Patents by Inventor Kazuhiko Kawasaki

Kazuhiko Kawasaki has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7841591
    Abstract: A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
    Type: Grant
    Filed: October 31, 2008
    Date of Patent: November 30, 2010
    Assignee: Ricoh Comapny, Ltd.
    Inventors: Satoshi Ueda, Shingo Takai, Tatsuo Matsuda, Kazuhiko Kawasaki
  • Publication number: 20100199393
    Abstract: A probe microscope includes a cantilever having a probe, a displacement detecting optical system, an observation optical system, an objective lens, and a parallel glass. The displacement detecting optical system includes a first light source and a light detecting element. The observation optical system includes a second light source, an image forming lens, and a camera. The objective lens is disposed between the cantilever and the first and second light sources, and is commonly used by the displacement detecting optical system and the observation optical system. The parallel glass is capable of being inserted and retracted freely between the cantilever and the objective lens to adjust a focal point of the objective lens.
    Type: Application
    Filed: February 3, 2010
    Publication date: August 5, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Yoshimasa Suzuki, Kazuhiko Kawasaki, Satoshi Koga
  • Publication number: 20100164165
    Abstract: A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
    Type: Application
    Filed: March 9, 2010
    Publication date: July 1, 2010
    Inventors: Satoshi Ueda, Shingo Takai, Tatsuo Matsuda, Kazuhiko Kawasaki
  • Patent number: 7681439
    Abstract: A measuring apparatus comprising: a reference member held in fixed position and orientation with respect to a workpiece during measurement; a stylus for scanning a surface of the workpiece while being displaced upward and downward in accordance with unevenness of the surface of the workpiece; a displacement gauge for measuring a displacement of a specific part of the stylus relative to the reference member; and a scanner for causing the stylus to scan the workpiece along the surface; wherein the fixed position and orientation of the reference member with respect to the workpiece are not changed even during the operation of the scanner; the up-and-down displacement of the specific part of the stylus is measured relative to the reference member; a fine shape of the workpiece is detected in accordance with the measured displacement of the specific part of the stylus.
    Type: Grant
    Filed: August 22, 2007
    Date of Patent: March 23, 2010
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Satoshi Koga, Yoshimasa Suzuki
  • Publication number: 20100027028
    Abstract: An oblique incidence interferometer has favorable measurement accuracy while achieving miniaturization. The oblique incidence interferometer includes a light source that emits coherent light; a beam dividing unit that divides the coherent light from the light source into a measurement beam and a reference beam, polarizing directions of both beams being perpendicular to each other; a first beam folding unit that folds the measurement beam divided by the beam dividing unit to cause the folded measurement beam to be incident on the measurement object surface at a predetermined angle relative to the measurement object surface; a second beam folding unit that folds the measurement beam reflected by the measurement object surface; and a beam combining unit that combines the measurement beam folded by the second beam folding unit with the reference beam.
    Type: Application
    Filed: July 13, 2009
    Publication date: February 4, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Yutaka Kuriyama, Kazuhiko Kawasaki
  • Publication number: 20100026983
    Abstract: When the geometric distance L from the body of an interferometer to a target 110 is accurately measured from distance measurement values D1, D2 which are obtained by a lightwave interferometric measurement using laser beams of plural wavelengths ?1, ?2, while correcting the refractive index of air, the wavelengths of the laser beams are measured by using an optical comb generated from an optical comb generator 104. In this case, the oscillation wavelength of a variable wavelength laser 101 is measured by using the optical comb, and a feedback control is performed, whereby laser beams of plural predetermined wavelengths are obtained, or a variable wavelength laser is caused to oscillate at plural arbitrary wavelengths to obtain plural distance measurement values. The wavelengths (frequencies) of laser beams when the respective distance measurement values are obtained are measured by the optical comb, and used in calculation of the geometric distance.
    Type: Application
    Filed: July 29, 2009
    Publication date: February 4, 2010
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko KAWASAKI, Kaoru MIYATA
  • Publication number: 20090190941
    Abstract: An image forming apparatus is disclosed in which a guide member configured to guide a sheet to a nip section between a heating roller and a pressing roller is disposed close to the upstream side of the rollers and on the pressing roller side. A downstream end of the guide member is disposed on the heating roller side with respect to the nip surface between the rollers so that a header of the sheet to be printed is in contact with the heating roller first, and a downstream end of the fixing device introduction guide member is concavely curved.
