Abstract: A test circuit used for determining a fault in a memory device. The test circuit includes a read circuit configured to read memory cell contents in a memory device at a first time instant and second time instant. The test circuit includes a comparator that compares the contents at the first and second time instants. If the contents are different from one another, the comparator indicates that a fault has occurred. Test methods are also used to determine if a fault has occurred in a memory cell.

Abstract: A self-repairing SRAM and a method for reducing parametric failures in SRAM. On-chip leakage or delay monitors are employed to detect inter-die Vt process corners, in response to which the SRAM applies adaptive body bias to reduce the number of parametric failures in a die and improve memory yield. Embodiments include circuitry for applying reverse body bias (RBB) to the SRAM array in the presence of a low inter-die Vt process corner, thereby reducing possible read and hold failures, and applying forward body bias (FBB) to the array in the presence of a high inter-die Vt process corner, thereby reducing possible access and write failures.

Abstract: A logic synthesis method to apply supply gating to idle portions of general logic circuits in their active mode of operation to reduce power requirements and the circuits resulting therefrom. A Shannon expansion is utilized to determine idle portions and active portions of the general logic circuits.

Abstract: The present invention relates to a nanocomposite device comprising a polymeric matrix, semiconducting nanoparticles, and a semiconducting molecule having a field-effect mobility of at least 0.1 cm2/Vs. In addition, the present invention relates to a method of making a nanocomposite device. The method includes providing a mixture comprising a polymer, semiconducting nanoparticles, and a semiconducting molecule having a field-effect mobility of at least 0.1 cm2/Vs or a soluble precursor thereof, depositing the mixture on a substrate, and treating the mixture under conditions effective to produce a nanocomposite device comprising the polymeric matrix, semiconducting nanoparticles, and the semiconducting molecule having a field-effect mobility of at least 0.1 cm2/Vs. Thin film devices including the nanocomposite device are also disclosed.

Abstract: A device and method for increasing the read stability of a memory device includes sizing a sleep transistor according to a size ratio of the transistor relative to a driver transistor forming part of the memory device based on a static noise margin value. A leakage reduction circuit and method includes reducing a voltage via a current leakage of a transistor to track the leakage of the memory cells and generating a sleep signal if the voltage drops below a predetermined threshold.

Abstract: A circuit includes an input block and a combinational logic block. The input block has reconfigurable latches that are connected serially during testing times such that an output of one of the latches is connected to an input of a successive latch. The latches are directly connected to first level gates of the combinational logic block. The combinational logic block contains switches that prevent the propagation of signals through the combinational logic block during testing times other than when a desired vector is loaded into the latches. The switches disconnect the power and/or ground from the first level gates. The switches further connect the outputs of the first level gates to power or ground, depending on the type of transistors used in the first level gates. The switches alternatively delay the output through a pair of inverters and resupply the output to itself if refreshing the output is desired.

Abstract: A sense amplifier circuit includes a first double-gate metal oxide semiconductor field effect transistor (DGMOSFET) having a first gate defining a first input to the circuit, a second gate and an output being coupled to a first output of the circuit and a second DGMOSFET having a first gate defining a second input of the circuit, a second gate connected to the output of the first DGMOSFET and an output connected to the second gate of the first DGMOSFET, the output of the second DGMOSFET being coupled to a second output of the circuit.

Abstract: A test circuit used for determining a fault in a memory device. The test circuit includes a read circuit configured to read memory cell contents in a memory device at a first time instant and second time instant. The test circuit includes a comparator that compares the contents at the first and second time instants. If the contents are different from one another, the comparator indicates that a fault has occurred. Test methods are also used to determine if a fault has occurred in a memory cell.

Abstract: In one embodiment, a method for building wizard-style user interfaces (UIs) for a business task includes identifying a collection of metadata associated with the business task, and processing the collection of metadata to provide a set of wizard-style UIs pertaining to the business task.

Abstract: An apparatus and method are provided of forming a capacitor including carbon nanotubes.

Abstract: A sense amplifier circuit includes a first double-gate metal oxide semiconductor field effect transistor (DGMOSFET) having a first gate defining a first input to the circuit, a second gate and an output being coupled to a first output of the circuit and a second DGMOSFET having a first gate defining a second input of the circuit, a second gate connected to the output of the first DGMOSFET and an output connected to the second gate of the first DGMOSFET, the output of the second DGMOSFET being coupled to a second output of the circuit.

Abstract: A logic synthesis method to apply supply gating to idle portions of general logic circuits in their active mode of operation to reduce power requirements and the circuits resulting therefrom. A Shannon expansion is utilized to determine idle portions and active portions of the general logic circuits.

Abstract: A circuit includes an input block and a combinational logic block. The input block has reconfigurable latches that are connected serially during testing times such that an output of one of the latches is connected to an input of a successive latch. The latches are directly connected to first level gates of the combinational logic block. The combinational logic block contains switches that prevent the propagation of signals through the combinational logic block during testing times other than when a desired vector is loaded into the latches. The switches disconnect the power and/or ground from the first level gates. The switches further connect the outputs of the first level gates to power or ground, depending on the type of transistors used in the first level gates. The switches alternatively delay the output through a pair of inverters and resupply the output to itself if refreshing the output is desired.

Abstract: A FinFET semiconductor device includes a source region, a drain region, and a channel region defined therebetween. The source region, drain region, and channel region form a fin structure extending upwardly away from a substrate to a fin height greater than a standard minimum fin height.

Abstract: A device and method for increasing the read stability of a memory device includes sizing a sleep transistor according to a size ratio of the transistor relative to a driver transistor forming part of the memory device based on a static noise margin value. A leakage reduction circuit and method includes reducing a voltage via a current leakage of a transistor to track the leakage of the memory cells and generating a sleep signal if the voltage drops below a predetermined threshold.

Abstract: A 64-bit adder implemented in partially depleted silicon on insulator technology and having two levels of lookahead uses a dynamic eight-bit carry module containing a differential pass-gate evaluation tree employing a chain of source followers that feeds a sense amplifier, thereby obtaining benefits from high initial drive, low variation in body voltage, resulting in low variation in history-dependent delay, reduced noise sensitivity and noise-based delay.

Abstract: A semiconductor device for low power operation includes a channel region having a channel length greater than a standard minimum channel length. The voltage supply of the device is less than the threshold voltage of the device. A gate terminal of the device may have a raised height relative to a source and drain region of the device. In one embodiment, the semiconductor device is a double gate metal-oxide field effect transistor.

Abstract: A 64-bit adder implemented in partially depleted silicon on insulator technology and having two levels of lookahead uses a dynamic eight-bit carry module containing a cascode evaluation tree employing a chain of source followers that feeds a sense amplifier, thereby obtaining benefits from high initial drive, low variation in body voltage, resulting in low variation in history-dependent delay, reduced noise sensitivity and noise-based delay.

Abstract: A 64-bit adder implemented in partially depleted silicon on insulator technology and having two levels of lookahead uses a dynamic eight-bit carry module containing a cascode evaluation tree employing a chain of source followers that feeds a sense amplifier, thereby obtaining benefits from high initial drive, low variation in body voltage, resulting in low variation in history-dependent delay, reduced noise sensitivity and noise-based delay.

Abstract: A 64-bit adder implemented in partially depleted silicon on insulator technology and having two levels of lookahead uses a dynamic eight-bit carry module containing a differential pass-gate evaluation tree employing a chain of source followers that feeds a sense amplifier, thereby obtaining benefits from high initial drive, low variation in body voltage, resulting in low variation in history-dependent delay, reduced noise sensitivity and noise-based delay.