Abstract: Provided are a quality control method, a quality control system, a management apparatus, an analyzer, and a quality control abnormality determination method in which measurement results of both a quality control substance and a specimen are sufficiently utilized to improve the quality of quality control. The quality control method used in a management apparatus which is connected via a network to an analyzer installed in each of a plurality of facilities includes obtaining, from an analyzer in each facility via a network, first quality control information obtained by measuring an artificially generated quality control substance, and second quality control information obtained by measuring a plurality of specimens by the analyzer in each facility; and outputting information concerning quality control of an analyzer in at least one facility, based on the obtained first quality control information and second quality control information.

Abstract: Provided are a quality control method, a quality control system, a management apparatus, an analyzer, and a quality control abnormality determination method in which measurement results of both a quality control substance and a specimen are sufficiently utilized to improve the quality of quality control. The quality control method used in a management apparatus which is connected via a network to an analyzer installed in each of a plurality of facilities includes obtaining, from an analyzer in each facility via a network, first quality control information obtained by measuring an artificially generated quality control substance, and second quality control information obtained by measuring a plurality of specimens by the analyzer in each facility; and outputting information concerning quality control of an analyzer in at least one facility, based on the obtained first quality control information and second quality control information.

Abstract: Provided are a quality control method, a quality control system, a management apparatus, an analyzer, and a quality control abnormality determination method in which measurement results of both a quality control substance and a specimen are sufficiently utilized to improve the quality of quality control. The quality control method used in a management apparatus which is connected via a network to an analyzer installed in each of a plurality of facilities includes obtaining, from an analyzer in each facility via a network, first quality control information obtained by measuring an artificially generated quality control substance, and second quality control information obtained by measuring a plurality of specimens by the analyzer in each facility; and outputting information concerning quality control of an analyzer in at least one facility, based on the obtained first quality control information and second quality control information.

Abstract: Provided are a quality control method, a quality control system, a management apparatus, an analyzer, and a quality control abnormality determination method in which measurement results of both a quality control substance and a specimen are sufficiently utilized to improve the quality of quality control. The quality control method used in a management apparatus which is connected via a network to an analyzer installed in each of a plurality of facilities includes obtaining, from an analyzer in each facility via a network, first quality control information obtained by measuring an artificially generated quality control substance, and second quality control information obtained by measuring a plurality of specimens by the analyzer in each facility; and outputting information concerning quality control of an analyzer in at least one facility, based on the obtained first quality control information and second quality control information.

Abstract: Provided is a plug detachment prevention structure, such that when a plug equipped with a plug terminal and a plug retaining section that covers a part of the plug terminal is connected to a jack provided inside a housing, the plug detachment prevention structure retains the plug retaining section to prevent the plug from detaching from the jack, wherein the plug detachment prevention structure is equipped with a ring-shaped elastic section composed of an elastic material in which the plug retaining section is pressure-inserted, and a frame section that is circularly mounted at an outer circumferential side of the elastic section, composed of a material harder than that of the elastic section and detachably attached on an outside of the housing.

Abstract: Provided is a plug detachment prevention structure, such that when a plug equipped with a plug terminal and a plug retaining section that covers a part of the plug terminal is connected to a jack provided inside a housing, the plug detachment prevention structure retains the plug retaining section to prevent the plug from detaching from the jack, wherein the plug detachment prevention structure is equipped with a ring-shaped elastic section composed of an elastic material in which the plug retaining section is pressure-inserted, and a frame section that is circularly mounted at an outer circumferential side of the elastic section, composed of a material harder than that of the elastic section and detachably attached on an outside of the housing.

Abstract: An electronic instrument includes an input device having a plurality of channels to each of which an audio signal is input. A demodulation device demodulates audio signals and converts the audio signals into digital signals that control the electronic instrument. The electronic instrument also includes a feeding device that feeds the digital signals to a sound source and a detection device that detects whether or not the audio signals in any of the plurality of channels are modulated by the digital signals. A controller controls the demodulation device, in cases where it has been detected that any of the audio signals are modulated by the digital signals, so as to demodulate the digital signals from the audio signals that have been input to the channels, such that another channel's audio signals that are not modulated by the digital signals are output to an audio output.

Abstract: An apparatus and method for detecting defects on a specimen includes an illumination optical unit which obliquely projects a laser onto a region which is longer in one direction on a surface of a specimen than in a transverse direction, a table unit which mounts the specimen and which is movable, a detection optical unit which detects light from the specimen illuminated by the laser with an image sensor while the table is moving, and a signal processor. The signal processor processes a signal outputted from the image sensor of the detection optical unit and converted to a digital signal and extracts defects of the specimen by comparing the converted digital signal with a reference digital signal. A display unit displays information of defects extracted by the signal processor.

