Patents by Inventor Kalman Kaufman

Kalman Kaufman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7423801
    Abstract: Apparatus for enhancing vision of a user includes a focal modulation device (22), which is adapted to focus light from objects in a field of view of the user onto the retina while alternating between at least first and second focal states that are characterized by different, respective first and second focal depths, at a rate in excess of a flicker-fusion frequency of the user.
    Type: Grant
    Filed: September 20, 2007
    Date of Patent: September 9, 2008
    Assignee: Invisia Ltd
    Inventors: Micha Kaufman, Kalman Kaufman
  • Publication number: 20080024858
    Abstract: Apparatus for enhancing vision of a user includes a focal modulation device (22), which is adapted to focus light from objects in a field of view of the user onto the retina while alternating between at least first and second focal states that are characterized by different, respective first and second focal depths, at a rate in excess of a flicker-fusion frequency of the user.
    Type: Application
    Filed: September 20, 2007
    Publication date: January 31, 2008
    Applicant: INVISIA LTD.
    Inventors: Micha Kaufman, Kalman Kaufman
  • Patent number: 7289260
    Abstract: Apparatus for enhancing vision of a user includes a focal modulation device (22), which is adapted to focus light from objects in a field of view of the user onto the retina while alternating between at least first and second focal states that are characterized by different, respective first and second focal depths, at a rate in excess of a flicker-fusion frequency of the user.
    Type: Grant
    Filed: August 30, 2004
    Date of Patent: October 30, 2007
    Assignee: Invisia Ltd.
    Inventors: Micha Kaufman, Kalman Kaufman
  • Publication number: 20070052876
    Abstract: Apparatus for enhancing vision of a user includes a focal modulation device (22), which is adapted to focus light from objects in a field of view of the user onto the retina while alternating between at least first and second focal states that are characterized by different, respective first and second focal depths, at a rate in excess of a flicker-fusion frequency of the user.
    Type: Application
    Filed: August 30, 2004
    Publication date: March 8, 2007
    Applicant: Invisia Ltd.
    Inventors: Micha Kaufman, Kalman Kaufman
  • Patent number: 6166601
    Abstract: A super-linear feedforward amplifier, for amplifying radio-frequency input signals produced in one or more frequency channels over an input band, includes a radio-frequency power amplifier, which amplifies the signals. A signal cancellation circuit loop generates an error signal responsive to distortion products in the amplified signals. A digital correction block digitally equalizes the input signals responsive to a transfer function of the amplifier, whereby the input signals are substantially canceled out of the error signal over the entire input band. An error cancellation circuit loop subtracts the error signal from the amplified signals to generate a linearized output signal.
    Type: Grant
    Filed: January 7, 1999
    Date of Patent: December 26, 2000
    Assignee: WiseBand Communications Ltd.
    Inventors: Yuval Shalom, Danny Arison, Kalman Kaufman
  • Patent number: 5740953
    Abstract: A method and apparatus are described for cleaving a relatively thin semiconductor wafer for inspecting a target feature on a workface thereof by: producing, on a first lateral face of the semiconductor wafer, laterally of the workface on one side of the target feature, an indentation in alignment with the target feature; and inducing by impact, in a second lateral face of the semiconductor wafer, laterally of the workface on the opposite side of the target feature, a shock wave substantially in alignment with the target feature and the indentation on the first lateral face, to split the semiconductor wafer along a cleavage plane essentially coinciding with the target feature and the indentation.
    Type: Grant
    Filed: May 17, 1994
    Date of Patent: April 21, 1998
    Assignee: Sela Semiconductor Engineering Laboratories
    Inventors: Colin Smith, Kalman Kaufman, Isaac Mazor, Elik Chen, Dan Vilenski
  • Patent number: 5112129
    Abstract: A method whereby the image produced in a coherence probe microscope is modified by means of a certain specific additive electronic transformation for the purpose of improving the measurement of selected features. The technique improves measurement accuracy on optically complex materials, in particular it improves the accuracy of linewidth measurement on semiconductor linewidths.
    Type: Grant
    Filed: March 2, 1990
    Date of Patent: May 12, 1992
    Assignee: KLA Instruments Corporation
    Inventors: Mark Davidson, Kalman Kaufman, Isaac Mazor