Patents by Inventor Kazuo Eguchi

Kazuo Eguchi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10418987
    Abstract: A level shifting circuit has an input configured to receive an input signal, wherein the input signal has symmetrical maximum and minimum voltages. The level shifting circuit further includes an output configured to provide an output signal, wherein the output signal has asymmetrical maximum and minimum voltages. The output signal is generated in response to the input signal. The output signal is applied to drive a gate terminal of a SiC MOSFET.
    Type: Grant
    Filed: August 1, 2018
    Date of Patent: September 17, 2019
    Assignee: STMicroelectronics KK
    Inventors: Luca Bartolomeo, Kazuo Eguchi, Giuseppe Davide Bruno
  • Publication number: 20180343005
    Abstract: A level shifting circuit has an input configured to receive an input signal, wherein the input signal has symmetrical maximum and minimum voltages. The level shifting circuit further includes an output configured to provide an output signal, wherein the output signal has asymmetrical maximum and minimum voltages. The output signal is generated in response to the input signal. The output signal is applied to drive a gate terminal of a SiC MOSFET.
    Type: Application
    Filed: August 1, 2018
    Publication date: November 29, 2018
    Applicant: STMicroelectronics KK
    Inventors: Luca Bartolomeo, Kazuo Eguchi, Giuseppe Davide Bruno
  • Patent number: 10063227
    Abstract: A level shifting circuit has an input configured to receive an input signal, wherein the input signal has symmetrical maximum and minimum voltages. The level shifting circuit further includes an output configured to provide an output signal, wherein the output signal has asymmetrical maximum and minimum voltages. The output signal is generated in response to the input signal. The output signal is applied to drive a gate terminal of a SiC MOSFET.
    Type: Grant
    Filed: January 3, 2017
    Date of Patent: August 28, 2018
    Assignee: STMicroelectronics KK
    Inventors: Luca Bartolomeo, Kazuo Eguchi, Giuseppe Davide Bruno
  • Publication number: 20180191341
    Abstract: A level shifting circuit has an input configured to receive an input signal, wherein the input signal has symmetrical maximum and minimum voltages. The level shifting circuit further includes an output configured to provide an output signal, wherein the output signal has asymmetrical maximum and minimum voltages. The output signal is generated in response to the input signal. The output signal is applied to drive a gate terminal of a SiC MOSFET.
    Type: Application
    Filed: January 3, 2017
    Publication date: July 5, 2018
    Applicant: STMicroelectronics KK
    Inventors: Luca Bartolomeo, Kazuo Eguchi, Giuseppe Davide Bruno
  • Publication number: 20020020224
    Abstract: There is a difficulty in workability of installing an optical fiber cable on a concrete structure, and when the optical fiber cable is installed on the surface of the concrete structure, the appearance of the concrete structure is spoilt by cutting the surface of the concrete structure or the like. Accordingly, there are provided a sheet-like strain sensor for confirming progress of damage of a concrete structure, in which one or a plurality of optical fiber cables are fixedly held between sheet-like bodies which are easy for the adhesive to permeate while one end/ends of the optical fiber cable/cables are pulled out; and a method for confirming progress of damage of a concrete structure by measuring strain by use of the one end of the optical fiber cable pulled out between the sheet-like bodies.
    Type: Application
    Filed: April 30, 2001
    Publication date: February 21, 2002
    Applicant: SHO-BOND CORPORATION
    Inventors: Takashi Sato, Katsumi Hino, Kazuo Eguchi, Tatsuro Yoshinaga
  • Patent number: 5728253
    Abstract: Disclosed herein is a method of detecting an end point of plasma process performed on an object, and a plasma process apparatus. The method includes the steps of detecting an emission spectrum over a wavelength region specific to C.sub.2 in the plasma, by optical detecting means, and determining the end point of the plasma process from the emission intensity of the emission spectrum detected by the optical detector. The apparatus has a process chamber, a pair of electrodes, a light-collecting device, an optical detector, and a determining device. The chamber has a monitor window. The electrodes are located in the process chamber. The first electrode is used to support the object. A high-frequency power is supplied between the electrodes to change a process gas into plasma. The light-collecting device collects the light from the plasma through the monitor window. The optical detector detects an emission spectrum from the light collected.