    Type: Application
    Filed: January 22, 2009
    Publication date: July 30, 2009
    Inventors: Yasushi Hashimoto, Motoji Kurobane, Masami Takeshita, Kazuhiko Kawasaki
  • Patent number: 7511827
    Abstract: An interferometer comprises a wavelength-variable light source. A reference light and a measurement light are synthesized, and the synthesized light is split into a plurality of split lights. A certain phase difference is provided between the split lights through phase shifting optical members. A plurality of interference fringe images formed by the phase-shifted split lights are captured at an imaging unit. Biases, amplitudes and the amounts of phase shift of the interference fringes formed by the plurality of split lights are calculated, based on interference fringe intensities of the imaged interference fringes, which are obtained by disposing a calibrating substrate instead of the measuring object varying the wavelength of the emitted light to plural values, and operating the imaging unit to capture a plurality of images of interference fringes obtained by the split lights.
    Type: Grant
    Filed: April 27, 2006
    Date of Patent: March 31, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, David W. Sesko
  • Publication number: 20090072741
    Abstract: To provide a ceramic metal halide lamp having a rated lamp wattage of not less than 450 W, which will not cause flicker due to instable arc during operating of the lamp and early blacking of an arc tube.
    Type: Application
    Filed: February 17, 2006
    Publication date: March 19, 2009
    Applicant: GS YUASA CORPORATION
    Inventors: Kazuhiko Kawasaki, Shinji Taniguchi, Kuniaki Nakano
  • Publication number: 20090057990
    Abstract: A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
    Type: Application
    Filed: October 31, 2008
    Publication date: March 5, 2009
    Inventors: Satoshi Ueda, Shingo Takai, Tatsuo Matsuda, Kazuhiko Kawasaki
  • Patent number: 7499178
    Abstract: An oblique incidence interferometer is provided for applying a light at a certain angle from the normal to a measurement surface of a target to be measured and measuring a light reflected from the target. A beam splitter element and beam synthesizer element splits the light from a light source into a measurement light to be applied to the target and a reference light serving as the measurement reference. It also orthogonalizes the polarization directions of the measurement light reflected from the target and the reference light and synthesizes the lights. A three-way split prism splits the synthesized light into a plurality of split lights. Imaging units are provided to capture a plurality of interference fringe images formed in accordance with the plurality of split lights. A ¼-waveplate is provided on either one of an entry side and an exit side of the three-way split prism. Polarizers are provided on imaging surfaces of the imaging units.
    Type: Grant
    Filed: June 28, 2007
    Date of Patent: March 3, 2009
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, Reiya Ootao
  • Publication number: 20090021747
    Abstract: A shape measuring apparatus includes a probe for scanning across a surface to be measured, while vibrating up and down; a minute-vibration generation section for vibrating the probe up and down; a vertical movement control section for moving the probe up and down to keep a constant contact force or a constant distance between the surface to be measured and the probe; a scanning section for scanning the surface to be measured with the probe; a displacement sensor for measuring the vertical displacement of the probe and outputting a probe displacement signal; and a signal processing section for obtaining information about the contact force or the distance between the surface to be measured and the probe from a high-frequency component of the probe displacement signal, and for obtaining information about profile of the surface to be measured from a low-frequency component of the signal obtained when the surface to be measured is scanned such that the distance or the contact force is kept constant.
    Type: Application
    Filed: July 18, 2008
    Publication date: January 22, 2009
    Applicant: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Satoshi Koga, Yoshimasa Suzuki
  • Patent number: 7458570
    Abstract: A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
    Type: Grant
    Filed: September 12, 2005
    Date of Patent: December 2, 2008
    Assignee: Ricoh Printing Systems, Ltd.
    Inventors: Satoshi Ueda, Shingo Takai, Tatsuo Matsuda, Kazuhiko Kawasaki
  • Patent number: 7397570
    Abstract: A wavelength-variable light source is configured to emit a light with a wavelength (?), which is variable within a scan width (??). An interferometer has a coherent length (?L), which is determinable from (??) and (?). A controller determines an appropriate magnitude of the scan width (??) while a CCD camera captures a fringe image in an exposure time (Te), which is set longer than a time for wavelength scanning.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: July 8, 2008
    Assignee: Mitutoyo Corporation
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, David W. Sesko
  • Publication number: 20080047335
    Abstract: A measuring apparatus comprising: a reference member held in fixed position and orientation with respect to a workpiece during measurement; a stylus for scanning a surface of the workpiece while being displaced upward and downward in accordance with unevenness of the surface of the workpiece; a displacement gauge for measuring a displacement of a specific part of the stylus relative to the reference member; and a scanner for causing the stylus to scan the workpiece along the surface; wherein the fixed position and orientation of the reference member with respect to the workpiece are not changed even during the operation of the scanner; the up-and-down displacement of the specific part of the stylus is measured relative to the reference member; a fine shape of the workpiece is detected in accordance with the measured displacement of the specific part of the stylus.