Abstract: An electronic instrument includes an input device having a plurality of channels to each of which an audio signal is input. A demodulation device demodulates audio signals and converts the audio signals into digital signals that control the electronic instrument. The electronic instrument also includes a feeding device that feeds the digital signals to a sound source and a detection device that detects whether or not the audio signals in any of the plurality of channels are modulated by the digital signals. A controller controls the demodulation device, in cases where it has been detected that any of the audio signals are modulated by the digital signals, so as to demodulate the digital signals from the audio signals that have been input to the channels, such that another channel's audio signals that are not modulated by the digital signals are output to an audio output.

Abstract: An apparatus and method for detecting defects on a specimen includes an illumination optical unit which obliquely projects a laser onto a region which is longer in one direction on a surface of a specimen than in a transverse direction, a table unit which mounts the specimen and which is movable, a detection optical unit which detects light from the specimen illuminated by the laser with an image sensor while the table is moving, and a signal processor. The signal processor processes a signal outputted from the image sensor of the detection optical unit and converted to a digital signal and extracts defects of the specimen by comparing the converted digital signal with a reference digital signal. A display unit displays information of defects extracted by the signal processor.

Abstract: A processing method for semiconductor devices in a semiconductor fabrication line includes processing a substrate in a first processing apparatus, transferring the substrate processed in the first processing apparatus to a detecting apparatus without removal of the substrate from the semiconductor fabrication line while continuing fabrication of the semiconductor devices, detecting foreign particle defects on the substrate transferred to the detecting apparatus, and determining a foreign particle generation condition of the processing apparatus based on a data from the detecting.

Abstract: A semiconductor device producing method and a semiconductor device producing system employs a processing apparatus provided with a dust particle detecting apparatus. The dust particle detecting apparatus measures the condition of adhesion of dust particles adhering to a work at least before or after processing the work, manages the condition of incremental adhesion of dust particles to the work resulting from processing for each lot of works or for each work on the basis of the measured condition of adhesion of dust particles measured before or after processing the work, and determines the time when the processing apparatus is to be cleaned or the cycle of cleaning the processing apparatus on the basis of the managed condition of adhesion of dust particles.

Abstract: The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

Abstract: The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

Abstract: When an image scanner scans an image recorded on an advanced photo system™ film, it determines spectral transmittance of a portion of the film, which is not exposed but developed, then sets parameters, such as masking parameters and &ggr; correction parameters, to be used in image signal processes on the basis of the spectral characteristics. Thereafter, the image is read by a CCD and image data is outputted. The film scanner applies the image signal processes to the image data using the parameters set in accordance with the spectral transmittance.

Abstract: An image reading apparatus comprises a light source for illuminating an original, an imaging optical system for forming an image of the illuminated original on the focal plane of the system, and a sensor unit arranged in front of the focal plane. At least two infrared cut filters are arranged on the optical path between the light source and the sensor unit. Those infrared cut filters show respective spectral characteristics that are different from each other. The imaging optical system typically comprises a plurality of lenses and the infrared cut filters are arranged on at least two of the respective surfaces of the lenses.

Abstract: Embodiments of the present invention comprise an electronic system by which it is possible to have an accompaniment that automatically tracks the performance tempo of a performer. The system is equipped with a ROM in which a sequence of performance data that comprise a main performance composition that is to be performed by the performer is stored. The system receives input from the performer, for example, keystrokes of a keyboard, and the relative performance tempo of the performance by the performer is calculated with respect to a segment of the performance. An accompaniment is then generated by the system by comparing the detected tempo of the performance of the artist with the tempo of the reference performance that is stored in ROM. By knowing the difference in tempo between the reference piece stored in ROM and the piece as being performed by the performer, the system may then adjust the tempo of the accompaniment to match the tempo of the performance by the artist.

Abstract: The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

Abstract: The present invention provides data analysis stations respectively for a probing tester and an automatic particle inspection machine. And, in the data analysis station, the coordinates on which the disposition of the chips are described on a product basis are equal to those on which the locations of the defects are described. Further, the station provides a function of determining which of the chips each defect belongs to. These data analysis stations are connected through a communication line. The present invention is capable of analyzing the data on a chip basis, resulting in being able to grasp the relation between how the defects are caused on each chip and the product character of the chip.

Abstract: A system to automatically stop an automatic performance by means of automatic performance techniques in conformance with the performance by the performer and to alleviate the stress of the performer is described herein.