Patents by Inventor Kazunari Yoshimura
Kazunari Yoshimura has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20240077832Abstract: A process cartridge is detachably mountable to a main assembly of an electrophotographic image forming apparatus. The cartridge includes an electrophotographic photosensitive drum, a developing roller, a drum unit containing the drum, a developing unit containing the roller and being movable so the roller contacts and is spaced from the drum, and a first force receiver receiving a force from a main-assembly first force applier by movement of a door from open to closed positions when mounting the cartridge and a second force receiver movable from a stand-by position by movement of the first force receiver by a force received from the first force applier. The second force receiver takes a projected position receiving a force from the second force applier to move the developing unit so the roller moves out of contact with the drum, the projected position being higher than the stand-by position.Type: ApplicationFiled: November 10, 2023Publication date: March 7, 2024Inventors: Akira Yoshimura, Kazunari Murayama, Susumu Nittani, Atsushi Numagami
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Patent number: 7307410Abstract: The AC detection coil is a toroidal coil and includes plural radial-line conductors which are formed on a front face and a rear face of a substrate, conductive connection parts and conductive through-holes which connect electrically each end of radial-line conductors, wherein plural winding turns are consecutively formed by a connection of each radial-line conductor on the front and the rear faces, respectively, and include a forward coil and a backward coil, and each shape on the front and the rear faces of the radial-line conductors and the conductive connection parts are identical with each other. Consequently, when seen from a thickness direction of the substrate, areas of the forward coil and the backward coil are equal to each other, and an external, unneeded to be detected, magnetic field can be canceled each other by the forward coil and the backward coil, then a current detection accuracy can be improved.Type: GrantFiled: November 21, 2006Date of Patent: December 11, 2007Assignee: Matsushita Electric Works, Ltd.Inventors: Akimi Shiokawa, Eiji Iwami, Yasuo Ichimura, Akihiro Ishibashi, Kazunari Yoshimura
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Publication number: 20070152651Abstract: The alternating current detection coil is a toroidal coil, and comprises plural radial-line conductors which are formed on a front face and a rear face of a substrate, conductive connection parts and conductive through-holes which connect electrically each end of radial-line conductors, wherein plural winding turns are consecutively formed by a connection of each radial-line conductor on the front face and the rear face respectively, the winding turns comprise a forward coil and a backward coil, and each shape on the front face and the rear face of the radial-line conductors and the conductive connection parts are identical with each other. Consequently, when seen from a thickness direction of the substrate, areas of the forward coil and the backward coil are equal to each other, and an external magnetic field, which does not need to be detected, can be canceled each other by the forward coil and the backward coil, then a current detection accuracy can be improved.Type: ApplicationFiled: November 21, 2006Publication date: July 5, 2007Applicant: MATSUSHITA ELECTRIC WORKS, LTD.Inventors: Akimi Shiokawa, Eiji Iwami, Yasuo Ichimura, Akihiro Ishibashi, Kazunari Yoshimura
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Patent number: 6847435Abstract: A laser distance measuring apparatus, for measuring the distance between objects existing in two directions at least as seen from the apparatus by using laser light, comprises two projectors for projecting laser beams along a specified projection axis toward each one of the objects, a photo detector for receiving reflected light of projection from each object, a distance measurement processor for measuring the distance from a reference point of the apparatus to each object on the basis of the reception signal to the projection by the photo detector, and a distance calculation processor for calculating the distance between the objects on the basis of the distance data measured by the distance measurement processor and the angle formed by two projection axes, in which the projection axis by one projector is variable in angle with respect to the other projector. Therefore, the distance between objects can be measured easily and at high precision by one distance measuring operation only.Type: GrantFiled: June 24, 2003Date of Patent: January 25, 2005Assignee: Matsushita Electric Works, Ltd.Inventors: Tatsuya Honda, Hiroshi Maeda, Takashi Kishida, Kazunari Yoshimura, Kazufumi Oogi, Hideshi Hamaguchi, Yoshimitsu Nakamura, Kuninori Nakamura
