Patents by Inventor Kazumasa Iwakawa

Kazumasa Iwakawa has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7376536
    Abstract: A method for investigating a cause of decrease in frequency of abnormality detections for a certain device mounted on a vehicle, wherein when a plurality of abnormality detection conditions are satisfied, the abnormality detection for the certain device is performed to determine if the certain device is in failure, the method includes (i) when the frequency of the abnormality detections is below a predetermined value, disabling one of the abnormality detection conditions; (ii) when the abnormality detection conditions except the disabled abnormality detection condition are satisfied, performing an abnormality detection for the certain device; (iii) repeating the step (ii) a plurality of times; and (iv) determining if the disabled abnormality detection condition at that time is the cause of the decrease in the frequency of the abnormality detections, based on frequency of the abnormality detections in the step (iii).
    Type: Grant
    Filed: March 29, 2006
    Date of Patent: May 20, 2008
    Assignee: Fujitsu Ten Limited
    Inventors: Masatoshi Watanabe, Shigeru Matsumoto, Koichi Ohgaki, Kazumasa Iwakawa
  • Publication number: 20060241831
    Abstract: A method for investigating a cause of decrease in frequency of abnormality detections for a certain device mounted on a vehicle, wherein when a plurality of abnormality detection conditions are satisfied, the abnormality detection for the certain device is performed to determine if the certain device is in failure, the method includes (i) when the frequency of the abnormality detections is below a predetermined value, disabling one of the abnormality detection conditions; (ii) when the abnormality detection conditions the one of which has been disabled are satisfied, performing an abnormality detection for the certain device; (iii) repeating the step (ii) a plurality of times; and (iv) determining if the disabled abnormality detection condition at that time is the cause of the decrease in the frequency of the abnormality detections, based on frequency of the abnormality detections in the step (iii).
    Type: Application
    Filed: March 29, 2006
    Publication date: October 26, 2006
    Applicant: Fujitsu Ten Limited
    Inventors: Masatoshi Watanabe, Shigeru Matsumoto, Koichi Ohgaki, Kazumasa Iwakawa