Abstract: A photoelectric conversion apparatus includes a plurality of avalanche diodes and a light shielding portion. The plurality of avalanche diodes is disposed in a semiconductor layer having a first surface and a second surface facing the first surface. The light shielding portion has an opening. The light shielding portion covers at least part of the first surface. Each of the plurality of avalanche diodes includes a first semiconductor region of a first conductivity type disposed at a first depth, and a second semiconductor region of a second conductivity type disposed at a second depth deeper than the first depth with respect to the second surface. The semiconductor layer includes a plurality of uneven structures provided on the first surface. In a planar view from a direction perpendicular to the first surface, the second semiconductor region overlaps the light shielding portion, and the first semiconductor region is included in the opening.

Abstract: An apparatus includes a plurality, of avalanche diodes disposed in a layer having a first surface and a second surface opposite the first surface, wherein the plurality of avalanche diodes each includes a first region of first conductivity type located at a first depth, a second region of second conductivity type located at a second depth greater than the first depth with respect to the second surface, and a third region of the second conductivity type located at a third depth greater than the second depth with respect to the second surface, wherein the layer includes a plurality of structures disposed in the first surface, and wherein the plurality of structures has an effective period less than hc/Ea(h: Planck's constant [J·s], c: speed of light [m/s], and Ea: a band gap of a substrate [J].

Abstract: A first avalanche diode including a first semiconductor region and a second avalanche diode including a second semiconductor region are provided, a first isolation portion is arranged between the first semiconductor region and the second semiconductor region, the first isolation portion is constituted by a third semiconductor region, or a fourth semiconductor regions and the third semiconductor regions arranged to sandwich the fourth semiconductor region in plan view, and in the fourth semiconductor regions, an impurity concentration Nd of the third semiconductor region, an impurity concentration Na of the fourth semiconductor region, an elementary electric charge q, a dielectric constant ? of a semiconductor, a potential difference V between a P-N junction of the third semiconductor region and the fourth semiconductor region, and a length D of the third semiconductor region sandwiched by the fourth semiconductor regions satisfy Expression 1.

Abstract: An avalanche photodiode has a first semiconductor region of a first conductivity type and a second semiconductor region of a second conductivity type, the first semiconductor region being a region where charges having the same polarity as that of signal charges are treated as majority carriers. A separator provided between a first photoelectric conversion element and a second photoelectric conversion element has a trench structure. A top surface of the trench structure is positioned between a top surface of the second semiconductor region and a bottom surface of the second semiconductor region.

Abstract: An apparatus includes a photodiode including an anode and a cathode, a switch connected to a node of one of the anode and the cathode and to a power supply line via which a driving voltage is supplied, and functioning to switch a resistance value between the node and the power supply line, and a generation unit configured to generate a pulse signal for controlling switching of the switch. The apparatus is operable in one of two modes including a first mode and a second mode, the second mode being usable in a lower luminance condition than a luminance condition in the first mode. In an exposure period for acquiring one frame of signals, the number of pulse signals in the second mode is smaller than in the first mode.

Abstract: A photoelectric conversion apparatus includes a plurality of avalanche photodiodes. Each of the plurality of avalanche photodiodes includes an avalanche multiplication unit formed by a first semiconductor region of a first conductivity type that is arranged at a first depth, and a second semiconductor region of a second conductivity type different from the first conductivity type and which is arranged at a second depth deeper than the first depth. A fourth semiconductor region at least one of a conductivity type and an impurity concentration of which is different from those of a third semiconductor region of the second conductivity type is arranged at a position shallower than the third semiconductor region, and a depth of a boundary portion between the third semiconductor region and the fourth semiconductor region is deeper than that of the avalanche multiplication unit.

Abstract: A semiconductor substrate has a first surface and a second surface which is opposite to the first surface. A photoelectric conversion portion has a PN junction configured with first and second semiconductor regions of different conductivity types. A buried portion is buried in the semiconductor substrate and includes an electrode and a dielectric member located between the electrode and the semiconductor substrate and in contact with the second semiconductor region. The second semiconductor region is located in a position deeper than the first semiconductor region. The buried portion is located to extend from a first surface to a position deeper than the first semiconductor region. Electric potentials are supplied to the first semiconductor region, the second semiconductor region, and the electrode in such a manner that an inversion layer occurring between the electrode and the second semiconductor region and the first semiconductor region are in contact with each other.

Abstract: A photoelectric conversion apparatus includes: a first substrate including an avalanche photodiode; and a second substrate, in which the first substrate and the second substrate are stacked on each other, and further includes: a temperature detection unit arranged in at least one of the first substrate and the second substrate and having an output characteristic depending on a temperature; and a temperature value generating circuit arranged outside the first substrate and configured to convert output from the temperature detection unit into a temperature value signal that is a signal indicating temperature information.

Abstract: An apparatus wherein, in plane view, a first semiconductor region of a first conductivity type overlaps at least a portion of a third semiconductor region, a second semiconductor region overlaps at least a portion of a fourth semiconductor region of a second conductivity type, a height of a potential of the third semiconductor region with respect to an electric charge of the first conductivity type is lower than that of the fourth semiconductor region, and a difference between a height of a potential of the first semiconductor region and that of the third semiconductor region is larger than a difference between a height of a potential of the second semiconductor region and that of the fourth semiconductor region.

Abstract: A system includes a light source configured to emit pulsed laser light, and a photodetection unit including a plurality of photoelectric conversion units arranged in a two-dimensional plane, wherein an emission timing of the light source and a detection timing of the photodetection unit are controlled by a timing control unit, wherein the photodetection unit detects scattered light on the two-dimensional plane, of the pulsed laser light emitted from the light source and entering an object, and wherein change of a refractive index of the object is estimated from change of light speed of the scattered light.

