Patents by Inventor Kazuhiko Oka
Kazuhiko Oka has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 9645011Abstract: In the channeled spectroscopic polarimetry, a measurement error of a parameter showing a spectropolarization characteristic of a sample is effectively removed, the error being generated by various variations in retardation of a retarder depending upon the state of the sample. With attention being focused that the retardation of the retarder may be kept constant by stabilization of an incident direction of light that transmits through the retarder, the retarder was arranged on the light source side with respect to the sample so as to effectively remove an influence relative to a measurement error, such as variations in direction of a light ray due to the sample.Type: GrantFiled: December 10, 2010Date of Patent: May 9, 2017Assignees: Omron Corporation, National University Corporation Hokkaido UniversityInventors: Hiroshi Okabe, Kenichi Matoba, Kazuhiko Oka
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Patent number: 8368889Abstract: An imaging polarimeter optics unit comprising: a first polarization-sensitive beam-splitter optic, a retarder, a second polarization-sensitive beam-splitter optic, and an analyzer, through which input light passes in sequence, wherein the retarder and polarization-sensitive beam-splitters cause the input light to have optical components that provide different information about the state of polarization of the input beam is provided.Type: GrantFiled: April 11, 2008Date of Patent: February 5, 2013Assignee: The Arizona Board of Regents on Behalf of the University of ArizonaInventors: James T. Schwiegerling, Eustace Dereniak, Michael W. Kudenov, Haitao Luo, Kazuhiko Oka, Edward A. DeHoog
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Publication number: 20110080586Abstract: In the channeled spectroscopic polarimetry, a measurement error of a parameter showing a spectropolarization characteristic of a sample is effectively removed, the error being generated by various variations in retardation of a retarder depending upon the state of the sample. With attention being focused that the retardation of the retarder may be kept constant by stabilization of an incident direction of light that transmits through the retarder, the retarder was arranged on the light source side with respect to the sample so as to effectively remove an influence relative to a measurement error, such as variations in direction of a light ray due to the sample.Type: ApplicationFiled: December 10, 2010Publication date: April 7, 2011Inventors: HIRSOHI OKABE, Kenichi Matoba, Kazuhiko Oka
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Publication number: 20100271475Abstract: An imaging polarimeter optics unit comprising: a first polarization-sensitive beam-splitter optic, a retarder, a second polarization-sensitive beam-splitter optic, and an analyzer, through which input light passes in sequence, wherein the retarder and polarization-sensitive beam-splitters cause the input light to have optical components that provide different information about the state of polarization of the input beam is provided.Type: ApplicationFiled: April 11, 2008Publication date: October 28, 2010Inventors: James T. Schwiegerling, Eustace Dereniak, Michael W. Kudenov, Haitao Luo, Kazuhiko Oka, Edward A. Dehoog
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Patent number: 7796257Abstract: A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical system 10 and a measurement target (or a sample 100), and a calculation section 50 that calculates at least one matrix element of a Mueller matrix that indicates the optical characteristics of the measurement target based on the light intensity information relating to the measurement light and a theoretical expression for the light intensity of the measurement light. The light intensity information acquisition section 40 acquires the light intensity information relating to a plurality of the measurement lights obtained from the optical system 10 by changing setting of a principal axis direction of at least one of the optical elements.Type: GrantFiled: December 27, 2006Date of Patent: September 14, 2010Assignees: National University Corporation Tokyo University of Agriculture and Technology, National University Corporation Hokkaido UniversityInventors: Yukitoshi Otani, Kazuhiko Oka, Toshitaka Wakayama, Atsushi Taniguchi
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Patent number: 7623236Abstract: To effectively reduce a measurement error in a parameter indicating a state of spectroscopic polarization generated by variations in retardation of a retarder due to a temperature change or other factors, while holding a variety of properties of a channeled spectroscopic polarimeter. By noting that reference phase functions ?1(?) and ?2(?) are obtained by solving an equation from each vibration component contained in a channeled spectrum P(?), the reference phase functions ?1(?) and ?2(?) are calibrated concurrently with measurement of spectrometric Stokes parameters S0(?), S1(?), S2(?), and S3(?).Type: GrantFiled: January 11, 2006Date of Patent: November 24, 2009Assignees: National University Corporation Hokkaido University, OMRON CorporationInventors: Kazuhiko Oka, Atsushi Taniguchi, Hiroshi Okabe