    Type: Grant
    Filed: September 30, 1994
    Date of Patent: March 17, 1998
    Assignees: Tokyo Electron Limited, Tokyo Electron Yamanashi Limited
    Inventors: Susumu Saito, Kazuo Eguchi
  • Patent number: 5717294
    Abstract: A vacuum chamber contains a first electrode for supporting a wafer, and a second electrode opposing the first electrode. A supply system and an exhaustion system are connected to the vacuum chamber. The system supplies a reactive gas into the chamber, and the system exhaust the used gas from the chamber. A radio-frequency power supply is connected to the first electrode, for supplying power between the electrodes to generate an electric field E. An annular magnet assembly is provided around the chamber, for generating a magnetic field B which has a central plane intersecting with the electric field E. The magnet assembly has a plurality of magnet elements which have different magnetization axes in the central plane of the magnetic field. Electrons drift due to a force resulting from an outer product (E.times.B) of the electric field E and the magnetic field B.
    Type: Grant
    Filed: February 27, 1995
    Date of Patent: February 10, 1998
    Assignees: Kabushiki Kaisha Toshiba, Tokyo Electron Limited, Tokyo Electron Yamanashi Limited
    Inventors: Itsuko Sakai, Makoto Sekine, Keiji Horioka, Yukimasa Yoshida, Koichiro Inazawa, Masahiro Ogasawara, Yoshio Ishikawa, Kazuo Eguchi
  • Patent number: 5565114
    Abstract: This invention provides an end point detection method including the steps of sequentially detecting, when a process using a plasma is performed for an object to be processed, emission spectra in a specific wavelength band of an active species in the plasma by using a photodetector, calculating sum average values of emission intensities of the emission spectra, calculating the ratio or the difference between the sum average values to obtain a calculated value, and determining a point at which the calculated value exceeds a predetermined reference value as an end point of the process.
    Type: Grant
    Filed: August 23, 1994
    Date of Patent: October 15, 1996
    Assignees: Tokyo Electron Limited, Tokyo Electron Yamanashi Limited
    Inventors: Susumu Saito, Chishio Koshimizu, Kazuo Eguchi
  • Patent number: 4343960
    Abstract: An improved thermopile is provided. A plurality of thermocouples constituting the thermopile are composed of segments of one metal and segments of the other metal, and the segments of different metals are connected to one another alternately so that the thermocouples are arranged in series on a heat-resistant, electrically non-conductive substrate. Each segment has a portion plated on one surface of the substrate, a portion plated on the other surface of the substrate and a portion plated on the inner wall of through holes formed in the substrate to connect the two portions plated on the two surfaces of the substrate with each other. The thermopile is prepared advantageously by utilizing plating and photo-etching techniques.
    Type: Grant
    Filed: November 12, 1980
    Date of Patent: August 10, 1982
    Assignees: Building Research Institute, Ministry of Construction, Ryoko Electronic Industries Ltd., Eko Instruments Trading Co., Ltd.
    Inventors: Kazuo Eguchi, Tadashi Kobayashi, Yukiharu Miyake
  • Patent number: 4181211
    Abstract: In a pallet exchange apparatus for a machine tool, a rotary member carried to be rotatable in a horizontal plane mounts thereon a pallet support means which in turn supports a pallet unloaded from the machine tool and a pallet to be loaded into the machine tool. Each pallet is provided with an engaging hook. A transfer member is provided with a transfer hook engageable with the engaging hook to move the pallet to be loaded on the machine tool toward the machine tool. A fixed hook is provided to be engageable with the engaging hook. The rotary member is rotated to move the engaging hook of the pallet to be loaded on the machine tool into engagement with the transfer hook and to move the engaging hook of the pallet unloaded from the machine tool into engagement with the fixed hook.
    Type: Grant
    Filed: May 23, 1978
    Date of Patent: January 1, 1980
    Assignee: Toyoda-Koki Kabushiki-Kaisha
    Inventors: Hideo Nishimura, Kenji Nomura, Fumihiko Ohkoshi, Akira Tsuboi, Yoji Kamiya, Kazuo Eguchi, Kunimichi Nakashima