Abstract: A magnetic head having an air bearing surface (ABS) and a first pole tip. A second pole tip is spaced apart from and facing the upper end of the first pole tip across a write gap. A bump extends into a portion of the upper end of the first pole tip and a portion of the bottom end of the second pole tip, the bump being positioned away from the ABS. The bump defines a throat height of the first and second pole tips.

Abstract: A novel magnetic imaging microscope test system with high spatial (1–10 nm) and temporal (˜1 ns) resolution of the magnetic field is disclosed, as well as the system application for characterization of read and write heads for magnetic recording. The test system includes a scanner assembly and a work piece holder for holding a work piece to be tested. The scanner assembly and the work piece holder are positionable relative to each other at very fine resolution during scanning. A probe arm is cantilevered from the scanner assembly to bring a probe head into close proximity to the work piece holder. The probe head is configured scan a work piece in contacting engagement therewith so that a magnetic device on the probe head magnetically interacts with a magnetic field generating or magnetic field sensing device on the work piece. A probe head for use in the test system and a related test method are also disclosed.

Abstract: A magnetic head having an air bearing surface (ABS) and a first pole tip. A second pole tip is spaced apart from and facing the upper end of the first pole tip across a write gap. A bump extends into a portion of the upper end of the first pole tip and a portion of the bottom end of the second pole tip, the bump being positioned away from the ABS. The bump defines a throat height of the first and second pole tips.

Abstract: A novel magnetic imaging microscope test system with high spatial (1-10 nm) and temporal (˜1 ns) resolution of the magnetic field is disclosed, as well as the system application for characterization of read and write heads for magnetic recording. The test system includes a scanner assembly and a work piece holder for holding a work piece to be tested. The scanner assembly and the work piece holder are positionable relative to each other at very fine resolution during scanning. A probe arm is cantilevered from the scanner assembly to bring a probe head into close proximity to the work piece holder. The probe head is configured scan a work piece in contacting engagement therewith so that a magnetic device on the probe head magnetically interacts with a magnetic field generating or magnetic field sensing device on the work piece. A probe head for use in the test system and a related test method are also disclosed.