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Publication number: 20040252289Abstract: Distance measuring apparatus and method using a pulsed electromagnetic wave for making a high speed precise distance measurement between the apparatus and an object over a small distance. The electromagnetic wave is projected to an object from a single projector to provide a reflected electromagnetic wave from the object that is received by a single receiver also receiving a reference electromagnetic wave branched from the projected electromagnetic wave. The reference-wave reception time at the receiver is delayed by a delay time, so that a first time period between the electromagnetic wave projection time and the reference-wave reception time is longer than a second time period between the projection time and a reflection-wave reception time at the receiver. The distance is determined according to the delay time and the time difference between the reference-wave reception time and the reflection-wave reception time.Type: ApplicationFiled: May 29, 2003Publication date: December 16, 2004Applicant: MATSUSHITA ELECTRIC WORKS, LTD.Inventors: Tatsuya Honda, Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 6829042Abstract: Distance measuring apparatus and method using a pulsed electromagnetic wave for making a high speed precise distance measurement between the apparatus and an object over a small distance. The electromagnetic wave is projected to an object from a single projector to provide a reflected electromagnetic wave from the object that is received by a single receiver also receiving a reference electromagnetic wave branched from the projected electromagnetic wave. The reference-wave reception time at the receiver is delayed by a delay time, so that a first time period between the electromagnetic wave projection time and the reference-wave reception time is longer than a second time period between the projection time and a reflection-wave reception time at the receiver. The distance is determined according to the delay time and the time difference between the reference-wave reception time and the reflection-wave reception time.Type: GrantFiled: May 29, 2003Date of Patent: December 7, 2004Assignee: Matsushita Electric Works, Ltd.Inventors: Tatsuya Honda, Kazunari Yoshimura, Kuninori Nakamura
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Publication number: 20040051860Abstract: A laser distance measuring apparatus, for measuring the distance between objects existing in two directions at least as seen from the apparatus by using laser light, comprises two projectors for projecting laser beams along a specified projection axis toward each one of the objects, a photo detector for receiving reflected light of projection from each object, a distance measurement processor for measuring the distance from a reference point of the apparatus to each object on the basis of the reception signal to the projection by the photo detector, and a distance calculation processor for calculating the distance between the objects on the basis of the distance data measured by the distance measurement processor and the angle formed by two projection axes, in which the projection axis by one projector is variable in angle with respect to the other projector. Therefore, the distance between objects can be measured easily and at high precision by one distance measuring operation only.Type: ApplicationFiled: June 24, 2003Publication date: March 18, 2004Applicant: Matsushita Electric Works, Ltd.Inventors: Tatsuya Honda, Hiroshi Maeda, Takashi Kishida, Kazunari Yoshimura, Kazufumi Oogi, Hideshi Hamaguchi, Yoshimitsu Nakamura, Kuninori Nakamura
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Patent number: 6061126Abstract: A detecting system for a surface form of an object is disclosed. The system comprises a light source section emitting a plurality of slit-like probe rays incidenting on a predetermined inspected area of an inspected object at predetermined pitches, an image pick-up section imaging reflected lights of the probe rays from the inspected area, the image pick-up section imaging the reflected lights from a direction different from a transmission axis of the light source section, the image pick-up section disposed so as to image the reflected light from the inspected area in a batch, and a computation section converting image data from the image pick-up section into data of surface height of the inspected object using a trigonometrical survey method.Type: GrantFiled: May 27, 1998Date of Patent: May 9, 2000Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura, Yasuyuki Yuuki
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Patent number: 5946029Abstract: An image processing process disposes a television (TV) camera for observing a direct reflection of an incident light in a direction substantially coinciding with rolling direction of such detection object as a laminating substrate or the like, and observes a direct reflection component of the light with mutual positional relationship between the TV camera, object and a light source varied. Measuring thus sequentially the brightness with the angle of incident light varied, a lighting angle at which the brightness of reflection is the largest, that is, an incident angle of direct reflection light is obtained with respect to respective measuring points on the object, and an image representing a distribution of incident angles of the direction reflection light can be obtained by obtaining the incident angles of the direct reflection light with respect to the whole points on the detection object.Type: GrantFiled: June 2, 1997Date of Patent: August 31, 1999Assignee: Matsushita Electric Works, LtdInventors: Kazunari Yoshimura, Ryosuke Mitaka, Kuninori Nakamura, Yasuyuki Yuki