    Type: Application
    Filed: August 22, 2007
    Publication date: February 28, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko Kawasaki, Satoshi Koga, Yoshimasa Suzuki
  • Publication number: 20080002212
    Abstract: An oblique incidence interferometer is provided for applying a light at a certain angle from the normal to a measurement surface of a target to be measured and measuring a light reflected from the target. A beam splitter element and beam synthesizer element splits the light from a light source into a measurement light to be applied to the target and a reference light serving as the measurement reference. It also orthogonalizes the polarization directions of the measurement light reflected from the target and the reference light and synthesizes the lights. A three-way split prism splits the synthesized light into a plurality of split lights. Imaging units are provided to capture a plurality of interference fringe images formed in accordance with the plurality of split lights. A ¼-waveplate is provided on either one of an entry side and an exit side of the three-way split prism. Polarizers are provided on imaging surfaces of the imaging units.
    Type: Application
    Filed: June 28, 2007
    Publication date: January 3, 2008
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, Reiya Ootao
  • Publication number: 20060262320
    Abstract: A wavelength-variable light source is configured to emit a light with a wavelength (?), which is variable within a scan width (??). An interferometer has a coherent length (?L), which is determinable from (??) and (?). A controller determines an appropriate magnitude of the scan width (??) while a CCD camera captures a fringe image in an exposure time (Te), which is set longer than a time for wavelength scanning.
    Type: Application
    Filed: May 15, 2006
    Publication date: November 23, 2006
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, David Sesko
  • Publication number: 20060250618
    Abstract: An interferometer comprises a wavelength-variable light source. A reference light and a measurement light are synthesized, and the synthesized light is split into a plurality of split lights. A certain phase difference is provided between the split lights through phase shifting optical members. A plurality of interference fringe images formed by the phase-shifted split lights are captured at an imaging unit. Biases, amplitudes and the amounts of phase shift of the interference fringes formed by the plurality of split lights are calculated, based on interference fringe intensities of the imaged interference fringes, which are obtained by disposing a calibrating substrate instead of the measuring object varying the wavelength of the emitted light to plural values, and operating the imaging unit to capture a plurality of images of interference fringes obtained by the split lights.
    Type: Application
    Filed: April 27, 2006
    Publication date: November 9, 2006
    Applicant: MITUTOYO CORPORATION
    Inventors: Kazuhiko Kawasaki, Yoshimasa Suzuki, David Sesko
  • Publication number: 20060012107
    Abstract: A sheet-supplying device has a sheet-accommodating tray, a raising/lowering unit, a first position sensor, a second position sensor, a controlling unit. The raising/lowering unit raises and lowers the sheet-accommodating tray substantially. The first position sensor detects a first position indicating a position in the stacked direction of one end portion of a topmost sheet stacked in the sheet-accommodating tray. The second position sensor detects a second position indicating a position in the stacked direction of another end portion of the topmost sheet. The controlling unit controls the raising/lowering unit to raise or lower the sheet-accommodating tray based on both the first position detected by the first position sensor and the second position detected by the second position sensor so that one end of the topmost sheet in the stacked status is positioned at a prescribed position in the stacked direction.
    Type: Application
    Filed: September 12, 2005
    Publication date: January 19, 2006
    Inventors: Satoshi Ueda, Shingo Takai, Tatsuo Matsuda, Kazuhiko Kawasaki
  • Patent number: 6552807
    Abstract: A phase shift interferometer (4) images a plurality of interference fringe images each generated from interference between a test light reflected at a test surface (3a) and a reference light reflected at an reference surface (5) by emitting a coherent light to both surfaces while varying a phase difference between the test light and the reference light from image to image. A surface shape analyzer (12) analyzes the plurality of interference fringe images taken by the phase shift interferometer (4) to obtain surface shape information of the test surface (3a). A typical plane computer (13) computes a typical plane of the test surface (3a) on the basis of the surface shape information obtained from the surface shape analyzer (12). An oblique angle computer (14) computes an oblique angle of the typical plane computed by the typical plane computer (13) to the reference surface (5).
    Type: Grant
    Filed: October 2, 2000
    Date of Patent: April 22, 2003
    Assignee: Mitutoyo Corporation
    Inventors: Naoki Mitsutani, Kazuhiko Kawasaki, Hiroshi Haino