Abstract: An optical detection apparatus includes a trench isolation portion provided in a substrate and disposed between a plurality of photoelectric conversion elements. Each of the plurality of photoelectric conversion elements includes an avalanche diode. The avalanche diode includes a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type, and a third semiconductor region having an impurity concentration lower than impurity concentrations of the first and second semiconductor regions. The trench isolation portion includes a conductor and an insulator disposed between the conductor and the avalanche diode, and on a sidewall of the trench isolation portion, a second conductivity type layer is formed in which charges of the second conductivity type are accumulated, and the second conductivity type layer and the second semiconductor region are in contact with each other.

Abstract: A system that can acquire a larger amount of information is provided. In the disclosure, calculation processing is performed on a data set including a plurality of pieces of data each including light amount distribution information on a two-dimensional plane that is acquired by a detection unit and time information indicating a time at which the light amount distribution information is acquired. In the calculation processing, among vectors in traveling directions of observation target light, a vector component in a direction orthogonal to the two-dimensional plane is estimated from the data set.

Abstract: In a road type determination apparatus, an image information acquiring unit acquires image information in which an image of a travel road on which a vehicle is traveling is captured. A scene determining unit determines a traveling scene of the travel road based on the image information. An ordinary road likelihood calculating unit calculates an ordinary road likelihood that indicates that a type of the travel road of the vehicle is an ordinary road based on the traveling scene. A limited-access road likelihood calculating unit calculates a limited-access road likelihood that indicates that the type of the travel road of the vehicle is a limited-access road based on the traveling scene. A type determining unit determines the type of the travel road of the vehicle based on the ordinary road likelihood and the limited-access road likelihood.

Abstract: A light detection system includes a light detection unit including a plurality of photoelectric conversion portions and a calculation processing unit configured to execute calculation based on information acquired by the light detection unit, wherein the light detection unit acquires light amount distribution information of light based on an incident light beam incident on an object from a laser light source and light amount distribution information of light based on a reflected light beam reflected from the object in a two-dimensional plane, and the calculation processing unit calculates, from the light amount distribution information of light based on the incident light beam, the light amount distribution information of light, and time information, information about a normal vector with respect to a reflection plane of the object, and wherein the normal vector is a vector in three dimensions which includes a direction orthogonal to the two-dimensional plane.

Abstract: An apparatus wherein, in plane view, a first semiconductor region of a first conductivity type overlaps at least a portion of a third semiconductor region, a second semiconductor region overlaps at least a portion of a fourth semiconductor region of a second conductivity type, a height of a potential of the third semiconductor region with respect to an electric charge of the first conductivity type is lower than that of the fourth semiconductor region, and a difference between a height of a potential of the first semiconductor region and that of the third semiconductor region is larger than a difference between a height of a potential of the second semiconductor region and that of the fourth semiconductor region.

Abstract: A photoelectric conversion apparatus includes a photodiode, a generation circuit, a first control circuit, and a second control circuit. The photodiode is configured to perform avalanche multiplication. The generation circuit is configured to generate a control signal. The first control circuit is configured to be controlled by the control signal to be in a standby state where the avalanche multiplication by the photodiode is possible and in a recharging state for returning the photodiode having performed the avalanche multiplication to the standby state. The second control circuit is configured to count a number of periods in which the avalanche multiplication has occurred among a plurality of periods of the standby state by using the control signal and a signal corresponding to an output of the photodiode.

Abstract: A lane change assist apparatus comprises a standby operation device provided on a turn signal lever. The standby operation device outputs a state change request when the standby operation device is operated. The lane change assist apparatus changes its state from a non-standby state to a standby state in response to receiving the state change request. The lane change assist apparatus executes a lane change assist control when a state thereof has been changed to the standby state and receives the lane change assist request.

Abstract: A semiconductor substrate has a first surface and a second surface which is opposite to the first surface. A photoelectric conversion portion has a PN junction configured with first and second semiconductor regions of different conductivity types. A buried portion is buried in the semiconductor substrate and includes an electrode and a dielectric member located between the electrode and the semiconductor substrate and in contact with the second semiconductor region. The second semiconductor region is located in a position deeper than the first semiconductor region. The buried portion is located to extend from a first surface to a position deeper than the first semiconductor region. Electric potentials are supplied to the first semiconductor region, the second semiconductor region, and the electrode in such a manner that an inversion layer occurring between the electrode and the second semiconductor region and the first semiconductor region are in contact with each other.

Abstract: An apparatus wherein, in plane view, a first semiconductor region of a first conductivity type overlaps at least a portion of a third semiconductor region, a second semiconductor region overlaps at least a portion of a fourth semiconductor region of a second conductivity type, a height of a potential of the third semiconductor region with respect to an electric charge of the first conductivity type is lower than that of the fourth semiconductor region, and a difference between a height of a potential of the first semiconductor region and that of the third semiconductor region is larger than a difference between a height of a potential of the second semiconductor region and that of the fourth semiconductor region.

Abstract: A semiconductor substrate has a first surface and a second surface which is opposite to the first surface. A photoelectric conversion portion has a PN junction configured with first and second semiconductor regions of different conductivity types. A buried portion is buried in the semiconductor substrate and includes an electrode and a dielectric member located between the electrode and the semiconductor substrate and in contact with the second semiconductor region. The second semiconductor region is located in a position deeper than the first semiconductor region. The buried portion is located to extend from a first surface to a position deeper than the first semiconductor region. Electric potentials are supplied to the first semiconductor region, the second semiconductor region, and the electrode in such a manner that an inversion layer occurring between the electrode and the second semiconductor region and the first semiconductor region are in contact with each other.