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Patent number: 5641572Abstract: Disclosed herein is a short carbon fiber bundling mass comprising not less than 90% by weight of short carbon fibers and carbonized materials derived from a resin as a sizing agent, and having not more than 0.5% of a weight loss of said short carbon fiber bundling mass when left in an inert atmosphere at a temperature of 400.degree. C.Type: GrantFiled: August 15, 1995Date of Patent: June 24, 1997Assignee: Mitsubishi Chemical CorporationInventors: Kazunari Yoshimura, Shigeki Tomonoh
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Patent number: 5606174Abstract: An arrangement for detecting a shape of object to measure any displacement of its surface from a reference plane with a high resolution, and to improve to precision of the measurement.Type: GrantFiled: May 2, 1995Date of Patent: February 25, 1997Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura, Katsuji Komaki
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Patent number: 5444537Abstract: A shape detecting arrangement allows a shape of an object to be very precisely detected at a high resolution, by projecting a plurality of light beams in mutually different ways onto an identical spot of the object substantially in an identical direction, forming on a position detector images of beams of the projected beams reflected back from the object, obtaining a ratio of intensity of the reflected beams by virtue of outputs from the position detector, obtaining positions of the respective reflected beams by virtue of variation component of the ratio of intensity with respect to a reference plane for detecting the position of the object, and finally obtaining height displacement of the respective positions obtained with respect to the reference plane on the basis of the positions and angles of incidence of the reflected beams into the position detector.Type: GrantFiled: October 20, 1993Date of Patent: August 22, 1995Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 5416591Abstract: A light beam is emitted to a target point on a target, so that the reflected light beam from the target point forms an illumination spot on a array sensor. The array sensor comprises a plurality of light receiving elements. The receiving elements are divided into a plurality of repeating units consisting of the same number of the receiving elements. The receiving elements in each of the repeating units are assigned respectively to different indexes. The receiving elements having the same index are commonly coupled so as to provide a single output indicative of the same index when the reflected light beam hits any one of the receiving elements.Type: GrantFiled: June 22, 1993Date of Patent: May 16, 1995Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 5111056Abstract: An optical measurement system for determination of an object profile includes a light source for emitting a light beam, light directing means for directing the light beam to scan a surface of the object surface and for directing a reflected light beam from the object surface in a direction angled from that of the light beam incident to the surface. The reflected light beam is received at position detecting means to provide position data with respect to the individual scanned points on the object surface. The position data is analyzed to measure a series of distances to the individual scanned points on the object surface to obtain from the measured distances height data of the individual scanned points and to determine an object profile along the scanned point on the object surface.Type: GrantFiled: April 12, 1991Date of Patent: May 5, 1992Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Kuninori Nakamura
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Patent number: 5102226Abstract: An optical object profile measurement system utilizes a light beam to scan an object surface and a position detector which receives a light beam reflected from the object surface to obtain position data of individual scanned points on the object surface. The position data is processed to determine a profile of the object profile along the scanned points. The position detector comprises a number of light receiving elements arranged in at least two linear arrays each extending in the direction of following the light beam moving across the object surface and is divided into subdivisions having one or more of the light receiving elements. The arrays are disposed side-by-side to receive the light beam. In a first one of the arrays, the light receiving elements are designated by first values which have differing subdivisions such that the elements designated by the same first value are coupled to provide a single first output when any one of such elements detects the light beam.Type: GrantFiled: January 11, 1990Date of Patent: April 7, 1992Assignee: Matsushita Electric Works, Ltd.Inventors: Kazunari Yoshimura, Shinji Okamoto
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Patent number: 4677473Abstract: A soldering inspection system wherein light is irradiated on a soldered part at different incident angles by a light emitting means to collect information indicative of three-dimensional configuration of the soldered part and discriminate whether or not the configuration is acceptable. The three-dimensional configurational information can be obtained with light irradiated at least from two positions mutually of different angles with respect to the soldered part, the inspection is thereby made from quantitative viewpoint, and a highly precise result of the inspection is obtainable.Type: GrantFiled: November 7, 1985Date of Patent: June 30, 1987Assignee: Matsushita Electric Works, Ltd.Inventors: Shinji Okamoto, Kazunari Yoshimura, Tomoharu Nakahara