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Publication number: 20090177098Abstract: The blood flow is examined by making multifractal analysis of a blood flow velocity distribution in a vascular network and detecting a deviation of the blood flow velocity distribution from the multifractal distribution. The blood flow velocity distribution is provided as an image by irradiating laser light to the vascular network, converging, by an imaging lens, scattered laser light rays by blood cells in the blood flowing through blood vessels, detecting, by a photodetector, a speckle pattern produced owing to random interference between the scattered laser light rays and calculating the rate of change with time lapse of each speckle in the speckle pattern.Type: ApplicationFiled: December 8, 2006Publication date: July 9, 2009Inventors: Kousuke Yakubo, Kazuhiko Yoshida, Hitoshi Fujii, Kazuhiko Oka, Satoshi Tanda, Ryuuji Morita
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Publication number: 20090051916Abstract: A measuring apparatus includes a light intensity information acquisition section 40 that acquires light intensity information relating to a measurement light containing a given band component, the measurement light having been modulated by optical elements included in an optical system 10 and a measurement target (or a sample 100), and a calculation section 50 that calculates at least one matrix element of a Mueller matrix that indicates the optical characteristics of the measurement target based on the light intensity information relating to the measurement light and a theoretical expression for the light intensity of the measurement light. The light intensity information acquisition section 40 acquires the light intensity information relating to a plurality of the measurement lights obtained from the optical system 10 by changing setting of a principal axis direction of at least one of the optical elements.Type: ApplicationFiled: December 27, 2006Publication date: February 26, 2009Inventors: Yukitoshi Otani, Kazuhiko Oka, Toshitaka Wakayama, Atsushi Taniguchi
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Patent number: 7336360Abstract: To effectively reduce a measurement error in a parameter indicating two-dimensional spatial distribution of a state of polarization generated by variations in retardation of a birefringent prism pair due to a temperature change or other factors, while holding a variety of properties of an imaging polarimetry using the birefringent prism pair. By noting that reference phase functions ?1(x, y) and ?2(x, y) are obtained by solving an equation from each vibration component contained in an intensity distribution I(x, y), the reference phase functions ?1(x, y) and ?2(x, y) are calibrated concurrently with measurement of two-dimensional spatial distribution S0(x, y), S1(x, y), S2(x, y), and S3(x, y) of Stokes parameters.Type: GrantFiled: February 13, 2006Date of Patent: February 26, 2008Assignees: National University Corporation Hokkaido University, Omron CorporationInventors: Kazuhiko Oka, Tomohiro Mizuno, Atsushi Taniguchi, Hiroshi Okabe
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Publication number: 20070030551Abstract: To effectively reduce a measurement error in a parameter indicating two-dimensional spatial distribution of a state of polarization generated by variations in retardation of a birefringent prism pair due to a temperature change or other factors, while holding a variety of properties of an imaging polarimetry using the birefringent prism pair. By noting that reference phase functions ?1(x, y) and ?2(x, y) are obtained by solving an equation from each vibration component contained in an intensity distribution I(x, y), the reference phase functions ?1(x, y) and ?2(x, y) are calibrated concurrently with measurement of two-dimensional spatial distribution S0(x, y), S1(x, y), S2(x, y), and S3(x, y) of Stokes parameters.Type: ApplicationFiled: February 13, 2006Publication date: February 8, 2007Inventors: Kazuhiko Oka, Tomohiro Mizuno, Atsushi Taniguchi, Hiroshi Okabe
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Publication number: 20060238759Abstract: In the channeled spectroscopic polarimetry, a measurement error of a parameter showing a spectropolarization characteristic of a sample is effectively removed, the error being generated by various variations in retardation of a retarder depending upon the state of the sample. With attention being focused on that the retardation of the retarder may be kept constant by stabilization of an incident direction of light that transmits through the retarder, the retarder was arranged on the light source side with respect to the sample so as to effectively remove an influence relative to a measurement error, such as variations in direction of a light ray due to the sample.Type: ApplicationFiled: March 24, 2006Publication date: October 26, 2006Inventors: Hiroshi Okabe, Kenichi Matoba, Kazuhiko Oka
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Publication number: 20060170921Abstract: To effectively reduce a measurement error in a parameter indicating a state of spectroscopic polarization generated by variations in retardation of a retarder due to a temperature change or other factors, while holding a variety of properties of a channeled spectroscopic polarimeter. By noting that reference phase functions ?1(?) and ?2(?) are obtained by solving an equation from each vibration component contained in a channeled spectrum P(?), the reference phase functions ?1(?) and ?2(?) are calibrated concurrently with measurement of spectrometric Stokes parameters S0(?), S1(?), S2(?), and S3(?).Type: ApplicationFiled: January 11, 2006Publication date: August 3, 2006Inventors: Kazuhiko Oka, Atsushi Taniguchi, Hiroshi Okabe