying excitation frequencies of the excitation field to measure Optically Detected Spin Resonance (ODMR). A characteristic of the recording head is determined using the ODMR.
    Type: Grant
    Filed: February 19, 2014
    Date of Patent: November 11, 2014
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Publication number: 20140133284
    Abstract: A polarization microscope optically detects the effect of the magnetic field from a sub-optical resolution magnetic structure on a magneto-optical transducer. The magneto-optical transducer includes a magnetic layer with a magnetization that is changed by the magnetic field produced by the magnetic structure. The saturation field of the magnetic layer is sufficiently lower than the magnetic field produced by the magnetic structure that the area of magnetization change in the magnetic layer is optically resolvable by the polarization microscope. A probe may be used to provide a current to the sample to produce the magnetic field. By analyzing the optically detected magnetization, one or more characteristics of the sample may be determined. A magnetic recording storage layer may be deposited over the magnetic layer, where a magnetic field produced by the sample is written to the magnetic recording storage layer to effect the magnetization of the magnetic layer.
    Type: Application
    Filed: January 15, 2014
    Publication date: May 15, 2014
    Applicant: INFINITUM SOLUTIONS, INC.
    Inventor: Juergen Heidmann
  • Patent number: 8659291
    Abstract: A polarization microscope optically detects the effect of the magnetic field from a sub-optical resolution magnetic structure on a magneto-optical transducer. The magneto-optical transducer includes a magnetic layer with a magnetization that is changed by the magnetic field produced by the magnetic structure. The saturation field of the magnetic layer is sufficiently lower than the magnetic field produced by the magnetic structure that the area of magnetization change in the magnetic layer is optically resolvable by the polarization microscope. A probe may be used to provide a current to the sample to produce the magnetic field. By analyzing the optically detected magnetization, one or more characteristics of the sample may be determined. A magnetic recording storage layer may be deposited over the magnetic layer, where a magnetic field produced by the sample is written to the magnetic recording storage layer to effect the magnetization of the magnetic layer.
    Type: Grant
    Filed: December 29, 2009
    Date of Patent: February 25, 2014
    Assignee: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Publication number: 20130257461
    Abstract: A metrology device optically measures the electrical conductivity of a magnetic sample, such as a Tunneling Magnetoresistance (TMR) or Giant-Magneto Resistance (GMR) device, using Time Domain Thermo Reflectance (TDTR) to measure a cooling curve for the sample while a magnetic field is applied to the sample. The thermal conductivity of the sample may be determined using the cooling curve and the variation of the cooling curve with varying applied magnetic fields is measured. The electrical conductivity is determined for the sample in the magnetic field based on the thermal conductivity. If desired, single reflectance changes may be measured at a particular delay after heating, and the reflectance change at this delay may be used to determine the electrical conductivity. Of particular interest is the amount of change in electric conductivity for a given applied magnetic field because this yields a measure of the sensitivity of the sensor.
    Type: Application
    Filed: March 13, 2013
    Publication date: October 3, 2013
    Applicant: Infinitum Solutions, Inc.
    Inventor: Juergen Heidmann
  • Patent number: 8427929
    Abstract: A property, such as a quality parameter, of a write pole in a write head is determined using an optical metrology device, where the write pole is smaller than the optical resolution limit of the metrology device. The metrology device produces polarized light that is reflected off the write pole while the write pole is magnetized either during or after excitation with a write current. The magnetization alters the polarization state of the light, which can be analyzed to transform the altered polarization state into intensity. The intensity of the light is detected over the point spread function of the optics in the metrology device and an intensity value is generated. The intensity value is used to determine the quality parameter of the write pole, e.g., by comparison to a threshold or reference intensity value, which may be generated empirically or theoretically.
    Type: Grant
    Filed: September 7, 2011
    Date of Patent: April 23, 2013
    Assignee: Infinitum Solutions, Inc.
    Inventors: Henry Patland, Juergen Heidmann, Wade A. Ogle, Alexander M. Taratorin
  • Patent number: 8289818
    Abstract: A magneto-optical transducer including a magnetic layer on a transparent, non-magnetic substrate is used to characterize the performance of a write head based on optically detected magnetization in the magnetic layer. The write head sample is held in contact with or near the magnetic layer, which is illuminated through the substrate with linearly polarized light. Magnetization in the write head produces a magnetization in the magnetic layer, which alters the polarization state in reflected light. The reflected light is analyzed and the intensity detected using an optical detector, such as one or more photo-detectors or a camera. The performance of the write head can then be characterized using the detected intensity.
    Type: Grant
    Filed: November 16, 2011
    Date of Patent: October 16, 2012
    Assignee: Infinitum Solutions, Inc.
    Inventors: Alexander M. Taratorin, Juergen Heidmann
  • Publication number: 20120092972
    Abstract: A magneto-optical transducer including a magnetic layer on a transparent, non-magnetic substrate is used to characterize the performance of a write head based on optically detected magnetization in the magnetic layer. The write head sample is held in contact with or near the magnetic layer, which is illuminated through the substrate with linearly polarized light. Magnetization in the write head produces a magnetization in the magnetic layer, which alters the polarization state in reflected light. The reflected light is analyzed and the intensity detected using an optical detector, such as one or more photo-detectors or a camera. The performance of the write head can then be characterized using the detected intensity.
    Type: Application
    Filed: November 16, 2011
    Publication date: April 19, 2012
    Applicant: Infinitum Solutions, Inc.
    Inventors: Alexander M. Taratorin, Juergen Heidmann
  • Publication number: 20120057446
    Abstract: A property, such as a quality parameter, of a write pole in a write head is determined using an optical metrology device, where the write pole is smaller than the optical resolution limit of the metrology device. The metrology device produces polarized light that is reflected off the write pole while the write pole is magnetized either during or after excitation with a write current. The magnetization alters the polarization state of the light, which can be analyzed to transform the altered polarization state into intensity. The intensity of the light is detected over the point spread function of the optics in the metrology device and an intensity value is generated. The intensity value is used to determine the quality parameter of the write pole, e.g., by comparison to a threshold or reference intensity value, which may be generated empirically or theoretically.
    Type: Application
    Filed: September 7, 2011
    Publication date: March 8, 2012
    Applicant: INFINITUM SOLUTIONS, INC.
    Inventors: Henry Patland, Juergen Heidmann, Wade A. Ogle, Alexander M. Taratorin